Ion trap mass spectrometer having a curved field region

1. An electrostatic analyzer comprising:

at least one first set of electrodes forming a two-dimensional electrostatic field of an ion mirror in an X-Y plane; said ion mirror arranged to provide ion reflections in an X-direction;

at least one second set of electrodes forming a two-dimensional electrostatic field in said X-Y plane; and

a field free space separating said two electrode sets;

wherein said two electrode sets are arranged to provide isochronous ion oscillations in said; field free space,

wherein both of said two electrode sets are curved at constant curvature radius R along a third locally orthogonal Z-direction to form at least one toroidal field region.

2. The electrostatic analyzer of claim 1 , wherein at least one of said electrode sets is angularly modulated to periodically reproduce three-dimensional field sections E(X,Y,Z) along the third locally orthogonal Z-direction.

3. The electrostatic analyzer of claim 1 , wherein within said first set of mirror electrodes, at least one outer ring electrode is connected to a higher repelling voltage relative to an opposite electrode of an internal ring.

4. The electrostatic analyzer of claim 1 , wherein said at least one toroidal field region comprises sections with different curvature radii to form one shape of the group: (i) a spiral; (ii) a serpentine-shape; and (iii) a stadium-shape.

5. The electrostatic analyzer of claim 1 , wherein the angle between the plane of Z-axis curvature and the X-axis is one of the group: (i) 0 degrees; (ii) 90 degrees; (iii) an arbitrary angle; and (iv) an angle selected for a particular ratio between X-size and curvature radius of the analyzer in order to minimize the number of electrodes.

6. The electrostatic analyzer of claim 1 , wherein the shape of said electrode sets is formed by extending the electrode set along a Z-axis closed into a circle.

7. The electrostatic analyzer of claim 1 , wherein at least two electrode sets are identical with account of the analyzer symmetry.

8. The electrostatic analyzer of claim 1 , wherein said second electrode set comprises at least one ion optical assembly of a group: (i) an ion mirror; (ii) an electrostatic sector; (iii) an ion lens; (iv) a deflector; and (v) a curved ion mirror having features of an electrostatic sector.

9. The electrostatic analyzer of claim 8 , wherein said second electrode set comprises a combination of at least two ion optical assemblies of said group.

10. The electrostatic analyzer of claim 9 , further comprising at least one additional ion optical assembly of said group to provide a central reference ion trajectory in said X-Y plane with one shape of the group: (i) O-shaped; (ii) C-shaped; (iii) S-shaped; (iv) X-shaped; (v) V-shaped; (vi) W-shaped; (vii) UU-shaped; (viii) VV-shaped; (ix) Ω-shaped; (x) γ-shaped; and (xi) 8-shaped.

11. An The electrostatic analyzer of claim 1 , wherein said electrostatic analyzer comprises at least one ion mirror having at least four parallel electrodes with distinct potentials, and wherein at least one electrode of the at least four parallel electrodes has an attracting potential which is at least twice larger than the acceleration voltage for providing isochronous oscillations with compensation of at least second-order aberration coefficients.

12. The electrostatic analyzer of claim 1 , wherein at least a portion of said ion mirror provides a quadratic distribution of electrostatic potential in said X direction, wherein said ion mirror comprises a spatially focusing lens, and wherein said electrode sets further comprise means for radial ion deflection across the Z-axis for arranging an orbital ion motion.

13. The electrostatic analyzer of claim 1 , wherein said electrostatic analyzer is constructed using one technology of the group: (i) spacing metal rings by ceramic balls similarly to ball bearings; (ii) electro erosion or laser cutting of plate sandwich; (iii) machining of ceramic or semi-conductive block with subsequent metallization of electrode surfaces; (iv) electroforming; (v) chemical etching or etching by ion beam of a semi-conductive sandwich with surface modifications for controlling conductivity; and (vi) a ceramic printed circuit board technology.

14. The electrostatic analyzer of claim 13 , wherein the employed materials are chosen to have reduced thermal expansion coefficients and comprise one material of the group: (i) ceramics; (ii) fused silica; (iii) metals like 64FeNi, Zircon, or Molybdenum and Tungsten alloys; and (iv) semiconductors like Silicon, Boron Carbide, or zero-thermo expansion hybrid semi conducting compounds.

15. The electrostatic analyzer of claim 1 , wherein said field regions are multiplexed by either making coaxial slits in parallel aligned electrodes or stacking analyzers.

16. The electrostatic analyzer of claim 1 , further comprising a pulsed converter extended and aligned along said Z-direction to follow the constant curvature of the electrode sets, wherein said pulsed converter comprises means for ion ejection in the direction orthogonal to the Z-direction, and wherein said pulsed converter further comprises one of the group: (i) a radio-frequency ion guide; (ii) a radiofrequency ion trap; (iii) an electrostatic ion guide; and (iv) an electrostatic ion trap with ion oscillations being in the X-direction.

17. A mass spectrometer comprising the electrostatic analyzer of claim 1 wherein said electrostatic analyzer is employed as one of the group: (i) a closed electrostatic trap; (ii) an open electrostatic trap; and (iii) a time of flight analyzer.

18. A method of mass spectrometry comprising the following steps:

forming at least one first field region of a two-dimensional electrostatic field in an X-Y plane for ion reflection in an X-direction;

forming at least one second field region of a two-dimensional electrostatic field in said X-Y plane;

separating said two field regions by a field-free space;

arranging said electrostatic fields to provide isochronous ion oscillations in said X-Y plane;

wherein both the first and the second field regions are curved at constant curvature radius R along a third locally orthogonal Z-direction to form a toroidal field region, and

wherein an ion path per single oscillation L and an inclination angle α between a mean ion trajectory and the X-axis and measured in radians are chosen to satisfy the relation:

R> 50 *L *α 2 .

19. The method of claim 18 , wherein said electrostatic fields are arranged for at least one further step of the group: (i) an ion retarding in the X-direction for repetitive ion oscillations; (ii) a spatial focusing or confining of moving ions in a transverse Y-direction; (iii) an ion deflection orthogonal to said X-direction; (iv) a time-of-flight focusing in X-direction relative to energy spread of ion packets to at least third-order of the Tailor expansion; (v) spatial ion focusing or confinement of moving ions in the Z-direction; and (vi) radial deflection for orbital ion motion.

20. The method of claim 18 , wherein possible non parallelism of said two field regions is at least partially compensated by fringing fields of auxiliary electrodes (E-wedge).

21. The electrostatic analyzer of claim 1 , wherein the shape of said electrode sets is formed by extending the electrode set along a Z-axis tilted in relation to the X-axis.

22. The electrostatic analyzer of claim 21 , where the Z-axis is tilted in relation to the X-axis 180 degrees.

23. The electrostatic analyzer of claim 21 , where the Z-axis is tilted in relation to the X-axis 90 degrees.

24. The electrostatic analyzer of claim 1 , wherein the shape of said electrode sets is formed by extending the electrode set along a Z-axis with a toroidal extension.

25. The electrostatic analyzer of claim 1 , wherein an ion path per single oscillation L and an inclination angle between α between a mean ion trajectory and the X-axis and measured in radians are chosen to satisfy the relation:

R> 50 *L *α 2 .