Broadband or mid-infrared fiber light sources
A white light spectroscopy system includes a super continuum light source having an input light source including semiconductor diodes to generate an input beam having a wavelength shorter than 2.5 microns. The light source includes a cladding-pumped fiber optical amplifier to receive the input beam, and a photonic crystal fiber to receive the amplified optical beam to broaden the spectral width to 100 nm or more forming an output beam in the visible wavelength range. The output beam is pulsed with a repetition rate of 1 Megahertz or higher. The system also includes a lens and/or mirror to receive the output beam, to send the output beam to a scanning stage, and to deliver the received output beam to a sample. A detection system includes dispersive optics and narrow band filters followed by one or more detectors to permit approximately simultaneous measurement of at least two wavelengths from the sample.
1. A white light spectroscopy system, comprising:
a super continuum light source comprising:
an input light source, including one or more semiconductor diodes, to generate an input beam that comprises a wavelength shorter than 2.5 microns;
one or more optical amplifiers to receive at least a portion of the input beam and form an amplified optical beam having a spectral width, wherein at least a portion of the one or more optical amplifiers comprises a cladding-pumped fiber amplifier; and
a nonlinear element comprising a photonic crystal fiber to receive at least a portion of the amplified optical beam and to broaden the spectral width of the received amplified optical beam to 100 nm or more through a nonlinear effect forming an output beam,
wherein at least a portion of the output beam is in the visible wavelength range from 0.4 microns to 0.6 microns,
wherein the output beam is pulsed with a repetition rate of 1 Megahertz or higher, and
the white light spectroscopy system further comprising:
at least one of a lens and a mirror to receive at least a portion of the output beam, to send the at least a portion of the output beam to a scanning stage, and to deliver at least part of the received output beam to a sample; and
a detection system comprising dispersive optics and one or more narrow band filters comprising slits followed by one or more detectors to permit approximately simultaneous measurement of at least two wavelengths from the sample.
2. The white light spectroscopy system of claim 1 wherein the output beam pulse width is greater than 100 psec.
3. The white light spectroscopy system of claim 2 further comprising a filter coupled to the at least one of a lens and a mirror.
4. The white light spectroscopy system of claim 3 wherein an average output power of the output beam is 20 mW or more and wherein an average intensity of the at least a portion of the output beam is less than approximately 50 MW/cm 2 .
5. The white light spectroscopy system of claim 4 wherein the input light source comprises two or more semiconductor diodes, and wherein the super continuum light source includes a beam combiner to combine at least a portion of the light from the two or more semiconductor diodes and to generate a multiplexed input beam coupled to the one or more optical amplifiers.
6. A white light spectroscopy system, comprising:
a super continuum light source comprising:
an input light source, including one or more semiconductor diodes, to generate an input beam that comprises a wavelength shorter than 2.5 microns;
one or more optical amplifiers to receive at least a portion of the input beam and form an amplified optical beam having a spectral width, wherein at least a portion of the one or more optical amplifiers comprises a cladding-pumped fiber amplifier; and
a nonlinear element to receive at least a portion of the amplified optical beam and to broaden the spectral width of the received amplified optical beam to 100 nm or more through a nonlinear effect forming an output beam,
wherein at least a portion of the output beam is in the visible wavelength range from 0.4 microns to 0.6 microns,
wherein the output beam is pulsed with a repetition rate of 1 Megahertz or higher, and
the white light spectroscopy system further comprising:
at least one of a lens and a mirror to receive at least a portion of the output beam, to send the at least a portion of the output beam to a scanning stage, and to deliver at least a portion of the received output beam to a sample; and
a detection system comprising one or more narrow band filters comprising slits followed by one or more detectors.
7. The white light spectroscopy system of claim 6 wherein the nonlinear element comprises a photonic crystal fiber.
8. The white light spectroscopy system of claim 7 wherein the detection system permits approximately simultaneous measurement of at least two wavelengths from the sample.
9. The white light spectroscopy system of claim 8 wherein the output beam pulse width is greater than 100 psec.
10. The white light spectroscopy system of claim 9 wherein the detection system further comprises dispersive optics to spread a reflected beam from the sample before reaching the one or more detectors.
11. The white light spectroscopy system of claim 10 wherein the white light spectroscopy system further comprises a filter coupled to the at least one of a lens and a mirror.
12. The white light spectroscopy system of claim 11 wherein an average output power of the output beam is 20 mW or more and wherein an average intensity of the at least a portion of the output beam is less than approximately 50 MW/cm 2 .
13. The white light spectroscopy system of claim 12 wherein the input light source comprises two or more semiconductor diodes, and wherein the super continuum light source includes a beam combiner to combine at least a portion of the light from the two or more semiconductor diodes and to generate a multiplexed input beam coupled to the one or more optical amplifiers.
14. The white light spectroscopy system of claim 6 wherein the detection system permits approximately simultaneous measurement of at least two wavelengths from the sample.
15. The white light spectroscopy system of claim 6 wherein the output beam pulse width is greater than 100 psec.
16. The white light spectroscopy system of claim 6 wherein the detection system further comprises dispersive optics to spread a reflected beam from the sample before reaching the one or more detectors.
17. The white light spectroscopy system of claim 6 wherein the repetition rate is selectable.
18. The white light spectroscopy system of claim 6 wherein an average output power of the output beam is 20 mW or more and wherein an average intensity of the at least a portion of the output beam is less than approximately 50 MW/cm 2 .
19. The white light spectroscopy system of claim 6 wherein the input light source comprises two or more semiconductor diodes, and wherein the super continuum light source includes a beam combiner to combine at least a portion of the light from the two or more semiconductor diodes and to generate a multiplexed input beam coupled to the one or more optical amplifiers.
20. A white light spectroscopy system, comprising:
a super continuum light source comprising:
an input light source, including one or more semiconductor diodes, to generate an input beam that comprises a wavelength shorter than 2.5 microns;
one or more optical amplifiers to receive at least a portion of the input beam and form an amplified optical beam having a spectral width, wherein at least a portion of the one or more optical amplifiers comprises a cladding-pumped fiber amplifier; and
a nonlinear element comprising a photonic crystal fiber to receive at least a portion of the amplified optical beam and to broaden the spectral width of the received amplified optical beam to 100 nm or more through a nonlinear effect forming an output beam,
wherein at least a portion of the output beam is in the visible wavelength range from 0.4 microns to 0.6 microns,
wherein the output beam is pulsed with a repetition rate of 1 Megahertz or higher, and
the white light spectroscopy system further comprising:
a filter and at least one of a lens and a mirror to receive at least a portion of the output beam, to send the at least a portion of the output beam to a scanning stage, and to deliver at least part of the received output beam to a sample; and
a detection system comprising one or more narrow band filters comprising slits followed by one or more detectors.