IP Library Granted Patent US 8,866,258
Granted Patent B2
US 8,866,258 · App. 12/587,482 · Granted Oct 21, 2014

Interposer structure with passive component and method for fabricating same

Inventors: Wei Xia (Irvine, CA); Xiangdong Chen (Irvine, CA); Akira Ito (Irvine, CA)
Assignee: Broadcom Corporation
H01L23/49827H01L2924/15311H01L23/49822H01L21/76898H01L21/486H01L2224/16225H01L23/147H01L2223/6677
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Quick Facts
Patent No.
US 8,866,258
App. No.
12/587,482
Granted
Oct 21, 2014
Kind
B2
Abstract

According to an exemplary embodiment, an interposer structure for electrically coupling a semiconductor die to a support substrate in a semiconductor package includes at least one through-wafer via extending through a semiconductor substrate, where the at least one through-wafer via provides an electrical connection between the semiconductor die and the support substrate. The interposer structure further includes a passive component including a trench conductor, where the trench conductor extends through the semiconductor substrate. The passive component further includes a dielectric liner situated between the trench conductor and the semiconductor substrate. The passive component can further include at least one conductive pad for electrically coupling the trench conductor to the semiconductor die. The passive component can be, for example, an inductor or an antenna.

Claims (38)

1. An interposer structure for electrically coupling a semiconductor die to a support substrate in a semiconductor package, said interposer structure comprising:

at least one through-wafer via extending through a semiconductor substrate, said at least one through-wafer via providing an electrical connection between said semiconductor die and said support substrate;

conductive segments having a pitch substantially wider than said at least one through-wafer via, disposed on a bottom surface of said semiconductor substrate and electrically connecting said at least one through-wafer via to said support substrate;

a passive component comprising a trench conductor, said trench conductor extending through said semiconductor substrate without electrically coupling said semiconductor die to said support substrate;

a plurality of conductive pads, each disposed on a top surface of said semiconductor substrate that is opposite the bottom surface and coupling one of said at least one through-wafer via and said passive component to said semiconductor die; and

a dielectric liner disposed between said semiconductor substrate and each of said at least one through-wafer via and said passive component;

wherein each of said at least one through-wafer via and said passive component is completely electrically isolated from said semiconductor substrate; and

wherein a first terminal is situated on one end of the passive component and a second terminal is situated on another end of the passive component, the first and second terminals being on the top surface of said semiconductor substrate.

2. The interposer structure of claim 1 , wherein said passive component is electrically coupled to said semiconductor die by at least one solder bump.

3. The interposer structure of claim 1 , wherein said passive component is an inductor.

4. The interposer structure of claim 1 , wherein said passive component is an antenna.

5. The interposer structure of claim 1 , wherein said trench conductor has a spiral shaped trench.

6. The interposer structure of claim 1 further comprising a dielectric layer situated over said trench conductor.

7. The interposer structure of claim 1 , wherein said trench conductor is exposed on the bottom surface of said semiconductor substrate.

8. The interposer structure of claim 1 , wherein said support substrate comprises a ball grid array substrate.

9. An interposer structure for electrically coupling a semiconductor die to a support substrate in a semiconductor package, said interposer structure comprising:

at least one through-wafer via extending through a semiconductor substrate, said at least one through-wafer via providing an electrical connection between said semiconductor die and said support substrate;

conductive segments having a pitch substantially wider than said at least one through-wafer via, disposed on a bottom surface of said semiconductor substrate and electrically connecting said at least one through-wafer via to said support substrate;

an inductor or antenna within said semiconductor substrate without electrically coupling said semiconductor die to said support substrate;

a plurality of conductive pads, each disposed on a top surface of said semiconductor substrate that is opposite the bottom surface and coupling one of said at least one through-wafer via to said semiconductor die; and

a dielectric liner disposed between said semiconductor substrate and each of said at least one through-wafer via and said inductor or antenna;

wherein each of said at least one through-wafer via and said inductor or antenna is completely electrically isolated from said semiconductor substrate; and

wherein a first terminal is situated on one end of the inductor or antenna and a second terminal is situated on an opposite end of the inductor or antenna, the first and second terminals being on the top surface of said semiconductor substrate.

10. The interposer structure of claim 9 , wherein said inductor or antenna is electrically coupled to said semiconductor die by at least one solder bump.

11. The interposer structure of claim 9 , wherein said inductor or antenna has a spiral shaped trench.

12. The interposer structure of claim 9 further comprising a dielectric layer situated over said inductor or antenna.

13. The interposer structure of claim 1 , wherein the first and second terminals are configured to electrically couple said passive component to said semiconductor die.

14. The interposer structure of claim 1 , wherein said trench conductor is situated in a trench opening in said semiconductor substrate, said trench opening having a narrow extent lateral to a top surface of said interposer structure.

15. The interposer structure of claim 1 , wherein said trench conductor is situated in a trench opening, said trench opening having a spiral shaped opening within said interposer structure.

16. The interposer structure of claim 1 , wherein:

a first conductive pad of the plurality of conductive pads is configured as the first terminal of the passive component, and

a second conductive pad of the plurality of conductive pads is configured as the second terminal of the passive component.

17. The interposer structure of claim 16 , wherein the first and second conductive pads are situated on respective ends of the trench conductor.

18. The interposer structure of claim 9 , wherein the first and second terminals are configured to electrically couple the inductor or antenna to the semiconductor die.

19. The interposer structure of claim 9 , wherein:

a first conductive pad of the plurality of conductive pads is configured as the first terminal of the inductor or antenna, and

a second conductive pad of the plurality of conductive pads is configured as the second terminal of the inductor or antenna.

20. The interposer structure of claim 19 , wherein the first and second conductive pads are situated on respective ends of a trench conductor.

Assignments (7)
CORRECTIVE ASSIGNMENT TO CORRECT THE PATENT NUMBER 9,385,856 TO 9,385,756 PREVIOUSLY RECORDED AT REEL: 47349 FRAME: 001. ASSIGNOR(S) HEREBY CONFIRMS THE MERGER. Recorded Mar 22, 2019
From: AVAGO TECHNOLOGIES GENERAL IP (SINGAPORE) PTE. LTD.
To: AVAGO TECHNOLOGIES INTERNATIONAL SALES PTE. LIMITED
Reel/Frame 051144/0648 →
CORRECTIVE ASSIGNMENT TO CORRECT THE EFFECTIVE DATE PREVIOUSLY RECORDED ON REEL 047229 FRAME 0408. ASSIGNOR(S) HEREBY CONFIRMS THE THE EFFECTIVE DATE IS 09/05/2018. Recorded Oct 29, 2018
From: AVAGO TECHNOLOGIES GENERAL IP (SINGAPORE) PTE. LTD.
To: AVAGO TECHNOLOGIES INTERNATIONAL SALES PTE. LIMITED
Reel/Frame 047349/0001 →
MERGER Recorded Oct 4, 2018
From: AVAGO TECHNOLOGIES GENERAL IP (SINGAPORE) PTE. LTD.
To: AVAGO TECHNOLOGIES INTERNATIONAL SALES PTE. LIMITED
Reel/Frame 047229/0408 →
TERMINATION AND RELEASE OF SECURITY INTEREST IN PATENTS Recorded Feb 3, 2017
From: BANK OF AMERICA, N.A., AS COLLATERAL AGENT
To: BROADCOM CORPORATION
Reel/Frame 041712/0001 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Feb 1, 2017
From: BROADCOM CORPORATION
To: AVAGO TECHNOLOGIES GENERAL IP (SINGAPORE) PTE. LTD.
Reel/Frame 041706/0001 →
PATENT SECURITY AGREEMENT Recorded Feb 11, 2016
From: BROADCOM CORPORATION
To: BANK OF AMERICA, N.A., AS COLLATERAL AGENT
Reel/Frame 037806/0001 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Oct 23, 2009
From: XIA, WEI; CHEN, XIANGDONG; ITO, AKIRA
To: BROADCOM CORPORATION
Reel/Frame 023417/0261 →
Continuity (1)
Related Publication 20110079917A1 · Apr 7, 2011