IP Library Granted Patent US 9,423,306
Granted Patent B2
US 9,423,306 · App. 14/587,392 · Granted Aug 23, 2016

Method and apparatus for wavefront sensing

Inventor: Seung-Whan Bahk (Rochester, NY)
Assignee: RAM PHOTONICS, LLC
G01J9/02G01B9/02G03F7/706
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Quick Facts
Patent No.
US 9,423,306
App. No.
14/587,392
Granted
Aug 23, 2016
Kind
B2
Abstract

A method of measuring characteristics of a wavefront of an incident beam includes obtaining an interferogram associated with the incident beam passing through a transmission mask and Fourier transforming the interferogram to provide a frequency domain interferogram. The method also includes selecting a subset of harmonics from the frequency domain interferogram, individually inverse Fourier transforming each of the subset of harmonics to provide a set of spatial domain harmonics, and extracting a phase profile from each of the set of spatial domain harmonics. The method further includes removing phase discontinuities in the phase profile, rotating the phase profile, and reconstructing a phase front of the wavefront of the incident beam.

Claims (25)

1. A method of measuring characteristics of a wavefront of an incident beam having a phase front, the method comprising:

providing a transmission mask;

providing an imaging device having a detector plane;

passing a portion of the incident beam through the transmission mask;

propagating the portion of the incident beam passing through the transmission mask over a predetermined distance;

forming an interferogram at the detector plane of the imaging device;

detecting the interferogram using the imaging device;

Fourier transforming the interferogram to provide a frequency domain interferogram;

selecting a subset of harmonics from the frequency domain interferogram;

individually inverse Fourier transforming each of the subset of harmonics to provide a set of spatial domain harmonics;

extracting a phase profile from the set of spatial domain harmonics;

removing phase discontinuities in the phase profile;

rotating the phase profile; and

reconstructing the phase front of the wavefront of the incident beam.

2. The method of claim 1 further comprising:

measuring an amplitude associated with the spatial domain harmonics; and

computing an intensity profile associated with the wavefront of the incident beam.

3. The method of claim 1 wherein the transmission mask comprises a checkerboard pattern transmission mask.

4. The method of claim 3 wherein the checkerboard pattern transmission mask comprises an amplitude-only transmission mask.

5. The method of claim 1 wherein the subset of harmonics comprises a harmonic closest to an origin in each quadrant.

6. The method of claim 5 wherein the subset of harmonics comprises four harmonics closest to the origin.

7. The method of claim 1 wherein the subset of harmonics comprises a harmonic closest to an origin in two adjacent quadrants.

8. The method of claim 7 wherein the subset of harmonics comprises four harmonics closest to the origin.

9. The method of claim 1 wherein the phase profile characterizes a slope of the phase front.

10. The method of claim 1 wherein reconstructing the phase front comprises performing a two dimensional integration of the phase profile associated with each of the set of spatial domain harmonics.

Assignments (3)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Nov 21, 2022
From: RAM PHOTONICS LLC
To: RAM PHOTONICS INDUSTRIAL, LLC
Reel/Frame 061840/0510 →
CORRECTIVE ASSIGNMENT TO CORRECT THE ASSIGNEE NAME PREVIOUSLY RECORDED AT REEL: 036362 FRAME: 0900. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT . Recorded Jul 15, 2022
From: BAHK, SEUNG-WHAN
To: RAM PHOTONICS LLC
Reel/Frame 060669/0842 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Aug 19, 2015
From: BAHK, SEUNG-WHAN
To: RAM PHOTONICS, LLC
Reel/Frame 036362/0900 →
Continuity (2)
Provisional Application 61923362 · Jan 3, 2014
Related Publication 20150300885A1 · Oct 22, 2015