IP Library Granted Patent US 8,987,846
Granted Patent B2
US 8,987,846 · App. 14/018,215 · Granted Mar 24, 2015

Magnetic memory and manufacturing method thereof

Inventor: Yoshinori Kumura (Seoul, KR)
H01L43/02H01L43/12H01L27/2472
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Quick Facts
Patent No.
US 8,987,846
App. No.
14/018,215
Granted
Mar 24, 2015
Kind
B2
Abstract

According to one embodiment, a magnetic memory is disclosed. The magnetic memory includes a substrate, and a contact plug provided on the substrate. The contact plug includes a first contact plug, and a second contact plug provided on the first contact plug and having a smaller diameter than that of the first contact plug. The magnetic memory further includes a magnetoresistive element provided on the second contact plug. The diameter of the second contact plug is smaller than that of the magnetoresistive element.

Claims (41)

1. A magnetic memory comprising:

a substrate;

a contact plug provided on the substrate, the contact plug including a first contact plug, and a second contact plug provided on the first contact plug and having a smaller diameter than a diameter of the first contact plug, and the first and second contact plugs comprising a same material; and

a magnetoresistive element provided on the second contact plug, wherein the diameter of the second contact plug is smaller than a diameter of the magnetoresistive element.

2. The magnetic memory according to claim 1 , wherein an upper surface of the second contact plug is covered with the magnetoresistive element.

3. A magnetic memory comprising:

a substrate;

a contact plug provided on the substrate, the contact plug including a first contact plug, and a second contact plug provided on the first contact plug and having a smaller diameter than a diameter of the first contact plug, the first contact plug comprising a first material, and the second contact plug comprising a second material differing from the first material; and

a magnetoresistive element provided on the second contact plug, wherein the diameter of the second contact plug is smaller than a diameter of the magnetoresistive element.

4. The magnetic memory according to claim 3 , wherein the second material is lower in resistance than the first material.

5. The magnetic memory according to claim 3 , wherein the second material includes at least one of tantalum, silicon, titanium, copper, tungsten, aluminum, hafnium, boron, nickel, cobalt, and carbon nanotube.

6. A magnetic memory comprising:

a substrate;

a contact plug provided on the substrate, the contact plug including a first contact plug, and a second contact plug provided on the first contact plug and having a smaller diameter than a diameter of the first contact plug; and

a magnetoresistive element provided on the second contact plug, wherein the diameter of the second contact plug is smaller than a diameter of the magnetoresistive element,

wherein a side surface of the first contact plug is covered with a first insulating film, and a side surface of the second contact plug is covered with a second insulating film of a material differing from a material of the first insulating film.

7. The magnetic memory according to claim 6 , wherein the second insulating film includes an element constituting the second contact plug.

8. The magnetic memory according to claim 7 , wherein the second insulating film includes a nitrided or oxidized material of at least one of tantalum, silicon, titanium, copper, tungsten, aluminum, hafnium, boron, cobalt, and carbon nanotube.

9. The magnetic memory according to claim 6 , wherein the second contact plug has a hollow structure in which a hollow space is provided along a height direction.

10. The magnetic memory according to claim 9 , wherein the hollow structure is a hollow cylinder.

11. The magnetic memory according to claim 9 , wherein the first contact plug contacts the second contact plug at two points in a cross section of the first and second contact plugs taken along a plane defined by a normal direction which is perpendicular to a stacking direction of the first and second contact plugs.

12. The magnetic memory according to claim 6 , wherein the second contact plug includes an L-shaped portion.

13. The magnetic memory according to claim 6 , wherein the magnetoresistive element is a MTJ (Magnetic Tunnel Junction) element.

14. A method for manufacturing a magnetic memory comprising:

forming a first insulating film on a substrate;

forming a first contact plug in the first insulating film;

forming a second insulating film on the first insulating film;

forming a second contact plug connected to the first contact plug in the second insulating film, the second contact plug having a smaller diameter than a diameter of the first contact plug;

forming stacked films to be processed into a magnetoresistive element on the second contact plug and the second insulating film; and

forming the magnetoresistive element by processing the stacked films.

15. The method according to claim 14 , wherein the first and second insulating films comprise a same material.

16. A method for manufacturing a magnetic memory comprising:

forming a first insulating film on a substrate;

forming a first contact hole in the first insulating film;

filling the first contact hole with a first contact plug;

turning an upper part of the first contact hole into a trench unfilled with the first contact plug by removing an upper part of the first contact plug;

forming a second insulating film on a part of the first contact plug and forming a second contact hole which reaches the first contact plug and is surrounded by the second insulating film;

filling the second contact hole with a second contact plug;

forming stacked films to be processed into a magnetoresistive element on the second contact plug and the second insulating film; and

forming the magnetoresistive element by processing the stacked films.

17. The method according to claim 16 , wherein the first insulating film comprises a material differing from a material of the second insulating film.

Assignments (5)
MERGER Recorded Jan 22, 2021
From: TOSHIBA MEMORY CORPORATION
To: K.K. PANGEA
Reel/Frame 055659/0471 →
CHANGE OF NAME AND ADDRESS Recorded Jan 22, 2021
From: TOSHIBA MEMORY CORPORATION
To: KIOXIA CORPORATION
Reel/Frame 055669/0001 →
CHANGE OF NAME AND ADDRESS Recorded Jan 22, 2021
From: K.K. PANGEA
To: TOSHIBA MEMORY CORPORATION
Reel/Frame 055669/0401 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Aug 24, 2017
From: KABUSHIKI KAISHA TOSHIBA
To: TOSHIBA MEMORY CORPORATION
Reel/Frame 043709/0035 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Feb 29, 2016
From: KUMURA, YOSHINORI
To: KABUSHIKI KAISHA TOSHIBA
Reel/Frame 037855/0283 →
Continuity (2)
Provisional Application 61804517 · Mar 22, 2013
Related Publication 20140284737A1 · Sep 25, 2014