IP Library Granted Patent US 9,618,504
Granted Patent B2
US 9,618,504 · App. 14/226,249 · Granted Apr 11, 2017

Sample analyzer

Inventors: Tsukasa Hirata (Kakogawa, JP); Shoichiro Asada (Akashi, JP); Naoya Maeda (Kanzaki-gun, JP); Kosuke Yamaguchi (Kobe, JP)
Assignee: SYSMEX CORPORATION
G01N33/5302G01N35/00584G01N35/00693G01N2035/00673G01N2035/00891
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Quick Facts
Patent No.
US 9,618,504
App. No.
14/226,249
Granted
Apr 11, 2017
Kind
B2
Abstract

To provide a sample analyzer capable of accurately obtaining the number of analyzable samples. When analyzing a sample collected from a subject, a CPU of the sample analyzer calculates the number of analyzable samples based on a remaining number of tests of a reagent set in a reagent holding section and the number of tests of the reagent to be consumed in measurement of a control, and causes a output section to display the number of analyzable samples. When creating a calibration curve, the CPU calculates the number of analyzable samples based on a remaining number of tests of the reagent set in the reagent holding section, the number of tests of the reagent to be consumed in measurement of the control, and the number of tests of the reagent to be consumed in measurement of a calibrator, and causes the output section to display the number of analyzable samples.

Claims (41)

1. A sample analyzer, comprising:

a reagent holding section configured to hold a reagent;

a measurement section configured to measure one or more first measurement specimens which are prepared from one or more subject samples collected from a subject and the reagent held by the reagent holding section, and to measure a second measurement specimen which is prepared from a quality control sample and the reagent held by the reagent holding section;

an output section,

a non-transitory memory for storing computer programs, and

a central processing unit programmed to execute instructions from a stored program stored in the non-transitory memory, the instructions configured to cause the central processing unit to perform operations comprising:

registering a sample analysis order for analyzing the one or more subject samples included in a batch;

after the registration of the sample analysis order, causing the measurement section to continuously measure the one or more first measurement specimens and the second measurement specimen included in the batch; and

causing the output section to output one or more analysis results of the subject samples included in the batch obtained by the measurement section,

wherein when the central processing unit registers the sample analysis order, the central processing unit causes the output section to output a number of analyzable subject samples based on a remaining amount of the reagent held by the reagent holding section, an amount of the reagent required to prepare the one or more first measurement specimens and an amount of the reagent required to prepare the second measurement specimen.

2. The sample analyzer of claim 1 , wherein

the quality control sample includes a positive quality control sample and a negative quality control sample.

3. The sample analyzer of claim 1 , wherein

the instructions are configured to cause the central processing unit to perform operations further comprising:

causing, when creating a calibration curve, the output section to output a second number of analyzable subject samples, based on: (I) a remaining amount of the reagent held by the reagent holding section, (II) the amount of the reagent required to prepare the first measurement specimen, (Ill) the amount of the reagent required to prepare the second measurement specimen, and (IV) an amount of the reagent required to prepare a third measurement specimen from a calibration curve creation sample and the reagent held by the reagent holding section.

4. The sample analyzer of claim 1 , wherein

the instructions are configured to cause the central processing unit to perform operations further comprising:

controlling, when registering the sample analysis order, the output section to include the number of analyzable subject samples in a screen display for registering a sample order.

5. The sample analyzer of claim 4 , wherein

the instructions are configured to cause the central processing unit to perform operations further comprising controlling the output section to include, in the screen display, quality control sample information indicating the quality control sample.

6. The sample analyzer of claim 3 , wherein

the instructions are configured to cause central processing unit to perform operations further comprising controlling, when creating the calibration curve, the output section so as to include the second number of analyzable subject samples in a second screen for registering a creation request of a calibration curve.

7. The sample analyzer of claim 4 , wherein

when registering the sample analysis order, the instructions are configured to cause the central processing unit to perform operations further comprising causing the output section to output information indicating insufficiency of the reagent when a number of the subject samples included in the batch which have been registered on the screen display is greater than the number of analyzable subject samples.

8. The sample analyzer of claim 4 , wherein

when registering the sample analysis order, the instructions are configured to cause the central processing unit to perform operations further comprising prohibiting the measurement section from measuring the first measurement specimen when a number of subject samples included in the batch which have been registered on the screen display is greater than the number of analyzable subject samples.

9. The sample analyzer of claim 6 , wherein

when performing creation of the calibration curve, the instructions are configured to cause the central processing unit to perform operations further comprising causing the output section to output information indicating insufficiency of the reagent in a case where the second number of analyzable subject samples is 0.

10. The sample analyzer of claim 6 , wherein

when performing creation of the calibration curve, the instructions are configured to cause the central processing unit to perform operations further comprising prohibiting the measurement section from measuring the calibration curve creation measurement specimen when the second number of analyzable subject samples is 0.

11. The sample analyzer of claim 3 , wherein

the reagent holding section is configured to hold a first reagent to be used for a first analysis item, and a second reagent to be used for a second analysis item different from the first analysis item,

the measurement section is capable of measuring each of a first item measurement specimen which is prepared from a subject sample and the first reagent held by the reagent holding section, and a second item measurement specimen which is prepared from the subject sample and the second reagent held by the reagent holding section, and

the instructions are configured to cause the central processing unit to perform operations further comprising:

causing, when registering a sample analysis order for the first analysis item, the output section to output a number of analyzable subject samples based on a remaining amount of the first reagent, an amount of the first reagent required to prepare the first item measurement specimen, and an amount of the first reagent required to prepare the second item measurement specimen, and

causing, when registering a sample analysis order for the second analysis item, the output section to output a number of analyzable subject samples based on a remaining amount of the second reagent, an amount of the second reagent required to prepare the second item measurement specimen and an amount of the second reagent required to prepare the second measurement specimen.

12. The sample analyzer of claim 6 , wherein

when creating the calibration curve, the instructions are configured to cause central processing unit to perform operations further comprising controlling the output section to include, in the second screen display information indicating the quality control sample to be used in the quality control.

13. The sample analyzer of claim 6 , wherein

the measurement section is configured to measure a nucleic acid amplification.

14. The sample analyzer of claim 1 , wherein the non-transitory memory is selected from the group consisting of read only memory and hard disc memory.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Mar 26, 2014
From: HIRATA, TSUKASA; ASADA, SHOICHIRO; MAEDA, NAOYA; YAMAGUCHI, KOSUKE
To: SYSMEX CORPORATION
Reel/Frame 032532/0606 →
Priority Claims (1)
JP 2013-071429 · Mar 29, 2013 · national
Continuity (1)
Related Publication 20140295453A1 · Oct 2, 2014