IP Library Granted Patent US 8,987,651
Granted Patent B2
US 8,987,651 · App. 13/253,455 · Granted Mar 24, 2015

Photodetector including photodiodes overlapped with each other

Inventor: Yoshiyuki Kurokawa (Kanagawa, JP)
Assignee: Semiconductor Energy Laboratory Co., Ltd.
H01L27/14678
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Quick Facts
Patent No.
US 8,987,651
App. No.
13/253,455
Granted
Mar 24, 2015
Kind
B2
Abstract

An object is to reduce the size and manufacturing cost of a photodetector. In order to reduce the area where a visible light sensor and an infrared light sensor are provided, a first photodiode that detects visible light and a second photodiode that detects infrared light are arranged to overlap with each other so that visible light is absorbed first by the first photodiode, whereby significantly little visible light enters the second photodiode. Further, the first photodiode overlapping with the second photodiode is used as an optical filter for the second photodiode. Therefore, a semiconductor layer included in the first photodiode absorbs visible light and transmits infrared light, and a semiconductor layer included in the second photodiode absorbs infrared light.

Claims (103)

1. A photodetector comprising:

a first sensor comprising a first photodiode, a first transistor, and a second transistor;

a second sensor comprising a second photodiode, a third transistor, and a fourth transistor; and

an insulating film over the second photodiode, the first transistor, the second transistor, the third transistor, and the fourth transistor,

wherein the first photodiode overlaps with the second photodiode with the insulating film provided therebetween,

wherein the first photodiode comprises a first semiconductor,

wherein the second photodiode comprises a second semiconductor,

wherein the first photodiode and the second photodiode overlap with each other,

wherein a gate of the second transistor is electrically connected to a first terminal of the first transistor,

wherein a gate of the fourth transistor is electrically connected to a first terminal of the third transistor,

wherein a second terminal of the first transistor is electrically connected to a first electrode of the first photodiode, and

wherein a second terminal of the third transistor is electrically connected to a first electrode of the second photodiode.

2. The photodetector according to claim 1 ,

wherein the first semiconductor comprises amorphous silicon,

wherein the second semiconductor comprises crystalline silicon,

wherein the first transistor comprises the same semiconductor as the second photodiode, and

wherein the second transistor comprises the same semiconductor as the second photodiode.

3. The photodetector according to claim 2 ,

wherein the first photodiode comprises a p-type semiconductor region, an i-type semiconductor region, and an n-type semiconductor region, and

wherein the p-type semiconductor region, the i-type semiconductor region, and the n-type semiconductor region are stacked.

4. The photodetector according to claim 3 ,

wherein the second photodiode comprises a p-type semiconductor region, an i-type semiconductor region, and an n-type semiconductor region,

wherein the first photodiode overlaps with a region of the second photodiode, and

wherein an area of the region is larger than an area of the i-type semiconductor region.

5. The photodetector according to claim 4 , wherein the second semiconductor is provided over a glass substrate or a plastic substrate.

6. The photodetector according to claim 1 ,

wherein the first sensor comprises a fifth transistor,

wherein the second sensor comprises a sixth transistor,

wherein the second transistor and the fifth transistor are electrically connected in series between a power supply line and a first output signal line,

wherein the fourth transistor and the sixth transistor are electrically connected in series between the power supply line and a second output signal line,

wherein a second electrode of the first photodiode and a second electrode of the second photodiode are electrically connected to a reset signal line,

wherein a gate of the first transistor and a gate of the third transistor are electrically connected to a transfer control line, and

wherein a gate of the fifth transistor and a gate of the sixth transistor are electrically connected to a selection control line.

7. An electronic device comprising the photodetector according to claim 6 .

8. A photodetector comprising:

a first sensor comprising a first photodiode, a first transistor, a second transistor, and a third transistor; and

a second sensor comprising a second photodiode, a fourth transistor, a fifth transistor, and a sixth transistor,

wherein the first photodiode comprises a first semiconductor,

wherein the second photodiode comprises a second semiconductor,

wherein the first photodiode is configured to absorb visible light of an incident light and transmit infrared light of the incident light,

wherein the second photodiode is configured to absorb infrared light of the incident light transmitted through the first photodiode,

wherein the first photodiode and the second photodiode overlap with each other,

wherein a gate of the second transistor is electrically connected to a first terminal of the first transistor,

wherein a gate of the fifth transistor is electrically connected to a first terminal of the fourth transistor,

wherein a second terminal of the first transistor is electrically connected to a first electrode of the first photodiode,

wherein a second terminal of the fourth transistor is electrically connected to a first electrode of the second photodiode,

wherein the second transistor and the third transistor are electrically connected in series between a power supply line and a first output signal line,

wherein the fifth transistor and the sixth transistor are electrically connected in series between the power supply line and a second output signal line,

wherein a second electrode of the first photodiode and a second electrode of the second photodiode are electrically connected to a reset signal line,

wherein a gate of the first transistor and a gate of the fourth transistor are electrically connected to a transfer control line, and

wherein a gate of the third transistor and a gate of the sixth transistor are electrically connected to a selection control line.

9. The photodetector according to claim 8 ,

wherein the first transistor comprises the same semiconductor as the second photodiode, and

wherein the second transistor comprises the same semiconductor as the second photodiode.

10. The photodetector according to claim 9 ,

wherein the first photodiode comprises a p-type semiconductor region, an i-type semiconductor region, and an n-type semiconductor region, and

wherein the p-type semiconductor region, the i-type semiconductor region, and the n-type semiconductor region are stacked.

11. The photodetector according to claim 10 ,

wherein the second photodiode comprises a p-type semiconductor region, an i-type semiconductor region, and an n-type semiconductor region,

wherein the first photodiode overlaps with a region of the second photodiode, and

wherein an area of the region is larger than an area of the i-type semiconductor region.

12. The photodetector according to claim 11 , wherein the second semiconductor is provided over a glass substrate or a plastic substrate.

13. An electronic device comprising the photodetector according to claim 8 .

14. The photodetector according to claim 8 , further comprising an insulating film over the second photodiode, the first transistor, the second transistor, the third transistor, and the fourth transistor,

wherein the first photodiode overlaps with the second photodiode with the insulating film provided therebetween.

15. A display device comprising:

a photodetector over a substrate, the photodetector comprising:

a first sensor comprising a first photodiode, a first transistor, and a second transistor;

a second sensor comprising a second photodiode, a third transistor, and a fourth transistor; and

an insulating film over the second photodiode, the first transistor, the second transistor, the third transistor, and the fourth transistor; and

a display element over the substrate, the display element comprising:

a liquid crystal element,

wherein the first photodiode overlaps with the second photodiode with the insulating film provided therebetween,

wherein the first photodiode comprises a first semiconductor,

wherein the second photodiode comprises a second semiconductor,

wherein the first photodiode and the second photodiode overlap with each other,

wherein a gate of the second transistor is electrically connected to a first terminal of the first transistor,

wherein a gate of the fourth transistor is electrically connected to a first terminal of the third transistor,

wherein a second terminal of the first transistor is electrically connected to a first electrode of the first photodiode, and

wherein a second terminal of the third transistor is electrically connected to a first electrode of the second photodiode.

16. The display device according to claim 15 ,

wherein the first semiconductor comprises amorphous silicon,

wherein the second semiconductor comprises crystalline silicon,

wherein the display element comprises a fifth transistor,

wherein the first transistor comprises the same semiconductor as the second photodiode, and

wherein the second transistor comprises the same semiconductor as the second photodiode.

17. The display device according to claim 16 ,

wherein the first photodiode comprises a p-type semiconductor region, an i-type semiconductor region, and an n-type semiconductor region, and

wherein the p-type semiconductor region, the i-type semiconductor region, and the n-type semiconductor region are stacked.

18. The display device according to claim 17 ,

wherein the second photodiode comprises a p-type semiconductor region, an i-type semiconductor region, and an n-type semiconductor region,

wherein the first photodiode overlaps with a region of the second photodiode, and

wherein an area of the region is larger than an area of the i-type semiconductor region.

19. The display device according to claim 18 , wherein the substrate is a glass substrate or plastic substrate.

20. The display device according to claim 15 ,

wherein the first sensor comprises a fifth transistor,

wherein the second sensor comprises a sixth transistor,

wherein the second transistor and the fifth transistor are electrically connected in series between a power supply line and a first output signal line,

wherein the fourth transistor and the sixth transistor are electrically connected in series between the power supply line and a second output signal line,

wherein a second electrode of the first photodiode and a second electrode of the second photodiode are electrically connected to a reset signal line,

wherein a gate of the first transistor and a gate of the third transistor are electrically connected to a transfer control line, and

wherein a gate of the fifth transistor and a gate of the sixth transistor are electrically connected to a selection control line.

21. An electronic device comprising the display device according to claim 20 .

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Oct 5, 2011
From: KUROKAWA, YOSHIYUKI
To: SEMICONDUCTOR ENERGY LABORATORY CO., LTD.
Reel/Frame 027019/0785 →
Priority Claims (1)
JP 2010-227467 · Oct 7, 2010 · national
Continuity (1)
Related Publication 20120085890A1 · Apr 12, 2012