IP Library Granted Patent US 9,134,263
Granted Patent B2
US 9,134,263 · App. 14/301,045 · Granted Sep 15, 2015

Gem tester

Inventors: Daniel L. Kessler (Dallas, TX); Henry M. Kessler (Dallas, TX)
Assignee: Sy Kessler Sales, Inc.
G01N27/02G01N25/18G01N27/04G01N27/041G01N33/24G01N33/381
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Quick Facts
Patent No.
US 9,134,263
App. No.
14/301,045
Granted
Sep 15, 2015
Kind
B2
Abstract

A gem tester for testing a gem under test and a kit including a horizontal recharging stand are disclosed. In one embodiment of the gem tester, an elongated body has a line-of-sight contour tapering from a bulbous end to a radially deviating frontal nose having a probe extending therefrom. Internal circuitry measures electrical and thermal conductivity of the gem under test in order to identify the type of gem under test and drive a color control signal in response thereto. A luminescent mounting extends about the contact to provide, in response to the control signal, a color indication of the identified gem type.

Claims (45)

1. A gem tester for testing a gem under test, the gem tester comprising:

an elongated body having a first end and a second end;

a probe extending from the first end of the elongated body;

a circuit portion located within the elongated body, the circuit portion being electrically coupled to the probe to measure electrical conductivity of the gem under test;

the circuit portion configured to determine identified type and drive a color control signal in response thereto, the identified type being selected from a plurality of gem types;

a luminescent mounting extending from the first end communicatively with the circuit portion, the luminescent mounting providing a plurality of colors corresponding to the plurality of gem types, the luminescent mounting lighting one of the plurality of colors in response to receiving the color control signal; and

a line-of-sight contour extending from the second end of the elongated body to the first end of the body, including the luminescent mounting to the probe.

2. The gem tester as recited in claim 1 , wherein the elongated body further comprises:

the first end having a radially deviating frontal nose;

the second end having a bulbous form;

the elongated body being tapered from the first end to the second end; and

a center of mass being proximate the second end when the gem tester is batteried.

3. The gem tester as recited in claim 1 , wherein the elongated body further comprises a tripod contoured surface proximate to the first end, the tripod contoured surface configured to accept a tripod hand grip.

4. The gem tester as recited in claim 1 , wherein the probe further comprises a deflectable probe configured to be displaced in response to contact pressure.

5. The gem tester as recited in claim 1 , wherein the circuit portion further comprises electrical components for applying a voltage across the gem under test, the electrical components successively sampling the voltage across the gem under test to provide data for determining a gem type based upon a predetermined number of samples exceeding a threshold voltage.

6. The gem tester as recited in claim 1 , wherein the circuit portion further comprises heating components for heating the probe and monitoring the temperature of the heated probe.

7. The gem tester as recited in claim 1 , wherein the circuit portion further comprises a microprocessor.

8. The gem tester as recited in claim 1 , wherein the luminescent mounting further comprises white light source for illuminating the gem under test.

9. The gem tester as recited in claim 1 , wherein the luminescent mounting further comprises green, red, and blue colors.

10. The gem tester as recited in claim 1 , wherein the gem tester identifies diamond, metal, and moissanite.

11. The gem tester as recited in claim 1 , further comprising a releasable cap having a snap-fit engagement about the probe.

12. A gem tester for testing a gem under test, the gem tester comprising:

an elongated body having a first end and a second end;

a probe extending from the first end of the elongated body;

means for measuring electrical conductivity of the gem under test communicatively disposed with the probe;

a circuit portion located within the elongated body communicatively with the means for measuring electrical conductivity, the circuit portion configured to determine identified type and drive a color control signal in response thereto, the identified type being selected from a plurality of gem types;

means for providing, in response to receiving the color control signal, a plurality of colors corresponding to the plurality of gem types; and

a line-of-sight contour extending from the second end of the elongated body to the first end of the body to the luminescent mounting to the probe.

13. The gem tester as recited in claim 12 , wherein the gem tester identifies diamond, metal, and moissanite.

14. The gem tester as recited in claim 12 , wherein the means for providing a plurality of colors further comprises means for providing green, red, and blue colors.

15. A gem tester for testing a gem under test, the gem tester comprising:

an elongated body having a first end and a second end;

a probe extending from the first end of the elongated body;

a circuit portion located within the elongated body, the first circuit portion being electrically coupled to the probe to measure electrical conductivity of the gem under test;

the circuit portion configured to determine identified type and drive a color control signal in response thereto, the identified type being selected from a plurality of gem types;

a luminescent mounting mounted proximate to the first end and communicatively with the circuit portion, the luminescent mounting providing a plurality of colors corresponding to the plurality of gem types, the luminescent mounting lighting one of the plurality of colors in response to receiving the color control signal; and

a line-of-sight contour extending from the second end of the elongated body to the first end of the body, including the luminescent mounting to the probe.

16. The gem tester as recited in claim 15 , wherein the circuit portion further comprises electrical components for applying a voltage across the gem under test, the electrical components successively sampling the voltage across the gem under test to provide data for determining a gem type based upon a predetermined number of samples exceeding a threshold voltage.

17. The gem tester as recited in claim 15 , wherein the elongated body further comprises:

the first end having a radially deviating frontal nose;

the second end having a bulbous form;

the elongated body being tapered from the first end to the second end; and

a center of mass being proximate the second end when the gem tester is batteried.

18. The gem tester as recited in claim 15 , wherein the elongated body further comprises a tripod contoured surface proximate to the first end, the tripod contoured surface configured to accept a tripod hand grip.

19. The gem tester as recited in claim 15 , wherein the probe further comprises a deflectable probe configured to be displaced in response to contact pressure.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jul 2, 2014
From: KESSLER, DANIEL L.; KESSLER, HENRY M.
To: SY KESSLER SALES, INC.
Reel/Frame 033228/0334 →
Continuity (4)
Continuation 14058343 · Oct 21, 2013
Continuation 13165053 · Jun 21, 2011
Provisional Application 61356943 · Jun 21, 2010
Related Publication 20140292358A1 · Oct 2, 2014