Electrical parametric testing for back contact semiconductor solar cells

1. A back contact semiconductor solar cell test structure, comprising:

a first electrically conductive metallization layer having an interdigitated pattern of emitter electrodes and base electrodes on a backside surface of a solar cell substrate;

an electrically insulating layer attached to said backside surface of said substrate, said electrically insulating layer electrically isolating said first metallization layer from a second electrically conductive metallization layer;

a second electrically conductive metallization layer providing cell interconnections to said first electrically conductive interconnect layer through conductive via holes formed in said electrically insulating layer, said second electrically conductive interconnect layer having an interdigitated pattern of emitter electrodes and base electrodes; and

an electrically conductive resistance test structure contacted to said second electrically conductive metallization layer and extracting at least one electrical parametric value component of said solar cell structure.

2. The back contact semiconductor solar cell test structure of claim 1 , wherein said electrically conductive resistance test structure comprises a metal block test component contacted to said second electrically conductive metallization layer, said electrically conductive resistance test structure not contacted to said first electrically conductive metallization layer.

3. The back contact semiconductor solar cell test structure of claim 1 , wherein said electrically conductive resistance test structure comprises a base block test component contacted to said base electrodes of said first electrically conductive metallization layer.

4. The back contact semiconductor solar cell test structure of claim 1 , wherein said electrically conductive resistance test structure comprises an emitter block test component contacted to said emitter electrodes of said first electrically conductive metallization layer.

5. The back contact semiconductor solar cell test structure of claim 1 , said electrically conductive resistance test structure further comprising:

a metal block test component contacted to said second electrically conductive metallization layer, said electrically conductive resistance test structure not contacted to said first electrically conductive metallization layer;

a base block test component contacted to said base electrodes of said first electrically conductive metallization layer; and

an emitter block test component contacted to said emitter electrodes of said first electrically conductive metallization layer.

6. A method for measuring an electrical parametric value from a back contact semiconductor solar cell, comprising:

forming a first layer of electrically conductive metal having an interdigitated pattern of base electrodes and emitter electrodes on the backside surface of a semiconductor solar cell substrate;

forming an electrically insulating layer on said first layer of electrically conductive metal, said electrically insulating layer providing electrical isolation between said first layer of electrically conductive metal and a second layer of electrically conductive metal;

forming vias in said electrically insulating layer, said vias providing access to said first layer of electrically conductive metal;

forming a second electrically conductive metallization layer on said electrically insulating layer, said second electrically conductive metallization layer contacting said first electrically conductive metal layer through said vias; and

extracting an electrical parametric value from said back contact semiconductor solar cell by probing said second electrically conductive metallization layer with an electrical current or voltage.

7. The method for measuring an electrical parametric value from a back contact semiconductor solar cell of claim 6 , wherein said electrical parametric value is the resistance of said second electrically conductive metallization layer, said vias, and said first electrically conductive metallization layer.

8. The method for measuring an electrical parametric value from a back contact crystalline semiconductor solar cell of claim 6 , wherein said electrical parametric value is the base diffusion resistance of said crystalline semiconductor solar cell substrate.

9. The method for measuring an electrical parametric value from a back contact crystalline semiconductor solar cell of claim 6 , wherein said electrical parametric value is the emitter diffusion resistance of said crystalline semiconductor solar cell substrate.

10. The method for measuring an electrical parametric value from a back contact crystalline semiconductor solar cell of claim 6 , further comprising:

measuring the resistance of said second electrically conductive metallization layer, said vias, and said first electrically conductive metallization layer;

measuring the base diffusion resistance of said crystalline semiconductor solar cell substrate; and

measuring the emitter diffusion resistance of said crystalline semiconductor solar cell substrate.

11. A method for measuring an electrical parametric value from a back contact semiconductor solar cell, comprising:

forming a first layer of electrically conductive metal having an interdigitated pattern of base electrodes and emitter electrodes on the backside surface of a semiconductor solar cell substrate;

forming an electrically insulating layer on said first layer of electrically conductive metal, said electrically insulating layer providing electrical isolation between said first layer of electrically conductive metal and a second layer of electrically conductive metal;

forming vias in said electrically insulating layer, said vias providing access to said first layer of electrically conductive metal;

forming a second electrically conductive metallization layer on said electrically insulating layer, said second electrically conductive metallization layer contacting said first electrically conductive metal layer through said vias, said second electrically conductive metallization layer having a pattern comprising an emitter block contacting said emitter electrodes and an base block contacting said base electrodes;

measuring the base diffusion resistance of said semiconductor solar cell substrate by probing said base block with electrical voltage or current;

measuring the emitter diffusion resistance of said semiconductor solar cell substrate by probing said emitter block with electrical voltage or current; and

forming said second electrically conductive metallization layer as an interdigitated pattern of base conductor fingers and emitter conductor fingers.

12. The method for measuring an electrical parametric value from a back contact semiconductor solar cell of claim 11 , wherein said interdigitated pattern of base conductor fingers and emitter conductor fingers are patterned parallel to said interdigitated pattern of base electrodes and emitter electrodes.

13. The method for measuring an electrical parametric value from a back contact semiconductor solar cell of claim 11 , wherein said interdigitated pattern of base conductor fingers and emitter conductor fingers are patterned perpendicular to said interdigitated pattern of base electrodes and emitter electrodes.