IP Library Granted Patent US 8,981,790
Granted Patent B2
US 8,981,790 · App. 13/375,742 · Granted Mar 17, 2015

Electronic device and noise current measuring method

Inventors: Satoshi Nakamura (Yokohama, JP); Takashi Suga (Yokohama, JP); Yutaka Uematsu (Kawasaki, JP)
Assignee: Hitachi, Ltd.
G01R31/001G01R29/26G01R31/281H05K1/0215H05K1/0234H05K1/141H05K3/325H05K9/0039H05K9/0069H05K2201/10022H05K2201/10409H05K2201/2036
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Quick Facts
Patent No.
US 8,981,790
App. No.
13/375,742
Granted
Mar 17, 2015
Kind
B2
Abstract

A noise current passing through a substrate on which an electronic component is mounted is suppressed in a housing, to provide a malfunction of an electronic device. A substrate ( 103 ) on which an electronic component is mounted is secured to a housing ( 102 ) by a metal spacer ( 108 ) and a screw ( 104 ). A noise control member ( 100 ) mainly composed of an insulation substance is disposed between the metal spacer ( 108 ) and the substrate ( 103 ). A first conductive film is formed on the metal spacer-side of the noise control member ( 100 ), and a second conductive film is formed on the substrate-side of the noise control member ( 100 ). A resistance member ( 101 ) is disposed between the first conductive film and the second conductive film. A noise current introduced from the housing to the substrate can be suppressed by the resistance member.

Claims (23)

1. An electronic device in which an enclosure and a PCB or PWB with a circuit component mounted thereon are secured by a screw and a metal spacer:

wherein a noise suppression component of which base material is an insulating material is disposed between the PCB or PWB and the metal spacer; and

a first conducting portion is formed on the metal spacer side of the noise suppression component, a second conducting portion is formed on the PCB or PWB side of the noise suppression component, and a resistance member is disposed between the first conducting portion and the second conducting portion.

2. The electronic device according to claim 1 :

wherein the resistance member is disposed on a first surface of the noise suppression component.

3. The electronic device according to claim 1 :

wherein the resistance member is embedded in the inside of the noise suppression component.

4. The electronic device according to claim 1 :

wherein a plurality of the resistance members are formed parallel to each other.

5. An electronic device in which an enclosure and a PCB or PWB with a circuit component mounted thereon are secured by a screw having a plate portion and a shank portion and a metal spacer:

wherein the plate portion of the screw includes a first conductive portion connected to the shank portion, an insulator portion surrounding the first conductive portion, and a second conductive portion surrounding the insulator portion and electrically connected to the PCB or PWB; and

a resistance member is disposed between the first conductive portion and the second conductive portion.

6. The electronic device according to claim 5 :

wherein the resistance member is disposed on a surface of the insulator portion.

7. The electronic device according to claim 5 :

wherein the resistance member is embedded in the inside of the insulator portion.

8. The electronic device according to claim 5 :

wherein a plurality of the resistance members are formed.

9. A method of measuring a noise current in an electronic device:

wherein the electronic device has a configuration such that an enclosure and a PCB or PWB with a circuit component mounted thereon are secured by a screw and a metal spacer;

a noise suppression component of which base material is an insulating material is disposed between the PCB or PWB and the metal spacer;

a first conducting portion is formed on the metal spacer-side of the noise suppression component, a second conducting portion is formed on the PCB or PWB-side of the noise suppression component and a resistance member is disposed between the first conducting portion and the second conducting portion; and

voltage between two ends of the resistance member is measured via a matching resistor connected in series with the resistance member.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jan 11, 2012
From: NAKAMURA, SATOSHI; SUGA, TAKASHI; UEMATSU, YUTAKA
To: HITACHI, LTD.
Reel/Frame 027513/0930 →
Priority Claims (1)
JP 2009-134139 · Jun 3, 2009 · national
Continuity (1)
Related Publication 20120119757A1 · May 17, 2012