IP Library Granted Patent US 8,888,560
Granted Patent B2
US 8,888,560 · App. 13/753,147 · Granted Nov 18, 2014

Method for uniformly polishing large scale plate

Inventors: Kyoung-Hoon Min (Daejeon, KR); Ye-Hoon Im (Daejeon, KR); Dae-Yeon Lee (Chungbuk, KR); Jae-Ik Song (Gyeonggi-do, KR); Su-Chan Park (Daejeon, KR)
Assignee: LG Chem, Ltd.
B24B7/00B24B49/00B24B37/005B24B37/042
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Quick Facts
Patent No.
US 8,888,560
App. No.
13/753,147
Granted
Nov 18, 2014
Kind
B2
Abstract

Disclosed is a substrate polishing method capable of minimizing a difference of polishing amounts between a center portion and a rim portion of a large scale plate during a plate polishing process.

Claims (41)

1. A method for polishing a substrate by moving an upper plate having a polishing pad installed thereto,

wherein the upper plate performs a polishing process on an upper portion of the substrate with respect to a surface portion of the substrate along a quadrangular path,

wherein a travel range (S 1 ) by which the upper plate moves in the longitudinal direction of the substrate and a travel range (S 2 ) by which the upper plate moves in the transverse direction of the substrate are respectively 90% to 100% of a diameter (D) of the polishing pad installed to the upper plate; and

wherein S 1 and S 2 have a smallest value among values calculated by Formulas 1 and 2 below:

D

-

d

[

Formula

1

]

D

+

D

-

D

2

-

(

P

end

P

eff

)

[

Formula

2

]

where

d: double a radial length of a rim portion of the polishing pad, which does not contact the substrate;

D′: diameter of a portion of the polishing pad where the pressure applied to the substrate by the polishing pad is equal to or greater than an effective pressure (P eff ) which is capable of wearing the surface portion of the substrate;

P end : pressure applied to the substrate by the polishing pad at each outermost point in all portions of the polishing pad other than worn portions which do not contact the substrate; and

P eff : pressure applied to the substrate by the polishing pad, which is capable of wearing the surface portion of the substrate.

2. The method for polishing a substrate according to claim 1 , wherein the path forms a rectangle.

3. The method for polishing a substrate according to claim 1 , wherein the path forms a square.

Assignments (2)
SECURITY AGREEMENT Recorded Jun 26, 2013
From: GM GLOBAL TECHNOLOGY OPERATIONS LLC
To: WILMINGTON TRUST COMPANY
Reel/Frame 030694/0591 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Feb 13, 2013
From: MIN, KYOUNG-HOON; IM, YE-HOON; LEE, DE-YEON; SONG, JAE-IK; PARK, SU-CHAN
To: LG CHEM, LTD.
Reel/Frame 029807/0060 →
Priority Claims (1)
KR 10-2010-0074710 · Aug 2, 2010 · national
Continuity (2)
Continuation PCTKR2011005657 · Aug 1, 2011
Related Publication 20130149939A1 · Jun 13, 2013