IP Library Granted Patent US 9,652,703
Granted Patent B1
US 9,652,703 · App. 13/114,542 · Granted May 16, 2017

Tag and seal employing a micromachine artifact

Inventor: Peter B. Merkle (St. Augustine, FL)
Assignee: Sandia Corporation
G06K19/06009
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Quick Facts
Patent No.
US 9,652,703
App. No.
13/114,542
Granted
May 16, 2017
Kind
B1
Abstract

A tamper resistant seal including a population of particles embedded in an adhesive, the population including at least one micromachine artifact of a predetermined physical shape.

Claims (15)

1. A tamper resistant seal, comprising:

an adhesive matrix;

a population of particles embedded in the adhesive matrix, wherein the population includes at least one particle that is a micromachine artifact formed by a microelectronic and microelectromechanical technique to have a predetermined physical shape;

a frame embedded in the adhesive matrix, the frame being of a contiguous material which forms a perimeter surrounding the population of particles

wherein the micromachine artifact comprises a material selected from a group consisting essentially of monocrystalline or polycrystalline semiconductor material; and

wherein the micromachine artifact comprises a plurality of repeating features having a critical dimension of less than 500 μm.

2. The tamper resistant seal of claim 1 , wherein the physical shape or physical location of the at least one micromachine artifact within the seal identifies the seal.

3. The tamper resistant seal of claim 1 , wherein the population of particles comprises at least three structurally distinct micromachine artifacts, each having a different predetermined shape, the combination of the at least three artifacts identifying the seal.

4. The tamper resistant seal of claim 1 , wherein an outer edge of the at least one micromachine artifact includes the plurality of repeating features, each repeating feature having a side with a critical dimension no greater than 500 μm.

5. The tamper resistant seal of claim 1 , wherein the predetermined physical shape is defined in a first and second dimension and the artifact has a predetermined physical thickness in a third dimension which is less than a longest length of the artifact in the first or second dimension.

6. The tamper resistant seal of claim 5 , wherein the predetermined shape comprises a polygon, at least one side having a dimension smaller than the longest length.

7. The tamper resistant seal of claim 1 , wherein the micromachine artifact comprises at least one length greater than a millimeter.

8. The tamper resistant seal of claim 1 , wherein the frame is monocrystalline and includes alignment marks integrally formed into the frame material.

9. The tamper resistant seal of claim 1 , wherein the adhesive comprises a UV-curable acrylic resin.

10. The tamper resistant seal of claim 1 , wherein the population of particles further comprise randomly distributed specularly reflective particles of a random shape.

Assignments (3)
CHANGE OF NAME Recorded Aug 21, 2017
From: SANDIA CORPORATION
To: NATIONAL TECHNOLOGY & ENGINEERING SOLUTIONS OF SANDIA, LLC
Reel/Frame 043618/0610 →
CONFIRMATORY LICENSE Recorded Jul 7, 2011
From: SANDIA CORPORATION
To: U.S. DEPARTMENT OF ENERGY
Reel/Frame 026558/0540 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded May 24, 2011
From: MERKLE, PETER B.
To: SANDIA CORPORATION
Reel/Frame 026333/0206 →