IP Library Granted Patent US 9,441,950
Granted Patent B2
US 9,441,950 · App. 14/189,159 · Granted Sep 13, 2016

Optical measurement apparatus and optical measurement method

Inventors: Kentaro Osawa (Tokyo, JP); Daisuke Tomita (Tokyo, JP); Masaki Muko (Tokyo, JP)
Assignee: HITACHI-LG DATA STORAGE, INC.
G01B9/02091G01B9/02027G01B9/02038G01B2290/45
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Quick Facts
Patent No.
US 9,441,950
App. No.
14/189,159
Granted
Sep 13, 2016
Kind
B2
Abstract

A small and inexpensive optical measurement apparatus is provided in which noise due to optical interference such as inter-layer crosstalk or speckle is suppressed. The optical measurement apparatus includes a light source to emit laser light, a high-frequency superimposing unit to superimpose a high-frequency current on a driving current to drive the light source, a light branching element to branch the laser light into signal light and reference light, an objective lens to condense and irradiate the signal light on a measurement object, a condensing position scanning unit to scan a condensing position of the signal light, a light path length adjusting unit to adjust a light path length difference between the signal light and the reference light, an interference optical system which combines the signal light reflected or scattered by the measurement object and the reference light, and generates a plurality of interference lights different from each other in phase relation, and a photodetector to detect the interference lights.

Claims (31)

1. An optical measurement apparatus comprising:

a light source to emit laser light;

a high-frequency superimposing unit to superimpose a high-frequency current on a driving current to drive the light source;

a light branching element to branch the laser light into signal light and reference light;

an objective lens to condense and irradiate the signal light on a measurement object;

a condensing position scanning unit to scan a condensing position of the signal light by scanning at least the objective lens;

a light path length adjusting unit to adjust a light path length difference between the signal light and the reference light, the light path length adjusting unit including a mirror to reflect the reference light and a movement stage to move the mirror, and the light path length difference is adjusted by moving the movement stage;

an interference optical system which combines the signal light reflected or scattered by the measurement object and the reference light, and generates a plurality of interference lights different from each other in phase relation; and

a photodetector to detect the interference lights,

wherein in a state where the high-frequency current is not superimposed on the driving current, the light path length difference between the signal light and the reference light is adjusted by the light path length adjusting unit, and when the high-frequency current is superimposed on the driving current by a high-frequency superimposing unit, measurement is performed.

2. The optical measurement apparatus according to claim 1 , wherein the objective lens has a numerical aperture of 0.4 or more.

3. The optical measurement apparatus according to claim 1 , wherein coherence length of the laser light obtained when the high frequency is not superimposed on the driving current is not smaller than a maximum value of light path length change of the signal light generated by scanning or simply changing the condensing position of the signal light, and

coherence length of the laser light obtained when the high frequency is superimposed on the driving current is shorter than the coherence length obtained when the high frequency is not superimposed on the driving current.

4. The optical measurement apparatus according to claim 1 , wherein the light path length adjusting unit is driven to cancel out the light path length difference between the signal light and the reference light generated by scanning the condensing position of the signal light in an optical axis direction.

5. The optical measurement apparatus according to claim 1 , wherein the light path length adjusting unit includes a lens, a mirror arranged on a focal plane of the lens, and an actuator to modulate positions of the lens and the mirror.

6. The optical measurement apparatus according to claim 1 , wherein the number of the interference lights generated in the interference optical system is four, interference phases of the signal light and the reference light are different from each other by approximately integer times of 90 degrees, and

the photodetector of current differential type detects a pair of the interference lights in which the interference phases of the signal light and the reference light are different from each other by approximately 180 degrees.

7. The optical measurement apparatus according to claim 1 , further comprising a light path length modulation part to module the light path length difference between the signal light and the reference light at higher speed than a change speed of a light path length of the signal light generated by scanning the condensing position of the signal light,

wherein the number of the interference lights generated in the interference optical system is two, and

the interference lights are detected by the photodetector of current differential type.

8. The optical measurement apparatus according to claim 1 , wherein a frequency of the high-frequency current is larger than a response frequency of the photodetector.

9. An optical measurement method comprising:

branching laser light emitted from a light source into signal light and reference light;

scanning a condensing position of the signal light by scanning at least the objective lens;

condensing and irradiating the signal light on a measurement object;

adjusting a light path length difference between the signal light and the reference light from a light path length of the signal light to the measurement object;

superimposing a high-frequency current on a driving current to drive the light source;

combining the signal light reflected or scattered by the measurement object and the reference light to generate a plurality of interference lights different from each other in phase relation; and

detecting the interference lights,

wherein in a state where the high-frequency current is not superimposed on the driving current, the light path length difference between the signal light and the reference light is adjusted, and when the high-frequency current is superimposed on the driving current by a high-frequency superimposing unit, measurement is performed.

10. The optical measurement apparatus according to claim 4 , wherein the light path length adjusting unit includes a lens, a mirror arranged on a focal plane of the lens, and an actuator to modulate positions of the lens and the mirror.

Assignments (2)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jun 25, 2014
From: HITACHI MEDIA ELECTRONICS CO., LTD.
To: HITACHI-LG DATA STORAGE, INC.
Reel/Frame 033171/0907 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Mar 20, 2014
From: OSAWA, KENTARO; TOMITA, DAISUKE; MUKO, MASAKI
To: HITACHI MEDIA ELECTRONICS CO., LTD.
Reel/Frame 032484/0762 →
Priority Claims (1)
JP 2013-182689 · Sep 4, 2013 · national
Continuity (1)
Related Publication 20150062589A1 · Mar 5, 2015