IP Library Granted Patent US 8,861,287
Granted Patent B2
US 8,861,287 · App. 13/616,609 · Granted Oct 14, 2014

Interface circuit

Inventors: Yuui Shimizu (Kanagawa, JP); Masaru Koyanagi (Tokyo, JP); Yasuhiro Suematsu (Kanagawa, JP)
Assignee: Kabushiki Kaisha Toshiba
H03K19/017509G11C16/24H03K19/00361G11C7/1057G11C16/26
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Quick Facts
Patent No.
US 8,861,287
App. No.
13/616,609
Granted
Oct 14, 2014
Kind
B2
Abstract

According to an embodiment, an interface circuit is provided with an output buffer which generates an output waveform on the basis of the ON/OFF operation of a transistor and a driver circuit which drives the transistor and is capable of independently changing a turn-ON speed and a turn-OFF speed of the transistor.

Claims (54)

1. An interface circuit comprising:

an output buffer electrically coupled to a pad electrode, the output buffer including a first transistor and a second transistor, the output buffer being configured to output waveform on the basis of the ON/OFF operation of the first transistor and the second transistor; and

a driver circuit which is capable of independently changing a turn-ON speed or a turn-OFF speed of at least one of the first transistor and the second transistor.

2. The interface circuit according to claim 1 ,

wherein the driver circuit includes a slew rate control unit which is capable of changing the turn-ON speed of at least one of the first transistor and the second transistor, and a reset rate control unit which is capable of changing the turn-OFF speed of at least one of the first transistor and the second transistor.

3. The interface circuit according to claim 2 ,

wherein the first transistor is a first P-channel field-effect transistor and the second transistor is a first N-channel field-effect transistor which is connected to the first P-channel field-effect transistor in series, and

the driver circuit is provided with a P-slew rate control unit which is capable of changing a turn-ON speed of the first P-channel field-effect transistor, a P-reset rate control unit which is capable of changing a turn-OFF speed of the first P-channel field-effect transistor, a N-slew rate control unit which is capable of changing a turn-ON speed of the first N-channel field-effect transistor, and a N-reset rate control unit which is capable of changing, a turn-OFF speed of the first N-channel field-effect transistor.

4. The interface circuit according to claim 3 , further comprising:

a time lag generation circuit which adds a period of time in order to turn off both of the first P-channel field-effect transistor and the first N-channel field-effect transistor at the same time.

5. The interface circuit according to claim 4 , further comprising:

a level shifter which is connected to a front stage of the time lag generation circuit.

6. The interface circuit according to claim 3 ,

wherein the P-slew rate control unit is provided with a second N-channel field-effect transistor which pulls down a gate potential of the first P-channel field-effect transistor on the basis of an input voltage, and a third N-channel field-effect transistor which is connected to the second N-channel field-effect transistor in series and in which a first intermediate voltage independent from the input voltage is applied to a gate terminal,

the P-reset rate control unit is provided with a second P-channel field-effect transistor which pulls up a gate potential of the first P-channel field-effect transistor on the basis of the input voltage, and a third P-channel field-effect transistor which is connected to the second P-channel field-effect transistor in series and in which a second intermediate voltage independent from the input voltage is applied to a gate terminal, the N-slew rate control unit is provided with a fourth P-channel field-effect transistor which pulls up a gate potential of the first N-channel field-effect transistor on the basis of the input voltage, and a fifth P-channel field-effect transistor which is connected to the fourth P-channel field-effect transistor in series and in which a third intermediate voltage independent from the input voltage is applied to a gate terminal, and

the N-reset rate control unit is provided with a fourth N-channel field-effect transistor which pulls down a gate potential of the first N-channel field-effect transistor on the basis of the input voltage, and a fifth N-channel field-effect transistor which is connected to the fourth N-channel field-effect transistor in series and in which a fourth intermediate voltage independent from the input voltage is applied to a gate terminal.

7. The interface circuit according to claim 6 , further comprising:

a pad electrode which is connected to an output terminal of the output buffer.

8. The interface circuit according to claim 7 ,

wherein readout data read out from a NAND flash memory is transferred to a controller.

9. The interface circuit according to claim 8 ,

wherein a plurality of semiconductor chips which have the NAND flash memory formed therein are stacked, and the pad electrode is connected between the semiconductor chips through a bonding wire.

10. The interface circuit according to claim 9 ,

wherein the semiconductor chip is provided with a resister which stores values of the first to fourth intermediate voltages, and a generator which generates the first to fourth intermediate voltages on the basis of a value of the resister.

11. The interface circuit according to claim 3 ,

wherein the P-slew rate control unit is provided with a second N-channel field-effect transistor which pulls down a gate potential of the first P-channel field-effect transistor on the basis of an input voltage, and a third N-channel field-effect transistor which is connected to the second N-channel field-effect transistor in series and in which a first intermediate voltage independent from the input voltage is applied to a gate terminal,

the P-reset rate control unit is provided with a plurality of second P-channel field-effect transistors which are connected to each other in parallel so as to pull up a gate potential of the first P-channel field-effect transistor on the basis of the input voltage, and a first selection circuit which selects the number of the second P-channel field-effect transistors to be turned on at the time of pulling-up,

the N-slew rate control unit is provided with a third P-channel field-effect transistor which pulls up a gate potential of the first N-channel field-effect transistor on the basis of the input voltage, and a fourth P-channel field-effect transistor which is connected to the third P-channel field-effect transistor in series and in which a second intermediate voltage independent from the input voltage is applied to a gate terminal, and

the N-reset rate control unit is provided with a plurality of fourth N-channel field-effect transistors which are connected to each other in parallel so as to pull down a gate potential of the first P-channel field-effect transistor on the basis of the input voltage, and a second selection circuit which selects the number of the fourth N-channel field-effect transistors to be turned on at the time of pulling-down.

12. The interface circuit according to claim 11 , further comprising:

a pad electrode which is connected to an output terminal of the output buffer.

13. The interface circuit according to claim 12 ,

wherein readout data read out from a NAND flash memory is transferred to a controller.

14. The interface circuit according to claim 13 ,

wherein a plurality of semiconductor chips which have the NAND flash memory formed therein are stacked, and the pad electrode is connected between the semiconductor chips through a bonding wire.

15. The interface circuit according to claim 14 ,

wherein the semiconductor chip is provided with a resister which stores values of the first and second intermediate voltages and values of selection signals of the first and second selection circuits, and a generator which generates the first and second intermediate voltages and the selection signals on the basis of a value of the resister.

16. The interface circuit according to claim 3 ,

wherein the P-slew rate control unit is provided with a plurality of second P-channel field-effect transistors which are connected to each other in parallel so as to pull down a gate potential of the first P-channel field-effect transistor on the basis of an input voltage, and a first selection circuit which selects the number of the second P-channel field-effect transistors to be turned on at the time of pulling-down,

the P-reset rate control unit is provided with a plurality of third P-channel field-effect transistors which are connected to each other in parallel so as to pull up a gate potential of the first P-channel field-effect transistor on the basis of the input voltage, and a second selection circuit which selects the number of the third P-channel field-effect transistors to be turned on at the time of pulling-up,

the N-slew rate control unit is provided with a plurality of second N-channel field-effect transistors which are connected to each other in parallel so as to pull up a gate potential of the first N-channel field-effect transistor on the basis of the input voltage, and a third selection circuit which selects the number of the second N-channel field-effect transistors to be turned on at the time of pulling-up, and

the N-reset rate control unit is provided with a plurality of third N-channel field-effect transistors which are connected to each other in parallel so as to pull down a gate potential of the first N-channel field-effect transistor on the basis of the input voltage, and a fourth selection circuit which selects the number of the third N-channel field-effect transistors to be turned on at the time of pulling-down.

17. The interface circuit according to claim 16 , further comprising:

a pad electrode which is connected to an output terminal of the output buffer.

18. The interface circuit according to claim 17 ,

wherein readout data read out from a NAND flash memory is transferred to a controller.

19. The interface circuit according to claim 18 ,

wherein a plurality of semiconductor chips which have the NAND flash memory formed therein are stacked, and the pad electrode is connected between the semiconductor chips through a bonding wire.

20. The interface circuit according to claim 19 ,

wherein the semiconductor chip is provided with a resister which stores values of selection signals of the first to fourth selection circuits, and a generator which generates the selection signals of the first to fourth selection circuits on the basis of a value of the resister.

21. The interface circuit according to claim 11 ,

wherein the numbers of the second P-channel field-effect transistors and the fourth N-channel field-effect transistors to be turned on are changed on the basis of a power-supply voltage or an operation speed.

22. The interface circuit according to claim 16 ,

wherein the numbers of the third P-channel field-effect transistors and the third N-channel field-effect transistors to be turned on are changed on the basis of a power-supply voltage or an operation speed.

Assignments (5)
MERGER Recorded Jan 22, 2021
From: TOSHIBA MEMORY CORPORATION
To: K.K. PANGEA
Reel/Frame 055659/0471 →
CHANGE OF NAME AND ADDRESS Recorded Jan 22, 2021
From: TOSHIBA MEMORY CORPORATION
To: KIOXIA CORPORATION
Reel/Frame 055669/0001 →
CHANGE OF NAME AND ADDRESS Recorded Jan 22, 2021
From: K.K. PANGEA
To: TOSHIBA MEMORY CORPORATION
Reel/Frame 055669/0401 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Aug 24, 2017
From: KABUSHIKI KAISHA TOSHIBA
To: TOSHIBA MEMORY CORPORATION
Reel/Frame 043709/0035 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Nov 21, 2012
From: SHIMIZU, YUUI; KOYANAGI, MASARU; SUEMATSU, YASUHIRO
To: KABUSHIKI KAISHA TOSHIBA
Reel/Frame 029336/0077 →
Priority Claims (1)
JP 2012-048889 · Mar 6, 2012 · national
Continuity (1)
Related Publication 20130242664A1 · Sep 19, 2013