Probe module, method for making and use of same
View Patent ↗A probe module includes a mount; a cantilever disposed on the mount; an electrode disposed on the mount and opposing the cantilever, and a primary fastener disposed on the mount to mechanically separate the cantilever and the electrode at a primary distance. In the probe module, the cantilever is detachably disposed on the mount, the electrode is detachably disposed on the mount, or a combination thereof.
1. A probe module comprising:
a mount;
a cantilever disposed on the mount;
an electrode disposed on the mount and opposing the cantilever; and
a primary fastener disposed on the mount to mechanically separate the cantilever and the electrode at a primary distance,
wherein the cantilever is detachably disposed on the mount, or the electrode is detachably disposed on the mount.
2. The probe module of claim 1 , further comprising a secondary fastener to detachably dispose the cantilever on the mount.
3. The probe module of claim 2 , wherein the secondary fastener is configured to provide a voltage, or a charge to the cantilever.
4. The probe module of claim 1 , wherein the cantilever comprises:
a first end proximate to the mount;
a second end distal to the mount; and
a tip projecting from a surface of the cantilever,
wherein the cantilever is configured to reflect a light beam as a displacement diagnostic.
5. The probe module of claim 4 , wherein the cantilever further comprises:
a substrate; and
a layer disposed on the substrate, wherein the layer is electrically conductive.
6. The probe module of claim 4 , further comprising a cantilever base, wherein the cantilever base is interposed between secondary fastener and the mount such that the cantilever base and the cantilever are detachably disposed on the mount.
7. The probe module of claim 1 , wherein the electrode comprises:
a first electrode; and
a second electrode.
8. The probe module of claim 7 , wherein the first electrode and the second electrode are disposed substantially longitudinally along a length of the cantilever.
9. The probe module of claim 7 , wherein the first electrode and the second electrode are disposed substantially transversely along a width of the cantilever.
10. The probe module of claim 7 , wherein the first electrode is configured to receive a first voltage, or a first charge; and
the second electrode is configured to receive a second voltage, or a second charge.
11. The probe module of claim 1 , wherein the electrode comprises a plurality of electrodes arranged in an array.
12. The probe module of claim 1 , further comprising a displacement sensor disposed proximate to the cantilever.
13. The probe module of claim 1 , wherein the cantilever comprises a dielectric material.
14. The probe module of claim 1 , wherein the cantilever comprises an electrically conductive material.
15. The probe module of claim 1 , wherein the cantilever is configured to be displaced from a primary position in response to an electrostatic interaction with the electrode.
16. The probe module of claim 1 , wherein the primary fastener is configured to mechanically adjust the primary distance between the cantilever and the electrode.
17. The probe module of claim 1 , wherein the electrode is detachably disposed on the mount.
18. The probe module of claim 1 , wherein the probe module is configured to interact with a sample in an atomic force mode.
19. The probe module of claim 1 , wherein the primary fastener is configured to provide a voltage or a charge to the electrode.
20. The probe module of claim 1 , wherein the cantilever is configured to be displaced in a flexural mode, a torsional mode, or a combination comprising at least one of the foregoing in response to an electrostatic interaction with the electrode.