Selecting a survey setting for characterizing a target structure

1. A method comprising:

calculating complex-valued sensitivity data structures corresponding to respective candidate survey settings, wherein the sensitivity data structures relate measurement data associated with a target structure to at least one parameter of a model of the target structure;

selecting, based on the sensitivity data structures, a subset of the candidate survey settings according to a criterion for enhancing resolution in characterizing the target structure; and

configuring survey equipment according to at least one survey setting in the subset of the candidate survey settings to perform a survey operation of the target structure.

2. The method of claim 1 , wherein the criterion is based on identifying at least one of the candidate survey settings that reduces posterior uncertainty.

3. The method of claim 1 , wherein selecting the subset comprises performing an iterative procedure, the iterative procedure comprising:

adding one of the sensitivity data structures to a collection of sensitivity data structures previously considered; and

based on a present content of the collection of the sensitivity data structures, identifying, according to the criterion, one of the candidate survey settings corresponding to the present content of the collection.

4. The method of claim 3 , wherein the iterative procedure further comprises:

determining whether a convergence condition has been satisfied; and

in response to the convergence condition not being satisfied, continuing with the iterative procedure by adding a further sensitivity data structure to the collection, and based on a further present content of the collection, identifying, according to the criterion, one of the candidate survey settings corresponding to the further present content of the collection.

5. The method of claim 1 , wherein a particular one of the candidate survey settings includes at least one item selected from the group consisting of: type of survey equipment, a position of at least one component of the survey equipment, at least one operational characteristic of the survey equipment.

6. The method of claim 1 , wherein the criterion is according to a ratio between a determinant of a prior covariance matrix and a determinant of a posterior covariance matrix.

7. The method of claim 1 , wherein the sensitivity data structures include information relating to the at least one model parameter that is sensitive to a subregion less than an entirety of the target structure.

8. The method of claim 1 , wherein the at least one parameter of the model accounts for an anisotropic radiation pattern of a scatterer in the target structure.

9. The method of claim 8 , wherein the at least one parameter of the model is based on a function that encodes a shape of the scatterer.

10. The method of claim 1 , wherein selecting the subset of the candidate survey settings comprises selecting a particular candidate survey settings plural times to allow for stacking of measurement data acquired by the particular candidate survey setting.

11. The method of claim 1 , further comprising using a process including the calculating and the selecting to identify, for further processing, a subset of measurement data acquired by a survey arrangement including the configured survey equipment.

12. An article comprising at least one non-transitory machine-readable storage medium storing instructions that upon execution cause a system to:

calculate complex-valued sensitivity data structures corresponding to respective candidate survey settings, wherein the sensitivity data structures relate measurement data associated with a target structure to at least one parameter of a model of the target structure;

select, based on the sensitivity data structures, a subset of the candidate survey settings according to a criterion for enhancing resolution in characterizing the target structure; and

processing survey data acquired by survey equipment configured according to at least one survey setting in the subset of the candidate survey settings.

13. The article of claim 12 , wherein the sensitivity data structures relate perturbations of measurement data to perturbations of the at least one model parameter.

14. The article of claim 12 , wherein the target structure comprises a target subterranean structure.

15. The article of claim 12 , wherein the criterion is based on prior covariance information relating to the model.

16. The article of claim 15 , wherein the criterion is based on a value derived from a determinant of the prior covariance information and a determinant of posterior covariance information.

17. The article of claim 12 , wherein the selecting is performed using an iterative procedure in which individual ones of the sensitivity data structures are added to a collection of sensitivity data structures for consideration with successive iterations.

18. The article of claim 12 , wherein the at least one parameter of the model accounts for an anisotropic radiation pattern of a scatterer in the target structure.

19. A system comprising:

at least one storage medium to store complex-valued sensitivity data structures corresponding to respective candidate survey settings, wherein the sensitivity data structures relate measurement data associated with a target structure to at least one parameter of a model of the target structure;

at least one processor to select, based on the sensitivity data structures, a subset of the candidate survey settings according to a criterion for enhancing resolution in characterizing the target structure; and

survey equipment configured according to at least one survey setting of the subset of the candidate survey settings.

20. The system of claim 19 , wherein the criterion is based on prior covariance information relating to the model.

21. The method of claim 1 , wherein the configuring of the survey equipment comprises one or more of adjusting an operational characteristic of a component in the survey equipment, positioning a component in the survey equipment, and using a selected type of component in the survey equipment.