IP Library Granted Patent US 9,664,800
Granted Patent B2
US 9,664,800 · App. 15/048,161 · Granted May 30, 2017

Laser etched scintillation detector blocks with internally created reflectors

Inventors: Mark S. Andreaco (Knoxville, TN); Peter Carl Cohen (Knoxville, TN); Matthias J. Schmand (Lenoir City, TN); James L. Corbeil (Knoxville, TN); Alexander Andrew Carey (Lenoir City, TN); Robert A. Mintzer (Knoxville, TN); Charles L. Melcher (Oak Ridge, TN); Merry A. Koschan (Knoxville, TN)
Assignees: University of Tennessee Research Foundation; Siemens Medical Solutions USA, Inc.
G01T1/2002
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Quick Facts
Patent No.
US 9,664,800
App. No.
15/048,161
Granted
May 30, 2017
Kind
B2
Abstract

A scintillator element is disclosed where the scintillator element includes a scintillator formed of a scintillation material capable of converting non-visible radiation into scintillation light, wherein the scintillator has a plurality of laser-etched micro-voids within the scintillator, each micro-void having an interior surface, and an intrinsic reflective layer is formed on the interior surface of at least some of the micro-voids, wherein the intrinsic reflective layer is formed from the scintillation material.

Claims (33)

1. A radiation detector, comprising:

a scintillator formed of a scintillation material capable of converting non-visible radiation into scintillation light, wherein the scintillator has a plurality of laser-etched micro-voids within the scintillator, each micro-void having an interior surface;

a reflective layer formed on the interior surface of each micro-void, wherein the reflective layer is formed from the scintillation material; and

one or more optical sensors positioned in proximity to the scintillator, to detect the scintillation light from the scintillator.

2. The radiation detector of claim 1 , further comprising an additional intrinsic reflective layer formed on outer surfaces of the scintillator, wherein the additional intrinsic reflective layer is also formed from the scintillation material.

3. The radiation detector of claim 2 , wherein the additional intrinsic reflective layer covers the scintillator on all outer surfaces except one or more outer surface portions of the scintillator facing the optical sensors.

4. The radiation detector of claim 2 , further comprising a layer of reflective paint applied on the intrinsic reflective layer.

5. The radiation detector of claim 2 , further comprising titanium tetracholoride (TiCl 4 ) or silicon tetracholoride (SiCl 4 ) applied to the additional intrinsic reflective layer to fill any voids in the additional intrinsic reflective layer.

6. The radiation detector of claim 2 , further comprising a metal film formed on the additional intrinsic reflective layer.

7. The radiation detector of claim 2 , further comprising Enhanced Specular Reflector composite material directly on the surface of the additional intrinsic reflective layer.

8. The radiation detector of claim 2 , wherein the scintillation material is Gd 3 Ga 3 Al 2 O 12 and the intrinsic reflective layer and the additional intrinsic reflective layer comprise GdAlO 3 .

9. The radiation detector of claim 1 , wherein the scintillation material is a gallium containing material having a general formula A 3 (B,C) 5 O 12 doped with Ce and co-doped with one or more of B, Ba, Ca, Mg, Sr or any combination thereof;

wherein A is selected from the group consisting of Y, La, Pr, Gd, Tb, Dy, Lu, Sc, and any combination thereof;

wherein B is selected from the group consisting of Al, Ga, and Sc; and

C is selected from the group consisting of Al and Ga.

10. The radiation detector of claim 1 , wherein the scintillation material is Gd 3 Ga 3 Al 2 O 12 and the intrinsic reflective layer comprises GdAlO 3 .

11. The radiation detector of claim 1 , wherein the scintillator further comprising:

a plurality of micro-cracks within the scintillator, each micro-crack having two or more surfaces forming the micro-cracks; and

additional intrinsic reflective layers formed on the two or more surfaces of each micro-crack, wherein the additional intrinsic reflective layers are formed from the scintillation material.

12. The radiation detector of claim 11 , wherein the scintillation material is Gd 3 Ga 3 Al 2 O 12 and the additional intrinsic reflective layers comprise GdAlO 3 .

13. A scintillator element comprising:

a scintillator formed of a scintillation material capable of converting non-visible radiation into scintillation light, wherein the scintillator has a plurality of laser-etched micro-voids within the scintillator, each micro-void having an interior surface; and

an intrinsic reflective layer formed on the interior surface of at least some of the micro-voids, wherein the intrinsic reflective layer is formed from the scintillation material.

14. The scintillator element of claim 13 , further comprising an additional intrinsic reflective layer formed on outer surfaces of the scintillator, wherein the additional intrinsic reflective layer is also formed from the scintillation material.

15. The scintillator element of claim 14 , wherein the additional intrinsic reflective layer covers the scintillator on all outer surfaces except one or more outer surface portions of the scintillator facing the optical sensors.

16. The scintillator element of claim 14 , further comprising a layer of reflective paint applied on the additional intrinsic reflective layer.

17. The scintillator element of claim 14 , further comprising titanium tetracholoride (TiCl 4 ) or silicon tetracholoride (SiCl 4 ) applied to the additional intrinsic reflective layer to fill any voids in the additional intrinsic reflective layer.

18. The scintillator element of claim 14 , further comprising a metal film formed on the additional intrinsic reflective layer.

19. The scintillator element of claim 13 , wherein the scintillator further comprising:

a plurality of micro-cracks within the scintillator, each micro-crack having two or more surfaces forming the micro-cracks; and

additional intrinsic reflective layers formed on the two or more surfaces of each micro-crack, wherein the additional intrinsic reflective layers are formed from the scintillation material.

20. The scintillator element of claim 13 , wherein the scintillation material is Gd 3 Ga 3 Al 2 O 12 and the intrinsic reflective layer comprises GdAlO 3 .

21. The scintillator element of claim 14 , wherein the scintillation material is Gd 3 Ga 3 Al 2 O 12 and the intrinsic reflective layer and the additional intrinsic reflective layer comprise GdAlO 3 .

Assignments (2)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Mar 31, 2016
From: ANDREACO, MARK S.; COHEN, PETER CARL; SCHMAND, MATTHIAS J.; CORBEIL, JAMES L.; CAREY, ALEXANDER ANDREW; MINTZER, ROBERT A.
To: SIEMENS MEDICAL SOLUTIONS USA, INC.
Reel/Frame 038161/0558 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Mar 31, 2016
From: KOSCHAN, MERRY A.; MELCHER, CHARLES L.
To: UNIVERSITY OF TENNESSEE RESEARCH FOUNDATION
Reel/Frame 038161/0818 →
Continuity (4)
Continuation In Part 14340182 · Jul 24, 2014
Provisional Application 62152080 · Apr 24, 2015
Provisional Application 61860449 · Jul 31, 2013
Related Publication 20160170043A1 · Jun 16, 2016