Spectrometry system with decreased light path
A spectrometer comprises a plurality of isolated optical channels comprising a plurality of isolated optical paths. The isolated optical paths decrease cross-talk among the optical paths and allow the spectrometer to have a decreased length with increased resolution. In many embodiments, the isolated optical paths comprise isolated parallel optical paths that allow the length of the device to be decreased substantially. In many embodiments, each isolated optical path extends from a filter of a filter array, through a lens of a lens array, through a channel of a support array, to a region of a sensor array. Each region of the sensor array comprises a plurality of sensor elements in which a location of the sensor element corresponds to the wavelength of light received based on an angle of light received at the location, the focal length of the lens and the central wavelength of the filter.
1. A spectrometer comprising: a light path, the light path passing sequentially through a diffuser, a filter matrix, and a lens array; and
at least one opaque aperture array between the filter matrix and the lens array;
wherein the light path ends at a detector;
wherein the detector comprises multiple sensors;
wherein the light path from the diffuser to the detector is less than 9 mm
and wherein the resolution of the spectrometer is less than 10 nm.
2. The spectrometer of claim 1 wherein the light path beginning at the diffuser and ending at the detector is less than 6 mm.
3. The spectrometer of claim 1 wherein the light path beginning at the diffuser and ending at the detector is less than 4.5 mm.
4. The spectrometer of claim 1 wherein the resolution of the spectrometer is less than 8 nm.
5. The spectrometer of claim 1 wherein the resolution of the spectrometer is less than 5 nm.
6. The spectrometer of claim 1 with a detectable wavelength range larger than 100 nm.
7. The spectrometer of claim 1 with a detectable wavelength range larger than 200 nm.
8. The spectrometer of claim 1 with a detectable wavelength range larger than 300 nm.
9. The spectrometer of claim 1 wherein the spectrometer does not comprise a dispersive optical element.
10. The spectrometer of claim 1 wherein the transmission spectra of the filters in the filter matrix vary with angle of incidence.
11. The spectrometer of claim 1 wherein the filter matrix is composed of interference filters.
12. The spectrometer of claim 1 wherein the filters in the filter matrix are arranged in a specific order to minimize cross talk on the detector of light emerging from different filters.
13. The spectrometer of claim 1 further comprising an opaque absorbing aperture array between the filter matrix and the detector.
14. The spectrometer of claim 1 where spectra of each of a plurality of filters in the matrix overlaps another filter of the plurality of filters in the matrix.
15. The matrix of claim 14 wherein the overlap allows stitching of spectra generated by two different filters.
16. The spectrometer of claim 1 further comprising an illumination system.
17. The spectrometer of claim 16 wherein the illumination system comprises LEDs.
18. The spectrometer of claim 1 further comprising a thermal sensor capable of measuring a sampled material's temperature.
19. The spectrometer of claim 1 further comprising a reference element in front of the spectrometer.
20. The spectrometer of claim 1 wherein the detector comprises one or more of a 2D CMOS sensor or a 2D CCD sensor.
21. The spectrometer of claim 20 wherein the multiple sensors comprise pixels on the one or more of the 2D CMOS sensor or the 2D CCD sensor.