Measuring apparatus where a distance between a surface of a transparent substrate on which a marker pattern is formed and a front surface is within a depth of focus of a detecting means
An optical electric field enhancing device is used with a measuring method which includes two-dimensionally scanning a surface in in-plane direction of the surface to detect, from the rear surface side of the device, signal light emitted from each scanning point when excitation light is applied, and obtaining a two-dimensional signal image on the surface based on the detected signal light. The device includes a transparent substrate, a marker pattern directly formed on the transparent substrate and extending in a direction non-parallel to the main scanning direction of the two-dimensional scanning, and fine uneven structures formed on the marker pattern and the transparent substrate where at least the surface is made of a metal film.
1. A measuring apparatus comprising:
an optical electric field enhancing device for enhancing intensity of signal light which is emitted from a sample placed on the front surface of the device when excitation light is applied, wherein localized plasmons are induced on the front surface when the excitation light is applied, the optical electric field enhancing device being used with a measuring method which includes two-dimensionally scanning the front surface in in-plane directions of the surface with the excitation light, detecting, from the rear surface side of the device, the signal light from each scanning point, and obtaining a two-dimensional signal image on the front surface based on each signal light obtained by the detection, the optical electric field enhancing device comprising: a transparent substrate; a marker pattern directly formed on the transparent substrate and extending in a direction non-parallel to a main scanning direction of the two-dimensional scanning; and a fine uneven structure formed on the marker pattern and the transparent substrate,
wherein at least the front surface of the fine uneven structure is made of a metal film;
excitation light applying means for applying the excitation light to the front surface;
scanning means for two-dimensionally scanning the front surface in in-plane directions of the surface with the excitation light;
detecting means for detecting, from the rear surface side of the device, the signal light from each scanning point;
image obtaining means for obtaining the two-dimensional signal image and an image of the marker pattern on the front surface based on the signal light from each scanning point detected by the detecting means;
image correcting means for correcting the obtained two-dimensional signal image based on the image of the marker pattern; and
display means for displaying the two-dimensional signal image corrected by the image correcting means;
wherein a distance between the surface of the transparent substrate on which the marker pattern is formed and the front surface is within a depth of focus of the detecting means; and
wherein the rear surface of the photoelectric field enhancing device is outside the depth of focus and the marker pattern provided on a marker pattern formation surface of the transparent substrate and the surface of the fine uneven structure are within the depth of focus.