Measurement method
A method of locating a feature of an object in which the method includes bringing a stylus of a contact probe mounted on a positioning apparatus into contact with the object to obtain at least first and second measurements of the object. Each which the measurements gives rise to a range of possible points of contact between the object and a part of the stylus along its length and therefore inherently containing uncertainty in the location of the object along said length. The at least first and second measurements are used to reduce the extent of said uncertainty which includes using stylus orientation related information associated with the at least first and second measurements.
1. A method of locating a feature of an object comprising:
bringing a stylus of a contact probe mounted on a positioning apparatus into contact with the object to obtain at least first and second measurements of the object, each of which gives rise to a range of possible points of contact between the object and a part of the stylus along its length and therefore inherently containing uncertainty in the location of the object along said length, and
using the at least first and second measurements to at least reduce the extent of said uncertainty comprising using known stylus orientation related information associated with the at least first and second measurements.
2. A method as claimed in claim 1 , in which the contact probe used to obtain the second measurement is the same as that used to obtain the first measurement.
3. A method as claimed in claim 1 , in which the relative angular orientation between the contact probe and the object is different for the first and second measurements.
4. A method as claimed in claim 1 in which the stylus comprises a stylus shaft and a stylus tip and in which at least one of the first and second measurements is obtained by bringing the stylus shaft into contact with the object.
5. A method as claimed in claim 4 , in which at least the part of the stylus shaft to be brought into contact with the object is substantially circular in cross-section.
6. A method as claimed in claim 1 , the method comprising subsequently using said identified location of the feature to guide the measurement of at least a part of the feature with a measurement probe.
7. A method as claimed in claim 4 , in which the stylus tip is used to measure the at least part of the feature.
8. A method as claimed in claim 6 , in which the measurement probe used to subsequently measure the at least part of the feature is the same probe used to obtain at least one of the first and second measurements.
9. A method as claimed in claim 1 , in which the first measurement is taken on a first side of the feature, and the second measurement is taken on a second side of the feature.
10. A method as claimed in claim 1 , in which the method comprises obtaining a series of first measurements on the first side of the feature and a series of second measurements on the second side of the feature.
11. A method as claimed in claim 10 , in which at least one of said first and second series of measurements is obtained by scanning the contact probe along the length of the feature.
12. A method as claimed in any claim 10 , in which the first and second series of measurements intersect and in which the intersection of the first and second series of measurements is used to identify the location of at least part of the feature.
13. A method as claimed in claim 1 , in which the location of the feature is identified by fitting a model of at least a part of the object to the first and second measurements.
14. A method as claimed in claim 1 , in which the feature is an edge of an object, preferably the edge of a blade.
15. A method as claimed in claim 1 in which said at least first and second measurements intersect and in which reducing the extent of said uncertainty comprises based on said points of intersection refining the range of possible points of contact for the at least first and second measurements down to a range of valid points of contact and determining the shape and/or dimensions of at least a section of the feature based on said range of valid points of contact.
16. An apparatus for locating a feature of an object, comprising a contact probe having a stylus mounted on a coordinate positioning apparatus, in which the apparatus is configured to bring the stylus of the contact probe mounted on a positioning apparatus into contact with an object to obtain at least first and second measurements of the object, each of which gives rise to a range of possible points of contact between the object and a part of the stylus along its length and therefore inherently containing uncertainty in the location of the object along said length, and configured to use the at least first and second measurements to at least reduce the extent of said uncertainty by using stylus orientation related information associated with the at least first and second measurements.