IP Library Granted Patent US 9,425,320
Granted Patent B2
US 9,425,320 · App. 14/189,494 · Granted Aug 23, 2016

Thin film transistor on fiber and manufacturing method of the same

Inventors: Chwee Iin Choong (Suwon-si, KR); Sang-won Kim (Seoul, KR); Jong-jin Park (Hwaseong-si, KR); Ji-hyun Bae (Seoul, KR); Jung-kyun Im (Yongin-si, KR); Sang-hun Jeon (Seoul, KR)
Assignee: SAMSUNG ELECTRONICS CO., LTD.
H01L29/78603H01L29/66742H01L51/0558H01L29/0669
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Quick Facts
Patent No.
US 9,425,320
App. No.
14/189,494
Granted
Aug 23, 2016
Kind
B2
Abstract

Provided is a thin film transistor on fiber and a method of manufacturing the same. The thin film transistor includes a fiber; a first electrode, a second electrode and a gate electrode formed on fiber; a channel formed between the first and second electrodes; an encapsulant encapsulating the fiber, the first, second, and gate electrodes, and an upper surface of the channel; and a gate insulating layer formed in a portion of the inner area of the encapsulant.

Claims (26)

1. A thin film transistor formed on a fiber, the thin film transistor comprising:

a first electrode, a second electrode, and a gate electrode, the first, the second, and the gate electrodes being formed on the fiber;

a channel formed between the first electrode and the second electrode;

an encapsulant encapsulating the fiber, the first electrode, the second electrode, the gate electrode and an upper surface of the channel; and

a gate insulating layer formed in a portion of an inner area of the encapsulant,

wherein the gate insulating layer is not formed in an entire area of an encapsulating zone encapsulated by the encapsulant, but is only formed in a portion of the encapsulating zone encapsulated by the encapsulant, and

the encapsulating zone includes an empty space.

2. The thin film transistor according to claim 1 , wherein the gate insulating layer is in liquid phase, and the gate insulating layer is in non-contact status with at least one of the first electrode, the second electrode, and the gate electrode.

3. The thin film transistor according to claim 1 , wherein the gate insulating layer comprises ionic liquids.

4. The thin film transistor according to claim 3 , wherein the gate insulating layer further comprises a lubricant.

5. The thin film transistor according to claim 3 , wherein the gate insulating layer comprises a material having a coefficient of friction of 0.1 or less.

6. The thin film transistor according to claim 1 , wherein the fiber comprises a natural fiber, a chemical fiber, or a combination of a natural fiber and a chemical fiber.

7. The thin film transistor according to claim 1 , wherein the channel comprises a semi-conductor thin film, the semi-conductor thin film further comprising an organic semiconductor material or a fibrous nano-structured material.

8. The thin film transistor according to claim 1 , wherein the encapsulant comprises a resin or a molding material.

9. The thin film transistor according to claim 8 , wherein the resin is a thermally curable or UV curable acrylic resin, a thermally curable epoxy resin, or an elastomer resin.

10. A method of manufacturing a thin film transistor disposed on a fiber, the method comprising:

forming a conductive material on the fiber;

patterning the conductive material to form a first electrode, a second electrode, and a gate electrode;

forming a channel between the first electrode and the second electrode; and

encapsulating the fiber, the first electrode, the second electrode, the gate electrode, and the channel in an encapsulant,

wherein the encapsulant comprises a gate insulating layer,

the gate insulating layer is not formed in an entire area of an encapsulating zone encapsulated by the encapsulant, but is only formed in a portion of the encapsulating zone encapsulated by the encapsulant, and

the encapsulating zone includes an empty space.

11. The manufacturing method of claim 10 , wherein the gate insulating layer comprises ionic liquids.

12. The manufacturing method of claim 11 , wherein the gate insulating layer further comprises a lubricant.

13. The manufacturing method of claim 10 , wherein the gate insulating layer is a material having a coefficient of friction of 0.1 or less.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Mar 7, 2014
From: CHOONG, CHWEE LIN; KIM, SANG-WON; PARK, JONG-JIN; BAE, JI-HYUN; IM, JUNG-KYUN; JEON, SANG-HUN
To: SAMSUNG ELECTRONICS CO., LTD.
Reel/Frame 032414/0988 →
Priority Claims (1)
KR 10-2013-0020014 · Feb 25, 2013 · national
Continuity (1)
Related Publication 20140239357A1 · Aug 28, 2014