Inspection system and inspection illumination device
In order to provide an inspection illumination device that makes it possible to greatly change a light amount within an observation solid angle of an imaging device even in a case where a change in reflection or scattering taking place at a feature point is subtle, and thus detect such a minute feature point, the inspection illumination device includes: a surface light source that emits inspection light; a lens that is arranged between the surface light source and an inspection object, and provides an image of the surface light source near the inspection object; and a first light shielding mask that is arranged between the surface light source and the inspection object, and forms a dark domain within an illumination solid angle of the inspection light applied to each point on the inspection object.
1. An inspection system including: an inspection illumination device that applies inspection light to an inspection object; and an imaging device that images light reflected or scattered at the inspection object, wherein
the inspection illumination device comprises:
a surface light source that emits the inspection light;
a lens that is arranged between the surface light source and the inspection object, and provides an image of the surface light source near the inspection object; and
a first light shielding mask that is arranged between the surface light source and the inspection object, and forms a dark domain within an illumination solid angle of the inspection light applied to each point on the inspection object; and
the imaging device has an observation solid angle, wherein
a shape or a size of the observation solid angle is set on a basis of a shape or a size of a dark domain within the illumination solid angle of the inspection light applied from the inspection illumination device to each point on the inspection object.
2. The inspection system according to claim 1 , wherein
the size of the observation solid angle is set substantially equal to the size of the dark domain of the illumination solid angle.
3. The inspection system according to claim 1 , further comprising
a first diaphragm that is arranged at a predetermined position with respect to a focal point of the lens.
4. The inspection system according to claim 3 , wherein
the first light shielding mask is arranged near the first diaphragm, and a light shielding part of the first light shielding mask is formed to be smaller than an aperture size of the first diaphragm.
5. The inspection system according to claim 1 , wherein
a second light shielding mask formed with a predetermined mask pattern is arranged near an emission side of the surface light source.
6. The inspection system according to claim 1 , wherein:
the surface light source has a light emitting plane;
a light axis of the lens is arranged obliquely to an inspection object plane on the inspection object; and
a first virtual plane including the light emitting plane, a second virtual plane including a principal plane of the lens, and a third virtual plane including the inspection object plane intersect on one straight line.
7. The inspection system according to claim 1 , wherein:
the surface light source has a light emitting curved surface; and
a shape of the light emitting curved surface is set such that light emitted from each point on the light emitting curved surface is imaged at each point on an inspection object curved surface through the lens.
8. An inspection illumination device comprising:
a surface light source that emits inspection light;
a lens that is arranged between the surface light source and an inspection object, and provides an image of the surface light source near the inspection object; and
a first light shielding mask that is arranged between the surface light source and the inspection object, and forms a dark domain within the illumination solid angle of the inspection light applied to each point on the inspection object.