IP Library Granted Patent US 9,337,366
Granted Patent B2
US 9,337,366 · App. 13/190,872 · Granted May 10, 2016

Textured optoelectronic devices and associated methods of manufacture

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Quick Facts
Patent No.
US 9,337,366
App. No.
13/190,872
Granted
May 10, 2016
Kind
B2
Abstract

Textured optoelectronic devices and associated methods of manufacture are disclosed herein. In several embodiments, a method of manufacturing a solid state optoelectronic device can include forming a conductive transparent texturing material on a substrate. The method can further include forming a transparent conductive material on the texturing material. Upon heating the device, the texturing material causes the conductive material to grow a plurality of protuberances. The protuberances can improve current spreading and light extraction from the device.

Claims (28)

1. A method for forming a solid state optoelectronic device, comprising:

forming an optoelectronic transducer having at least a first semiconductor material, a second semiconductor material, and an active region between the first and second semiconductor materials;

forming a titanium texturing material on the optoelectronic transducer;

forming a transparent conductive material on the titanium texturing material, wherein forming the transparent conductive material comprises growing a non-uniform texture from the transparent conductive material, wherein the non-uniform texture comprises a pattern;

heating the transparent conductive material to produce a textured surface with a plurality of protuberances; and

etching the transparent conductive material, the titanium texturing material, and a portion of the optoelectronic transducer, thereby substantially transferring the pattern to the optoelectronic transducer.

2. The method of claim 1 wherein forming the titanium texturing material comprises forming a titanium material having a thickness from about 30 angstroms to about 60 angstroms.

3. The method of claim 1 wherein forming a transparent conductive material comprises forming an indium tin oxide on the titanium texturing material.

4. The method of claim 1 wherein the optoelectronic transducer comprises a photovoltaic cell.

5. The method of claim 1 wherein the optoelectronic transducer comprises a solid state emitter.

6. The method of claim 1 wherein forming the transparent conductive material comprises growing indium tin oxide on the titanium texturing material.

7. The method of claim 6 wherein the indium tin oxide is grown at a temperature from about 100° C. to about 600° C.

8. The method of claim 6 wherein the indium tin oxide is grown at a temperature from about 350° C. to about 450° C.

9. The method of claim 8 wherein the titanium texturing material has a thickness from about 30 angstroms to about 60 angstroms, and the indium tin oxide is grown at a temperature of about 400° C.

10. The method of claim 1 wherein the protuberances are irregular pillars projecting away from the optoelectronic transducer.

11. The method of claim 1 wherein the texturing material has a generally planar surface and the method further comprises:

forming a mask on the texturing material;

patterning the mask to expose selected portions of the texturing material where protuberances of the transparent conductive material are desired; and

growing the transparent conductive material on the mask and the exposed portions of the texturing material, wherein the transparent conductive material is generally planar over the mask and the transparent conductive material has protuberances over the exposed portions of the texturing material.

12. The method of claim 1 wherein etching the transparent conductive material, the titanium texturing material, and a portion of the optoelectronic transducer comprises dry-etching.

13. A method for forming a solid state optoelectronic device, comprising:

forming an optoelectronic transducer;

forming a texturing material on the optoelectronic transducer;

forming a conductive material on the texturing material;

heating the conductive material to produce a plurality of protuberances in the conductive material, wherein the plurality of protuberances form a pattern; and

removing the conductive material, the texturing material and at least a portion of the optoelectronic transducer via etching to transfer the pattern to the optoelectronic transducer.

14. The method of claim 13 wherein forming the texturing material comprises forming a texturing material having a thickness from about 30 angstroms to about 60 angstroms.

15. The method of claim 14 wherein removing the conductive material, the texturing material and at least a portion of the optoelectronic transducer via etching comprises removing the conductive material, the texturing material and at least a portion of the optoelectronic transducer via dry-etching.

Assignments (8)
RELEASE OF SECURITY INTEREST Recorded Nov 12, 2019
From: JPMORGAN CHASE BANK, N.A., AS COLLATERAL AGENT
To: MICRON TECHNOLOGY, INC.; MICRON SEMICONDUCTOR PRODUCTS, INC.
Reel/Frame 051028/0001 →
RELEASE OF SECURITY INTEREST Recorded Oct 9, 2019
From: MORGAN STANLEY SENIOR FUNDING, INC., AS COLLATERAL AGENT
To: MICRON TECHNOLOGY, INC.
Reel/Frame 050937/0001 →
RELEASE OF SECURITY INTEREST Recorded Aug 23, 2018
From: U.S. BANK NATIONAL ASSOCIATION, AS COLLATERAL AGENT
To: MICRON TECHNOLOGY, INC.
Reel/Frame 047243/0001 →
SECURITY INTEREST Recorded Jul 13, 2018
From: MICRON TECHNOLOGY, INC.; MICRON SEMICONDUCTOR PRODUCTS, INC.
To: JPMORGAN CHASE BANK, N.A., AS COLLATERAL AGENT
Reel/Frame 047540/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REPLACE ERRONEOUSLY FILED PATENT #7358718 WITH THE CORRECT PATENT #7358178 PREVIOUSLY RECORDED ON REEL 038669 FRAME 0001. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY INTEREST. Recorded Jun 8, 2017
From: MICRON TECHNOLOGY, INC.
To: U.S. BANK NATIONAL ASSOCIATION, AS COLLATERAL AGENT
Reel/Frame 043079/0001 →
PATENT SECURITY AGREEMENT Recorded Jun 2, 2016
From: MICRON TECHNOLOGY, INC.
To: MORGAN STANLEY SENIOR FUNDING, INC., AS COLLATERAL AGENT
Reel/Frame 038954/0001 →
SECURITY INTEREST Recorded May 12, 2016
From: MICRON TECHNOLOGY, INC.
To: U.S. BANK NATIONAL ASSOCIATION, AS COLLATERAL AGENT
Reel/Frame 038669/0001 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jul 26, 2011
From: XU, LIFANG; SCHELLHAMMER, SCOTT D.; MOU, SHAN MING; BERNHARDT, MICHAEL J.
To: MICRON TECHNOLOGY, INC.
Reel/Frame 026650/0327 →