Aberration correction optical unit and laser microscope
An aberration correction optical unit ( 3 ) disposed in an optical system includes: a first phase modulation element ( 3 a ) and a second phase modulation element ( 3 c ) each having a polarization characteristic; and a variable waveplate ( 3 b ) disposed between the first and second phase modulation elements so that an optical axis of the variable waveplate has a predetermined angle with respect to optical axes of the two phase modulation elements, in order to correct an aberration generated by the optical system.
1. An aberration correction optical unit which corrects a wave front aberration generated by an optical system, comprising:
a first phase modulation element which includes an optical axis and corrects a predetermined component of a wave front aberration of the optical system for a polarized component parallel to the optical axis among a light flux passing through the optical system;
a second phase modulation element which includes an optical axis and corrects the predetermined component of the wave front aberration for a polarized component parallel to the optical axis among the light flux passing through the optical system; and
a variable waveplate which is disposed between the first phase modulation element and the second phase modulation element, includes an optical axis and changes a polarization characteristic of the light flux,
wherein the variable waveplate is disposed so that the optical axis of the variable waveplate has a predetermined angle with respect to the optical axis of the first phase modulation element or the optical axis of the second phase modulation element.
2. The aberration correction optical unit according to claim 1 , wherein the first phase modulation element and the second phase modulation element are disposed so that the optical axis of the first phase modulation element and the optical axis of the second phase modulation element are parallel or orthogonal to each other; and the predetermined angle is 45°.
3. The aberration correction optical unit according to claim 1 , wherein the variable waveplate changes a phase modulation amount provided for the light flux according to a voltage to be applied.
4. The aberration correction optical unit according to claim 3 , wherein the first phase modulation element and the second phase modulation element are disposed so that the optical axis of the first phase modulation element and the optical axis of the second phase modulation element are parallel to each other; and the variable waveplate is switched to function as a half-wave plate or to function as a waveplate providing a phase difference equivalent to an integral multiple of a wavelength of the light flux for two linearly polarized lights orthogonal to each other according to a change of the voltage to be applied.
5. The aberration correction optical unit according to claim 3 , wherein the first phase modulation element and the second phase modulation element are disposed so that the optical axis of the first phase modulation element and the optical axis of the second phase modulation element are orthogonal to each other; and the variable waveplate is switched to function as a half-wave plate or to function as a waveplate providing a phase difference equivalent to an integral multiple of a wavelength of the light flux for two linearly polarized lights orthogonal to each other according to a change of the voltage to be applied.
6. The aberration correction optical unit according to claim 1 , wherein the optical system includes an objective lens, the system being disposed between a coherent light source and the objective lens.
7. The aberration correction optical unit according to claim 1 , wherein each of the first phase modulation element, the second phase modulation element, and the variable waveplate is a liquid crystal element.
8. A laser microscope comprising:
a first optical system which scans a specimen with a light flux from a coherent light source;
an objective lens which focuses the light flux on the specimen;
a detector;
a second optical system which transmits, to the detector, a second light flux including specimen information output from the specimen by incidence of the light flux on the specimen; and
the aberration correction optical unit according to claim 1 disposed between the coherent light source and the objective lens.
9. The laser microscope according to claim 8 further comprising a control circuit which controls a phase modulation amount provided for the light flux by the variable waveplate by adjusting a voltage applied to the variable waveplate in accordance with an observation mode.