IP Library Granted Patent US 9,228,259
Granted Patent B2
US 9,228,259 · App. 14/166,462 · Granted Jan 5, 2016

Method for treatment of deposition reactor

Inventors: Suvi Haukka (Helsinki, FI); Eric James Shero (Phoenix, AZ); Fred Alokozai (Scottsdale, AZ); Dong Li (Phoenix, AZ); Jereld Lee Winkler (Gilbert, AZ); Xichong Chen (Chandler, AZ)
Assignee: ASM IP Holding B.V.
C23C16/4404C23F1/00C23F1/08H01L21/32135H01L21/32136
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Quick Facts
Patent No.
US 9,228,259
App. No.
14/166,462
Granted
Jan 5, 2016
Kind
B2
Abstract

A method for treating a deposition reactor is disclosed. The method removes or mitigates formation of residue in a gas-phase reactor used to deposit doped metal films, such as aluminum-doped titanium carbide films or aluminum-doped tantalum carbide films. The method includes a step of exposing a reaction chamber to a treatment reactant that mitigates formation of species that lead to residue formation.

Claims (25)

1. A method of treating a deposition reactor, the method comprising the steps of:

providing a metal halide chemistry, selected from the group consisting of titanium halides, tantalum halides, and niobium halides, to a reaction chamber of the deposition reactor;

providing a metal CVD precursor selected from the group consisting of organometallic compound chemistry and aluminum CVD compound chemistry to the reaction chamber;

forming a deposited doped metal film comprising one or more of B, C, Si N overlying a substrate;

optionally removing the substrate;

providing a treatment reactant chemistry to the reaction chamber;

exposing the reaction chamber to the treatment reactant chemistry to mitigate formation of particles comprising decomposition products of the metal CVD precursor; and

purging the reaction chamber.

2. The method of claim 1 , wherein the step of providing a treatment reactant chemistry to the reaction chamber includes providing a reactant selected from one or more of the group consisting of hydrogen compounds including one or more hydrogen atoms and compounds including a halogen.

3. The method of claim 1 , wherein the step of providing a treatment reactant chemistry comprises providing a compound selected from the group comprising ammonia, hydrogen, silane, methane, silicon hydrides, boron hydrides, halosilanes, haloboranes, alkenes, alkynes, and hydrazine and its derivatives.

4. The method of claim 1 , wherein the step of providing a treatment reactant chemistry comprises providing ammonia to the reaction chamber.

5. The method of claim 1 , wherein the step of providing a treatment reactant chemistry comprises providing a source of a decomposition product of a compound selected from the group consisting of organometallic compounds and aluminum CVD compounds.

6. The method of claim 1 , further comprising the step of exposing a treatment reactant to a plasma.

7. The method of claim 1 , further comprising the step of exposing a treatment reactant to thermal excitation.

8. A method of treating a deposition reactor, the method comprising the steps of:

providing a metal halide chemistry, selected from the group consisting of titanium halides, tantalum halides, and niobium halides, to a reaction chamber for a period of time;

after the step of providing a metal halide chemistry to a reaction chamber for a period of time, providing a treatment reactant chemistry to the reaction chamber for a period of time; and

during or after providing a treatment reactant chemistry to the reaction chamber for a period of time, providing a metal CVD precursor chemistry to the reaction chamber to form a layer of doped metal,

wherein use of the treatment reactant chemistry mitigates particle formation in the reaction chamber.

9. The method of claim 8 , wherein the step of providing a treatment reactant chemistry to the reaction chamber includes providing a reactant chemistry from a source selected from one or more of the group consisting of hydrogen compounds including one or more hydrogen atoms and compounds including a halogen.

10. The method of claim 8 , wherein the step of providing a treatment reactant chemistry comprises providing a compound from a source selected from the group comprising ammonia, hydrogen, silane, methane, silicon hydrides, boron hydrides, halosilanes, haloboranes, alkenes, alkynes, and hydrazine and its derivatives.

11. The method of claim 8 , wherein the step of providing a treatment reactant chemistry comprises providing activated hydrogen to the reaction chamber.

12. The method of claim 8 , wherein the step of providing a treatment reactant chemistry comprises providing a source of a decomposition product of a compound selected from the group consisting of organometallic compounds and aluminum CVD compounds.

13. The method of claim 8 , further comprising the step of exposing a treatment reactant to a plasma.

14. The method of claim 8 , further comprising the step of exposing a treatment reactant to thermal excitation.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jan 28, 2014
From: HAUKKA, SUVI; SHERO, ERIC JAMES; ALOKOZAI, FRED; LI, DONG; WINKLER, JERELD LEE; CHEN, XICHONG
To: ASM IP HOLDING B.V.
Reel/Frame 032066/0770 →
Continuity (2)
Provisional Application 61759990 · Feb 1, 2013
Related Publication 20140220247A1 · Aug 7, 2014