IP Library Granted Patent US 9,685,343
Granted Patent B2
US 9,685,343 · App. 14/910,803 · Granted Jun 20, 2017

Method for producing polished object and polishing composition kit

Inventors: Makoto Tabata (Kiyosu, JP); Shinichiro Takami (Kiyosu, JP); Shogaku Ide (Kiyosu, JP)
Assignee: FUJIMI INCORPORATED
H01L21/30625B24B37/28C09G1/02C09K3/1409C09K3/1436C09K3/1463H01L21/02024
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Quick Facts
Patent No.
US 9,685,343
App. No.
14/910,803
Granted
Jun 20, 2017
Kind
B2
Abstract

[Problem] To provide a method for producing a polished object, which can remarkably reduce a haze level on a surface of the object to be polished while defects are significantly reduced. [Solution] A method for producing a polished object, which includes a double-side polishing step in which an object to be polished is subjected to double-side polishing using a double-side polishing composition including first abrasive grains having an average primary particle diameter of 40 nm or more and a nitrogen-containing water-soluble polymer to obtain a double-side polished object; and a single-side polishing step in which the double-side polished object is subjected to single-side polishing using a single-side polishing composition including second abrasive grains having an average primary particle diameter of 40 nm or less and a water-soluble polymer, and in which a ratio of an average primary particle diameter (A) of the first abrasive grains with respect to an average primary particle diameter (B) of the second abrasive grains (A)/(B) is more than 1 and 2.5 or less.

Claims (22)

1. A method for producing a polished object, comprising:

a double-side polishing step in which an object to be polished is subjected to double-side polishing using a double-side polishing composition including first abrasive grains having an average primary particle diameter of 40 nm or more and a nitrogen-containing water-soluble polymer to obtain a double-side polished object; and

a single-side polishing step in which the double-side polished object is subjected to single-side polishing using a single-side polishing composition including second abrasive grains having an average primary particle diameter of 40 nm or less and a water-soluble polymer, wherein

a ratio of an average primary particle diameter (A) of the first abrasive grains with respect to an average primary particle diameter (B) of the second abrasive grains (A)/(B) is more than 1 and 2.5 or less, and

wherein the concentration of the water-soluble polymer in the single-side polishing composition is 5 times higher than that of the nitrogen-containing water-soluble polymer in the double-side polishing composition.

2. The method for producing a polished object according to claim 1 , wherein (A)/(B) is 1.6 or more and less than 2.3.

3. The method for producing a polished object according to claim 1 , wherein the nitrogen-containing water-soluble polymer has one or more nitrogen atoms in a monomer unit, or one or more nitrogen atoms in a part of side chain.

4. The method for producing a polished object according to claim 1 , wherein the nitrogen-containing water-soluble polymer is selected from the group consisting of polyvinyl imidazole, polyvinyl carbazole, polyvinyl pyrrolidone, poly N-vinylformamide, polyvinyl caprolactam, and polyvinyl piperidine.

5. The method for producing a polished object according to claim 1 , wherein

the single-side polishing step is performed multiple times, and

a water-soluble polymer used in the last single-side polishing step includes at least one selected from a polymer containing an oxyalkylene unit, a nitrogen-containing water-soluble polymer, polyvinyl alcohol, and a cellulose derivative.

6. The method for producing a polished object according to claim 1 , wherein the object to be polished is a semiconductor wafer.

7. The method for producing a polished object according to claim 6 , wherein the semiconductor is silicon.

8. A polishing composition kit comprising:

first abrasive grains having an average primary particle diameter of 40 nm or more, used in double-side polishing; a nitrogen-containing water-soluble polymer used in double-side polishing;

second abrasive grains having an average primary particle diameter of 40 nm or less, used in single-side polishing; and a water-soluble polymer used in single-side polishing, wherein

a ratio of an average primary particle diameter (A) of the first abrasive grains with respect to an average primary particle diameter (B) of the second abrasive grains (A)/(B) is more than 1 and 2.5 or less, and

wherein the concentration of the water-soluble polymer in the single-side polishing composition is 5 times higher than that of the nitrogen-containing water-soluble polymer in the double-side polishing composition.

9. A double-side polishing composition used in the method for producing a polished object according to claim 1 ,

wherein the double-side polishing composition comprises abrasive grains having an average primary particle diameter of 40 nm or more and a nitrogen-containing water-soluble polymer.

10. A single-side polishing composition used in the method for producing a polished object according to claim 1 ,

wherein the single-side polishing composition comprises abrasive grains having an average primary particle diameter of 40 nm or less and a water-soluble polymer.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Feb 9, 2016
From: TABATA, MAKOTO; TAKAMI, SHINICHIRO; IDE, SHOGAKU
To: FUJIMI INCORPORATED
Reel/Frame 037690/0722 →
Priority Claims (1)
JP 2013-166142 · Aug 9, 2013 · national
Continuity (1)
Related Publication 20160189973A1 · Jun 30, 2016