IP Library Granted Patent US 9,590,004
Granted Patent B2
US 9,590,004 · App. 14/353,939 · Granted Mar 7, 2017

Solid-state imaging device and imaging apparatus

Inventor: Kazuya Nobayashi (Tokyo, JP)
Assignee: CANON KABUSHIKI KAISHA
H01L27/14625G02B7/34H01L27/1463H01L27/14627H01L27/14629H04N5/2254H04N5/3696
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Quick Facts
Patent No.
US 9,590,004
App. No.
14/353,939
Granted
Mar 7, 2017
Kind
B2
Abstract

A solid-state imaging device includes a plurality of pixels, wherein one or more of the plurality of pixels have a pupil dividing portion and a light receiving portion, the light receiving portion includes a plurality of photoelectric conversion regions, an element isolation region is provided between adjacent ones of the plurality of photoelectric conversion regions, and wherein a scatterer is provided within the pupil dividing portion and above the element isolation region, and the scatterer is formed from a material of a refractive index smaller than a refractive index of a material of the pupil dividing portion peripheral to the scatterer.

Claims (45)

1. A solid-state imaging device comprising a plurality of pixels, wherein

at least one of the plurality of pixels has a pupil dividing portion and a plurality of photoelectric conversion regions, and wherein:

a scatterer is provided within the pupil dividing portion and adjacent to a region between two adjacent ones of the plurality of photoelectric conversion regions,

a refractive index of the scatterer is smaller than that of the pupil dividing portion peripheral to the scatterer,

the pupil dividing portion has a micro lens, and

the plurality of photoelectric conversion regions receive respective lights through the micro lens.

2. The solid-state imaging device according to claim 1 , wherein the scatterer is arranged at a position contacting a surface of the pupil dividing portion at a side of the plurality of photoelectric conversion regions.

3. The solid-state imaging device according to claim 1 , wherein the scatterer has, at a light incident side, an end portion beyond a paraxial imaging plane of the micro lens toward the light incident side.

4. The solid-state imaging device according to claim 1 , wherein the scatterer has a height of 1.0 μm or smaller.

5. The solid-state imaging device according to claim 4 , wherein the scatterer has a height of 0.6 μm or smaller.

6. The solid-state imaging device according to claim 1 , wherein the pupil dividing portion has a waveguide configured to guide an incident light onto the plurality of photoelectric conversion regions including a core and a cladding, and a refractive index of the core is larger than the refractive index of the scatterer, and larger than a refractive index of the cladding.

7. The solid-state imaging device according to claim 1 , wherein an area of a surface of the scatterer at a side of the plurality of photoelectric conversion regions is larger than an area of a surface of the scatterer at a light incident side.

8. The solid-state imaging device according to claim 1 , wherein an interlayer is arranged between the plurality of photoelectric conversion regions and the pupil dividing portion.

9. The solid-state imaging device according to claim 8 , wherein the interlayer operates as an anti-reflection layer suppressing a reflection of light in at least a part of a wavelength region of a light for use in imaging by the solid-state imaging device.

10. An imaging apparatus comprising:

a solid-state imaging device according to claim 1 ; and

an imaging lens configured to guide an external light into the solid-state imaging device.

11. The imaging apparatus according to claim 10 further comprising an arithmetic operation unit configured to calculate a distance from an object to be imaged.

12. The solid-state imaging device according to claim 1 , wherein the scatterer is provided on an optical axis of the micro lens.

13. The solid-state imaging device according to claim 12 , wherein the region between adjacent two of the plurality of photoelectric conversion regions is provided on an optical axis of the micro lens.

14. A solid-state imaging device comprising a plurality of pixels, wherein

at least one of the plurality of pixels has a pupil dividing portion and a plurality of photoelectric conversion regions, and wherein:

a scatterer and a high refractive index portion are provided within the pupil dividing portion,

the scatterer is adjacent to a region between two adjacent ones of the plurality of photoelectric conversion regions,

the high refractive index portion is adjacent to the adjacent two of the plurality of photoelectric conversion regions,

a refractive index of the scatterer is smaller than that of the high refractive index portion,

the pupil dividing portion has a micro lens, and

the plurality of photoelectric conversion regions receive respective lights through the micro lens.

15. The solid-state imaging device according to claim 14 , wherein the scatterer has a height of 1.0 μm or smaller.

16. The solid-state imaging device according to claim 14 , wherein the scatterer has a height of 0.6 μm or smaller.

17. The solid-state imaging device according to claim 14 , wherein an area of a surface of the scatterer at a side of the plurality of photoelectric conversion regions is larger than an area of a surface of the scatterer at a light incident side.

18. An imaging apparatus comprising:

a solid-state imaging device according to claim 14 ; and

an imaging lens configured to guide an external light into the solid-state imaging device.

19. The imaging apparatus according to claim 18 further comprising an arithmetic operation unit configured to calculate a distance from an object to be imaged.

20. The imaging apparatus according to claim 18 , wherein the plurality of photoelectric conversion regions receive though the micro lens respectively the lights from the different regions of a pupil of the imaging lens.

21. A solid-state imaging device comprising a plurality of pixels, wherein

at least one of the plurality of pixels includes:

a micro lens;

a first photoelectric conversion region configured to receive a part of light from the micro lens;

a second photoelectric conversion region configured to receive another part of the light from the micro lens, and

a scatterer provided between the micro lens and a region between the first photoelectric conversion region and the second photoelectric conversion region, and

wherein a refractive index of the scatterer is smaller than that of a material peripheral to the scatterer.

22. The solid-state imaging device according to claim 21 , wherein the scatterer is provided on an optical axis of the micro lens.

23. The solid-state imaging device according to claim 22 , wherein the region between two adjacent ones of the plurality of photoelectric conversion regions is provided on an optical axis of the micro lens.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded May 25, 2014
From: NOBAYASHI, KAZUYA
To: CANON KABUSHIKI KAISHA
Reel/Frame 032960/0706 →
Priority Claims (1)
JP 2011-282110 · Dec 22, 2011 · national
Continuity (1)
Related Publication 20140306095A1 · Oct 16, 2014