Method and apparatus for controlling operation of flash memory
View Patent ↗A method and apparatus for controlling the operation of flash memory are provided. The apparatus for controlling the operation of flash memory includes a control unit and a voltage adjustment unit. The control unit outputs a control signal adapted to change one or more of the program, erase and read voltage conditions for the flash memory to the voltage adjustment unit in response to the input of a PUF mode selection signal. The voltage adjustment unit changes the one or more of the program, erase and read voltage conditions for the flash memory in response to the input of the control signal.
1. A method of controlling operation of flash memory, comprising:
outputting, by a control unit, a control signal adapted to change one or more of program, erase and read voltage conditions for the flash memory to a voltage adjustment unit in response to input of a PUF mode selection signal; and
changing, by the voltage adjustment unit, the one or more of the program, erase and read voltage conditions for the flash memory in response to input of the control signal,
wherein the program voltage condition includes voltage level and pulse duration of a single pulse that is applied when a program operation is performed on the flash memory.
2. The method of claim 1 , wherein the program voltage condition is application of voltage level or pulse duration lower or shorter than that of a program voltage condition of common flash memory.
3. The method of claim 1 , wherein the read voltage condition includes a level of a read reference voltage that is used to distinguish logical values 0 and 1 from each other.
4. The method of claim 3 , wherein the read reference voltage is set to an average or median value of a distribution of threshold voltages of the flash memory that is generated when voltage level or pulse duration lower or shorter than that of a program voltage condition of common flash memory.
5. The method of claim 1 , wherein the program voltage condition is identical to a program voltage condition of common flash memory.
6. The method of claim 5 , wherein an average or median value of a distribution of threshold voltages of the flash memory that has executed a program command based on the program voltage condition is set as a read reference voltage included in the read voltage condition.
7. The method of claim 1 , wherein the erase voltage condition includes voltage level and pulse duration of a single pulse that is applied when an erase operation is performed on the flash memory.
8. The method of claim 7 , wherein an average or median value of a distribution of threshold voltages of the flash memory that has executed an erase command based on the erase voltage condition is set as a read reference voltage included in the read voltage condition.
9. An apparatus for controlling operation of flash memory, comprising:
a control unit configured to output a control signal adapted to change one or more of program, erase and read voltage conditions for the flash memory to a voltage adjustment unit in response to input of a PUP mode selection signal; and
the voltage adjustment unit configured to change the one or more of the program, erase and read voltage conditions for the flash memory in response to input of the control signal,
wherein the program voltage condition includes voltage level and pulse duration of a single pulse that is a applied when a program operation is performed on the flash memory.
10. The apparatus of claim 9 , wherein the program voltage condition is application of voltage level or pulse duration lower or shorter than that of a program voltage condition of common flash memory.
11. The apparatus of claim 9 , wherein the read voltage condition includes a level of a read reference voltage that is used to distinguish logical values 0 and 1 from each other.
12. The apparatus of claim 11 , wherein the read reference voltage is set to an average or median value of a distribution of threshold voltages of the flash memory that is generated when voltage level or pulse duration lower or shorter than that of a program voltage condition of common flash memory.
13. The apparatus of claim 9 , wherein the program voltage condition is identical to a program voltage condition of common flash memory.
14. The apparatus of claim 13 , wherein an average or median value of a distribution of threshold voltages of the flash memory that has executed a program command based on the program voltage condition is set as a read reference voltage included in the read voltage condition.
15. The apparatus of claim 9 , wherein the erase voltage condition includes voltage level and pulse duration of a single pulse that is applied when an erase operation is performed on the flash memory.
16. The apparatus of claim 15 , wherein an average or median value of a distribution of threshold voltages of the flash memory that has executed an erase command based on the erase voltage condition is set as a read reference voltage included in the read voltage condition.