Method of manufacturing semiconductor device

1. A method of manufacturing a semiconductor device, comprising:

(a) processing a substrate accommodated in a process container accommodated in a housing by supplying a process gas onto the substrate; and

(b) exhausting the process container using an exhaust system comprising a first exhaust pipe connected to the process container, the first exhaust pipe having circular or oval cross-section perpendicular to an exhausting direction thereof; and a second exhaust pipe connected to the first exhaust pipe, the second exhaust pipe extending downward in a vertical direction and having square or rectangular cross-section perpendicular to the exhausting direction, wherein at least a portion of the second exhaust pipe is disposed within a pipe accommodating part of the housing having a rectangular horizontal cross-section,

wherein an aspect ratio of the cross-section of the pipe accommodating part is substantially the same as that of the cross-section of the second exhaust pipe.

2. The method of claim 1 , wherein at least a portion of the second exhaust pipe comprises a rib structure.

3. The method of claim 2 , wherein at least one of the at least two types of process gases comprises a gas having a low vapor pressure.

4. The method of claim 1 , wherein (a) comprises alternately and repeatedly supplying at least two types of process gases into the process container without mixing the at least two types of process gases to form a film on the substrate.

5. The method of claim 4 , wherein the film comprises a high-k dielectric film.

6. The method of claim 1 , wherein the exhaust system further comprising: a third exhaust pipe connected to the second exhaust pipe and disposed outside the housing wherein an area of a cross-section of the third exhaust pipe is larger than that of the cross-section of the second exhaust pipe.