Circuit board testing device for uneven circuit boards
A circuit board tester and method that precisely aligns the probe plate and circuit board is disclosed. With a circuit board and probe plate mounting within a housing having a top and bottom, hinged together, at closure there may be slight misalignments of the two. By making one of the two plates floating, or laterally slideable with respect to each other, it is possible to make final alignment at closure. One of the two plates can be provided with a pin and the other with a pin receiving alignment block. With the lateral slideability, the pin and block can insure proper probe alignment. Additional systems for correcting misaligned pins or blocks are also disclosed.
1. A circuit tester for testing circuit boards having a housing; a first board mounting plate for receiving circuit board/unit under test (UUT); a retaining plate associated with a second part of said housing, said retaining plate having a plurality of retaining fingers oriented toward the UUT, said retaining fingers being generally orthogonally disposed in said plate and having an actuator for extending and retracting their length, said UUT and retaining plate being moveable toward each other, so that when said UUT and retaining plate are brought toward each other during circuit test, said retaining fingers are actuated to contact said UUT at differing heights according to the flatness of the board, and wherein said fingers are then locked against the UUT by engaging locking the actuator against further length change of the fingers and including a lock for locking said retaining fingers from sliding generally orthogonally toward the plates when they are in the locked position.
2. The tester of claim 1 wherein the apertures, when collinearly aligned are equal to or greater than the diameter of the fingers and when not collinearly aligned are less than the finger diameter.
3. The tester of claim 1 wherein the apertures on one of the plates are non-round.
4. The tester of claim 1 wherein the locking plate moves laterally and the finger plate is laterally static.
5. The tester of claim 1 wherein the fingers include a barrel portion and wherein at least a portion of the barrel passes through the apertures and where that portion includes an area of increased friction.
6. The tester of claim 1 wherein said area of increased friction includes a knurled portion.
7. The tester of claim 1 wherein said area of increased friction includes a high friction coating.
8. The tester of claim 1 wherein said push fingers include a central core pin and a collet surrounding said pin and wherein said core pin is locked by compression of the collet.
9. The tester of claim 1 where said fingers include an actuator which extends and retracts the length of the finger in response to force applied.
10. The tester of claim 9 wherein the force is selected from the group of: pneumatic, hydraulic, electric or electromagnetic forces.
11. The tester of claim 1 wherein said fingers further include a stop at their end most proximate finger plate, said stop configured to prevent the pin from passing completely thru the plate.
12. A circuit tester for testing circuit boards having a housing; a first board mounting plate for receiving circuit board/unit under test (UUT); a retaining plate associated with a second part of said housing, said retaining plate having a plurality of retaining fingers oriented toward the UUT, said retaining fingers being generally orthogonally disposed in said plate and having an actuator for extending and retracting their length, said UUT and retaining plate being moveable toward each other, so that when said UUT and retaining plate are brought toward each other during circuit test, said retaining fingers are actuated to contact said UUT at differing heights according to the flatness of the board, and wherein said fingers are then locked against the UUT by engaging locking the actuator against further length change of the fingers.
13. A circuit tester for testing circuit boards having a housing; a first board mounting plate for receiving circuit board/unit under test (UUT); a retaining plate associated with a second part of said housing, said retaining plate having a plurality of retaining fingers oriented toward the UUT, said retaining fingers being generally orthogonally slideable and lockable in said plate, said UUT and retaining plate being moveable toward each other, a locking plate for engaging said fingers and locking its orthogonal position relative to the retaining plate, so that when said UUT and retaining plate are brought toward each other during circuit test, said retaining fingers are allowed to engage the UUT at differing heights according to the flatness of the board, and wherein said fingers are then locked against the UUT by engaging said locking plate.