Impedance measurement and demodulation using implantable device

1. An apparatus comprising:

an implantable impedance measurement circuit, configured to be communicatively coupled to a plurality of implantable electrodes, wherein the impedance measurement circuit includes:

an exciter circuit, configured to apply a test current between at least two of the electrodes;

a preamplifier circuit, configured to sense the voltage response to the test current;

a demodulator circuit, communicatively coupled to the preamplifier circuit,

wherein the demodulator circuit includes a four-point finite impulse response (FIR) filter;

and

wherein the impedance measurement circuit is configured to determine an impedance measurement between the electrodes using the demodulated sensed voltage response, wherein the exciter circuit is configured to apply a two-phase test current that is limited to two-phases per demodulation, and wherein the demodulator circuit is configured to demodulate the sensed voltage response to the two-phase test current using the four-point FIR filter.

2. The apparatus of claim 1 , wherein the four-point FIR filter is capable of being represented by a z-domain transfer function of H(z)=(+a·z −4 −b·z −3 +b·z −2 −a·z −1 )÷c, wherein a, b, and c are constant coefficients.

3. The apparatus of claim 2 , wherein a≠b, and wherein c=2(a+b).

4. The apparatus of claim 1 , wherein the impedance measurement circuit is configured to perform a noise measurement before obtaining the impedance measurement, and to adjustably control the impedance measurement circuit, using information about the noise measurement, to obtain the impedance measurement.

5. The apparatus of claim 4 , wherein the impedance measurement circuit is configured to condition whether to obtain the impedance measurement on whether the noise measurement indicates that at least a specified amount of noise is present.

6. The apparatus of claim 4 , wherein the impedance measurement circuit is configured to cancel the impedance measurement when the noise measurement indicates that at least a specified amount of noise is present.

7. The apparatus of claim 4 , wherein the impedance measurement circuit is configured to:

proceed with an impedance measurement when the noise measurement indicates that at least a specified amount of noise is present; and

indicate that the impedance measurement was acquired when at least the specified amount of noise is present.

8. The apparatus of claim 4 , wherein the impedance measurement circuit is configured to:

proceed with the impedance measurement when the noise measurement indicates that at least a specified amount of noise is present; and

increase the test current when at least the specified amount of noise is present.

9. The apparatus of claim 4 , wherein the impedance measurement circuit is configured to:

recurrently perform the noise measurement;

track a number of times that at least the specified amount of noise was present; and

activate a noise indicator using the number of times that at least the specified amount of noise was present when the number of times exceeds a threshold number.

10. The apparatus of claim 9 , wherein the impedance measurement circuit is configured to inactivate the indication of noise, after the indication of noise was activated, in response to a number of times that at least the specified amount of noise was not present during a number of noise measurements performed after the indication of noise was activated.

11. A method comprising:

applying a test current, between at least two implantable electrodes, using an implantable medical device (IMD), wherein applying a test current includes applying a two-phase test current that is limited to two-phase per demodulation;

sensing a response signal resulting from the test current;

demodulating the response signal using a four-point finite impulse response (FIR) filter, wherein demodulating includes demodulating the response signal resulting from the two-phase test current using the four point FIR filter; and

determining an impedance using the demodulated response signal.

12. The method of claim 11 , including:

pre-sampling a voltage, between electrodes used for sensing the response signal, without applying the test current;

determining whether noise is present using the pre-sampled voltage; and

controllably adjusting an impedance measurement using information about whether the noise is present.

13. The method of claim 12 , including canceling an impedance measurement when noise is determined to be present.

14. The method of claim 12 , including associating with the impedance measurement an indication of whether noise is determined to have been present with the impedance measurement.

15. The method of claim 12 , including increasing, when noise is determined to be present, the test current used with the impedance measurement.

16. The method of claim 11 , comprising:

determining whether noise is present; and

controllably adjusting an impedance measurement using information about whether the noise is present.

17. The method of claim 16 , wherein controllably adjusting includes canceling an impedance measurement when noise is determined to be present.

18. The method of claim 16 , wherein controllably adjusting includes associating with the impedance measurement an indication of whether noise is determined to have been present with the impedance measurement.

19. The method of claim 16 , wherein controllably adjusting includes increasing, when noise is determined to be present, the test current used with impedance measurement.

20. An apparatus comprising:

an implantable impedance measurement circuit, configured to be communicatively coupled to a plurality of implantable electrodes, wherein the impedance measurement circuit includes:

an exciter circuit, configured to apply a test current between at least two of the electrodes;

a preamplifier circuit, configured to sense the voltage response to the test current;

a demodulator circuit, communicatively coupled to the preamplifier circuit,

wherein the demodulator circuit includes a four-point finite impulse response (FIR) filter having a z-domain transfer function of H(z)=(+a·z −4 −b·z −3 +b·z −2 −a·z −1 )÷c; and

wherein the impedance measurement circuit is configured to determine an impedance measurement between the electrodes using the demodulated sensed voltage response, wherein the exciter circuit is configured to apply a two-phase test current that is limited to two-phases per demodulation, and wherein the demodulator circuit is configured to demodulate the sensed voltage response to the two-phase test current using the four-point FIR filter.

21. The apparatus of claim 20 , wherein a, b, and c are constant coefficients.

22. The apparatus of claim 21 , wherein a≠b, and wherein c=2(a+b).

23. An apparatus comprising:

an implantable impedance measurement circuit, configured to be communicatively coupled to a plurality of implantable electrodes, wherein the impedance measurement circuit includes:

an exciter circuit, configured to apply a test current between at least two of the electrodes;

a preamplifier circuit, configured to sense the voltage response to the test current;

a demodulator circuit, communicatively coupled to the preamplifier circuit, wherein the demodulator circuit includes a four-point finite impulse response (FIR) filter having a z-domain transfer function of H(z)=(+a·z −4 −b·z −3 +b·z −2 −a·z −1 )÷c, wherein a, b, and c are constant coefficients, wherein a≠b, and wherein c=2(a+b); and

wherein the impedance measurement circuit is configured to determine an impedance measurement between the electrodes using the demodulated sensed voltage response, wherein the exciter circuit is configured to apply a two-phase test current that is limited to two-phases per demodulation, and wherein the demodulator circuit is configured to demodulate the sensed voltage response to the two-phase test current using the four-point FIR filter.