Method for improving fin isolation
A method of processing a workpiece to create a doped fin structure is disclosed. A portion of the workpiece is subjected to a pre-amorphizing implant to create an amorphized region. This amorphized region is then implanted with dopant species, at an implant energy and dose so that the dopant species are contained within the amorphized region. The doped amorphized region is then subjected to a laser melt anneal which crystallizes the amorphized region. The dopant profile is box-like, and the dopant is confined to the previously amorphized region.
1. A method of creating a doped fin structure for a three-dimensional transistor, the method comprising:
implanting an amorphizing species into a workpiece to create an amorphized region;
implanting a dopant species into said amorphized region;
performing a laser melt anneal after said dopant species are implanted into said amorphized region to form a doped crystalline region; and
etching the doped crystalline region to create a doped fin structure.
2. The method of claim 1 , wherein an implant energy and dose of said dopant species is selected so that said dopant species are contained within said amorphized region.
3. The method of claim 1 , wherein said laser melt anneal is performed at a temperature greater than a melting point of said amorphized region and lower than a melting point of crystalline silicon.
4. The method of claim 1 , wherein a depth of said amorphized region is equal to a height of said doped fin structure.
5. The method of claim 1 , further comprising:
disposing an undoped epi-silicon layer on top of said doped fin structure;
embedding said doped fin structure in an oxide;
disposing a dummy gate over the undoped epi-silicon layer in a location where a channel of a finFET will be disposed;
implanting a second dopant species into first and second portions of said undoped epi-silicon layer after the disposing of the dummy gate to form a source region and a drain region, respectively, wherein said second dopant species has a conductivity opposite from said dopant species;
removing the dummy gate after the implanting; and
applying a gate electrode across the channel of said undoped epi-silicon layer disposed between said source region and said drain region.
6. The method of claim 1 , wherein the dopant species are contained within said amorphized region, and said doped fin structure extends to a bottom of the amorphized region, so as to reduce or eliminate leakage current between adjacent fin structures.
7. A method of creating a doped fin structure for a three-dimensional transistor, the method comprising:
implanting an amorphizing species into a workpiece to create an amorphized region;
implanting a dopant species into said amorphized region;
performing a laser melt anneal after said dopant species are implanted into said amorphized region to form a doped crystalline region;
etching said doped crystalline region to form a plurality of doped fin structures;
depositing an oxide in spaces between said plurality of doped fin structures;
recessing said plurality of doped fin structures to a level below said oxide to create a plurality of recessed regions;
growing an undoped epi-silicon layer in said plurality of recessed regions; and
etching said oxide to a level where said undoped epi-silicon layer is exposed.
8. The method of claim 7 , further comprising:
disposing a dummy gate over the undoped epi-silicon layer in a location where a channel of a finFET will be disposed;
implanting a second dopant species into first and second portions of said undoped epi-silicon layer after the disposing of the dummy gate to form a source region and a drain region, respectively, wherein said second dopant species has a conductivity opposite from said dopant species;
removing the dummy gate after the implanting; and
applying a gate electrode across the channel of said undoped epi-silicon layer disposed between said source region and said drain region.
9. The method of claim 7 , wherein an implant energy and dose of said dopant species is selected so that said dopant species are contained within said amorphized region.
10. The method of claim 7 , wherein said laser melt anneal is performed at a temperature greater than a melting point of said amorphized region and lower than a melting point of crystalline silicon.
11. The method of claim 7 , wherein a depth of said amorphized region is equal to a height of said doped fin structure.
12. The method of claim 7 , wherein the dopant species are contained within said amorphized region, and said doped fin structure extends to a bottom of the amorphized region, so as to reduce or eliminate leakage current between adjacent fin structures.
13. A method of creating a doped fin structure for a three-dimensional transistor, the method comprising:
implanting an amorphizing species into a workpiece to create an amorphized region;
implanting a dopant species into said amorphized region;
performing a laser melt anneal after said dopant species are implanted into said amorphized region to form a doped crystalline region;
growing an undoped epi-silicon layer in said doped crystalline region;
etching said workpiece to form a plurality of doped fin structures, each having an undoped epi-silicon layer disposed thereon; and
depositing an oxide in spaces between said plurality of doped fin structures.
14. The method of claim 13 , further comprising:
disposing a dummy gate over the undoped epi-silicon layer in a location where a channel of a finFET will be disposed;
implanting a second dopant species into first and second portions of said undoped epi-silicon layer after the disposing of the dummy gate to form a source region and a drain region, respectively, wherein said second dopant species has a conductivity opposite from said dopant species;
removing the dummy gate after the implanting; and
applying a gate electrode across the channel of said undoped epi-silicon layer disposed between said source region and said drain region.
15. The method of claim 13 , wherein an implant energy and dose of said dopant species is selected so that said dopant species are contained within said amorphized region.
16. The method of claim 13 , wherein said laser melt anneal is performed at a temperature greater than a melting point of said amorphized region and lower than a melting point of crystalline silicon.
17. The method of claim 13 , wherein a depth of said amorphized region is equal to a height of said doped fin structure.
18. The method of claim 13 , wherein the dopant species are contained within said amorphized region, and said doped fin structure extends to a bottom of the amorphized region, so as to reduce or eliminate leakage current between adjacent fin structures.