X-ray multiple spectroscopic analyzer

1. An X-ray multiple spectroscopic analyzer comprising:

an X-ray source radiating X-rays;

an optical system inputting the X-rays radiated from the X-ray source to a single-crystal sample;

a sample stage supporting the single-crystal sample, with one or more rotation driving systems for rotating the single-crystal sample;

an X-ray diffraction detector detecting diffracted X-rays generated from the single-crystal sample;

a rotation driving system changing the angle of the X-ray diffraction detector with respect to the single-crystal sample;

an X-ray diffraction measurement data storage unit for storing measurement data of the diffracted X-rays detected by the X-ray diffraction detector;

a structural analysis data analyzing unit for analyzing data of a crystal structure on the basis of the measurement data of the diffracted X-rays stored in the X-ray diffraction measurement data storage unit;

an energy-dispersive X-ray fluorescence detector detecting fluorescent X-rays radiated from the single-crystal sample;

an X-ray fluorescence measurement data storage unit storing measurement data of the fluorescent X-rays detected by the energy-dispersive X-ray fluorescence detector;

an X-ray fluorescence analyzing unit for analyzing the fluorescent X-rays on the basis of the measurement data of the fluorescent X-rays stored in the X-ray fluorescence measurement data storage unit;

a beam stopper, being disposed opposite to the optical system about the single-crystal sample and blocking a direct beam of X-rays input to the single-crystal sample from the optical system;

an X-ray fluorescence analysis data storage unit for storing analysis data of the fluorescent X-rays output from the X-ray fluorescence analyzing unit; and

X-ray fluorescence analysis data acquiring unit for acquiring the analysis data of the fluorescent X-rays stored in the X-ray fluorescence analysis data storage unit and outputting the acquired X-ray fluorescence analysis data to the structural analysis data analyzing unit,

wherein the structural analysis data analyzing unit analyzes the data of the crystal structure further on the basis of the analysis data of the fluorescent X-rays output from the X-ray fluorescence analysis data acquiring unit, and

wherein the energy-dispersive X-ray fluorescence detector comprises

a light-receiving portion receiving the detected X-rays, and

an X-ray blocking member, being disposed between the beam stopper and the light-receiving portion and blocking fluorescent X-rays radiated from a part of the beam stopper which is directly irradiated with the direct beam.

2. The X-ray multiple spectroscopic analyzer according to claim 1 , wherein the X-ray blocking member surrounds the peripheral edge of the light-receiving portion.

3. The X-ray multiple spectroscopic analyzer according to claim 2 , wherein the X-ray blocking member has a tip formed in a tapered shape.

4. The X-ray multiple spectroscopic analyzer according to claim 2 , wherein the X-ray blocking member includes a hollow light-guiding tube therein and functions as a poly-capillary.

5. The X-ray multiple spectroscopic analyzer according to claim 1 , wherein the light-receiving portion of the energy-dispersive X-ray fluorescence detector is disposed on the optical system side about a plane perpendicular to the optical axis of a direct beam of X-rays input to the single-crystal sample from the optical system and passing through the single-crystal sample.

6. The X-ray multiple spectroscopic analyzer according to claim 1 , wherein the energy-dispersive X-ray fluorescence detector further includes a retreating mechanism that can retreat outward from the single-crystal sample.

7. The X-ray multiple spectroscopic analyzer according to claim 1 , wherein the energy dispersive X-ray fluorescence detector detects a posture where the sample stage supports the single-crystal sample by detecting the fluorescent X-rays radiated from the single-crystal sample.

8. The X-ray multiple spectroscopic analyzer according to claim 1 , wherein the energy dispersive X-ray fluorescence detector is a silicon drift detector or a lithium-drift silicon detector.

9. The X-ray multiple spectroscopic analyzer according to claim 1 , wherein the energy dispersive X-ray fluorescence detector detects the fluorescent X-rays radiated from the single-crystal sample in a first period which is a partial period of a period in which the X-ray diffraction detector detects the diffracted X-rays generated from the single-crystal sample.

10. The X-ray multiple spectroscopic analyzer according to claim 9 , wherein the X-ray fluorescence analyzing unit analyzes the fluorescent X-rays on the basis of the measurement data of the fluorescent X-rays, which is detected by the energy dispersive X-ray fluorescence detector in the first period, in a second period which is a partial period of the period in which the X-ray diffraction detector detects the diffracted X-rays generated from the single-crystal sample and which is subsequent to the first period.

11. The X-ray multiple spectroscopic analyzer according to claim 1 , wherein when a predetermined atom included in a compound constituting the single-crystal sample has a possibility of a plurality of kind of atoms, the structural analysis data analyzing unit determines the predetermined atom from the analysis data of the fluorescent X-rays and determines the crystal structure of the single-crystal sample on the basis of the determined atom.

12. The X-ray multiple spectroscopic analyzer according to claim 1 , wherein when a part of a predetermined kind of atoms included in a compound constituting the single-crystal sample are substituted with a different kind of atoms, the structural analysis data analyzing unit determines an amount of the different atom from the analysis data of the fluorescent X-rays and determines the crystal structure of the single-crystal sample on the basis of the substituted amount.