Managing redundancy repair using boundary scans
An IO structure, method, and apparatus are disclosed for using an IEEE™ 1149.1 boundary scan latch to reroute a functional path. The method for a chip using IEEE™ 1149.1 boundary scan latches may include using the IEEE™ 1149.1 boundary scan latches for testing IO on the chip in a test mode. The method may also include using information stored in the IEEE™ 1149.1 boundary scan latches to route signals around a failing path in a functional mode.
1. An input/output (TO) structure comprising:
a first IO cell on a first chip having a first functional input and a second IO cell on the first chip having a second functional input;
the first IO cell further comprising:
a driver to drive off chip;
a first serial boundary scan latch;
a first parallel boundary scan latch to receive data from the first serial boundary scan latch, and
a multiplexer to select for input, to the driver, an output of the first parallel boundary scan latch of the first IO cell in a first mode; data output from the first functional input in a second mode; and from the second functional input in a third mode.
2. The IO of claim 1 , the first IO cell further comprising:
a first receiver to receive an input from the driver of the first IO cell; and
a multiplexer to select for input to a first receive, an output of the first serial boundary scan latch of the first IO cell in the first mode, an output of the first receiver of the first IO cell in the second mode, an input from a second receiver in the second IO cell in the third mode.
3. The IO structure of claim 1 , wherein the driver receives an output of a first enable having a first enable input, the first enable comprising:
a first enable serial boundary scan latch;
a first enable parallel boundary scan latch to receive data from the first enable serial boundary scan latch;
a multiplexer to select for input, to the driver, an output of the first enable parallel boundary scan latch in a first mode, an output of the first enable input in a second mode, an output of a second enable input from a second enable in a third mode.
4. The IO structure of claim 3 , wherein the multiplexer selects an output of a third enable input from a third enable in a fourth mode.
5. The IO structure of claim 3 , wherein the output of the first enable parallel boundary scan latch is coupled to a HIGHZ input so that the first enable is tri-stated in a fifth mode.
6. The IO structure of claim 5 , wherein the fifth mode is activated with an output of the first enable serial boundary scan latch and an output of the first serial boundary scan latch.
7. The IO structure of claim 1 , further comprising:
a second chip having an first receiving IO cell and a second receiving IO cell, the second receiving IO cell having a second receiver;
the first receiving IO cell, further comprising:
a first receiver,
a first receiving serial boundary scan latch; and
a first receiving parallel boundary scan latch to receive data from the first receiving serial boundary scan latch.
8. The IO structure of claim 7 , the first receiving IO cell further comprising:
a multiplexer to select for input, to a first functional input, an output from the first receiver in the first mode and the second mode, and an output from the second receiver in the second receiving IO cell in the third mode.
9. The IO structure of claim 8 , wherein the multiplexer is selected by the output of the first receiving serial boundary scan latch.
10. The IO structure of claim 7 , the first receiving IO cell further comprising:
a multiplexer to select for input, to a first functional input, an output of the first receiving serial boundary scan latch from the first receiving IO cell in the first mode, the output from the first receiver in the second mode, an output from the second receiver in a third mode.
11. The IO structure of claim 10 , wherein the multiplexer is selected by the output of the first parallel boundary scan latch and the first enable parallel boundary scan latch.
12. The IO structure of claim 1 , wherein the multiplexer selects an output of a third functional input from a third IO cell in a fourth mode using the first parallel boundary scan latch.
13. The IO structure of claim 1 , wherein the first parallel boundary scan latch, and the first serial boundary scan latch complies with a IEEE™ 1149.1 standard.