Semiconductor device and driving method thereof
The storage device includes a volatile first memory circuit and a nonvolatile second memory circuit which includes a transistor whose channel is formed in an oxide semiconductor layer. In the case of high-frequency driving, during a period when source voltage is applied, a data signal is input to and output from the first memory circuit, and during a part of a period when source voltage is supplied, which is before the supply of the source voltage is stopped, a data signal is input to the second memory circuit. In the case of low-frequency driving, during a period when source voltage is applied, a data signal is input to the second memory circuit, the data signal input to the second memory circuit is input to the first memory circuit, and the data signal input to the first memory circuit is output.
1. A semiconductor device comprising:
a first memory circuit;
a second memory circuit comprising a capacitor and a first transistor whose channel is formed in an oxide semiconductor layer,
a selection circuit comprising a first input terminal, a second input terminal, and an output terminal;
a first switch; and
a second switch,
wherein at least one of the first memory circuit, the selection circuit, the first switch and the second switch comprises a second transistor whose channel is formed in a single crystal semiconductor,
wherein the first transistor is over the second transistor with an insulating layer interposed therebetween,
wherein the first input terminal of the selection circuit is electrically connected to the first switch and a first terminal of the first transistor,
wherein the second input terminal of the selection circuit is electrically connected to one of a pair of terminals of the capacitor and a second terminal of the first transistor, and
wherein the output terminal of the selection circuit is electrically connected to the second switch through the first memory circuit.
2. The semiconductor device according to claim 1 ,
wherein the first switch is configured to be turned ON when the second switch is turned OFF, and
wherein in the first switch is configured to be turned OFF when the second switch is turned ON.
3. The semiconductor device according to claim 1 , wherein each of the first switch and the second switch is an analog switch.
4. The semiconductor device according to claim 1 , wherein the selection circuit is configured to perform switching from input of a signal to the first input terminal or the second input terminal to output of the signal input to the first input terminal or the second input terminal to the first memory circuit, in response to a selection signal input to the selection circuit.
5. The semiconductor device according to claim 1 , wherein the oxide semiconductor layer contains indium and zinc.
6. The semiconductor device according to claim 1 , wherein an off-state current of the first transistor is 1 aA/μm or lower.
7. The semiconductor device according to claim 1 , wherein the single crystal semiconductor is a single crystal silicon.
8. A CPU comprising a register, wherein the register comprises the semiconductor device according to claim 1 .
9. A semiconductor device comprising:
a latch circuit comprising a first inverter and a second inverter;
a memory circuit comprising a capacitor and a first transistor whose channel is formed in an oxide semiconductor layer,
a selection circuit comprising a first input terminal, a second input terminal, and an output terminal;
a first switch; and
a second switch,
wherein at least one of the first inverter, the second inverter, the selection circuit, the first switch and the second switch comprises a second transistor whose channel is formed in a single crystal semiconductor,
wherein the first transistor is over the second transistor with an insulating layer interposed therebetween,
wherein the first input terminal of the selection circuit is electrically connected to the first switch and a first terminal of the first transistor,
wherein the second input terminal of the selection circuit is electrically connected to one of a pair of terminals of the capacitor and a second terminal of the first transistor, and
wherein the output terminal of the selection circuit is electrically connected to an input terminal of the first inverter and an output terminal of the second inverter, and
wherein the second switch is electrically connected to an output terminal of the first inverter and an input terminal of the second inverter.
10. The semiconductor device according to claim 9 ,
wherein the first switch is configured to be turned ON when the second switch is turned OFF, and
wherein in the first switch is configured to be turned OFF when the second switch is turned ON.
11. The semiconductor device according to claim 9 , wherein each of the first switch and the second switch is an analog switch.
12. The semiconductor device according to claim 9 , wherein the selection circuit is configured to perform switching from input of a signal to the first input terminal or the second input terminal to output of the signal input to the first input terminal or the second input terminal to the latch circuit, in response to a selection signal input to the selection circuit.
13. The semiconductor device according to claim 9 , wherein the oxide semiconductor layer contains indium and zinc.
14. The semiconductor device according to claim 9 , wherein an off-state current of the first transistor is 1 aA/μm or lower.
15. The semiconductor device according to claim 9 , wherein the single crystal semiconductor is a single crystal silicon.
16. A CPU comprising a register, wherein the register comprises the semiconductor device according to claim 9 .