Sliced specimen preparing apparatus
A sliced specimen preparing apparatus prepares a sliced specimen by slicing a surface of a specimen block in which a specimen is embedded in an embedding-substance. The apparatus includes: a cutter configured to slice the surface of the specimen block; a surface exposure determination unit configured to determine whether or not the area of a specimen portion on the surface of the specimen block is sufficient for the preparation of the sliced specimen; and a specimen block transporting unit configured to transport the specimen block between the surface exposure determination unit and the cutter. The surface exposure determination unit includes a humidifying unit configured to humidify the surface of the specimen block; an irradiating unit configured to irradiate the surface of the specimen block with light; an imaging unit configured to receive reflected light from the humidified surface of the specimen block which is irradiated from the irradiating unit to acquire image data; an image data processing unit configured to discriminate the specimen portion on the surface of the specimen block from the embedding-substance portion based on the image data acquired by the imaging unit; and a controller configured to control the imaging unit, the irradiating unit, and the image data processing unit, and to determine whether or not the area of the specimen portion on the surface of the specimen block, the specimen portion being acquired by the image data processing unit, is sufficient for the preparation of the sliced specimen.
1. A sliced specimen preparing apparatus that prepares a sliced specimen by slicing a surface of a specimen block in which a specimen is embedded in an embedding-substance, the apparatus comprising:
a cutter configured to slice the surface of the specimen block;
a surface exposure determination unit configured to determine whether or not the area of a specimen portion on the surface of the specimen block is sufficient for the preparation of the sliced specimen;
a specimen block transporting unit configured to transport the specimen block; and
a humidifying unit configured to add moisture in a mist form to the surface of the specimen block, wherein
the surface exposure determination unit includes:
an irradiating unit configured to irradiate the surface of the specimen block with light;
an imaging unit configured to receive reflected light from humidified surface of the specimen block which is irradiated from the irradiating unit to acquire image data;
an image data processing unit configured to discriminate the specimen portion on the surface of the specimen block from the embedding-substance portion based on the image data acquired by the imaging unit; and
a controller configured to control the imaging unit, the irradiating unit, and the image data processing unit, and to determine whether or not the area of the specimen portion on the surface of the specimen block, the specimen portion being acquired by the image data processing unit, is sufficient for the preparation of the sliced specimen.
2. The sliced specimen preparing apparatus according to claim 1 , wherein
the imaging unit receives reflected light from the humidified surface of the specimen block to acquire image data containing luminance information, and
the image data processing unit discriminates the specimen portion on the surface of the specimen block from the embedding-substance portion based on light and shade contrast data acquired based on luminance information in the image data, the luminance information being acquired by the imaging unit.
3. The sliced specimen preparing apparatus according to claim 1 , wherein the controller of the surface exposure determination unit controls the specimen block transporting unit and the cutter such that,
when determining that the area of the specimen portion on the surface of the specimen block is not sufficient for the preparation of the sliced specimen, the controller causes the specimen block transporting unit to transport the specimen block to the cutter, the cutter roughly cuts the specimen block, and the controller causes the specimen block transporting unit to return the specimen block to the surface exposure determination unit, and the surface exposure determination unit determines whether or not the area of the specimen portion on the surface of the specimen block is sufficient for the preparation of the sliced specimen, and
when determining that the area of the specimen portion on the surface of the specimen block is sufficient for the preparation of the sliced specimen, the controller causes the specimen block transporting unit to transport the specimen block to the cutter, and the cutter slices the specimen block to prepare the sliced specimen.
4. The sliced specimen preparing apparatus according to claim 2 , wherein the controller of the surface exposure determination unit controls the specimen block transporting unit and the cutter such that,
when determining that the area of the specimen portion on the surface of the specimen block is not sufficient for the preparation of the sliced specimen, the controller causes the specimen block transporting unit to transport the specimen block to the cutter, the cutter roughly cuts the specimen block, and the controller causes the specimen block transporting unit to return the specimen block to the surface exposure determination unit, and the surface exposure determination unit determines whether or not the area of the specimen portion on the surface of the specimen block is sufficient for the preparation of the sliced specimen, and
when determining that the area of the specimen portion on the surface of the specimen block is sufficient for the preparation of the sliced specimen, the controller causes the specimen block transporting unit to transport the specimen block to the cutter, and the cutter slices the specimen block to prepare the sliced specimen.