IP Library Granted Patent US 9,795,036
Granted Patent B2
US 9,795,036 · App. 14/396,297 · Granted Oct 17, 2017

Mounting structure and method for manufacturing same

Inventors: Arata Kishi (Osaka, JP); Hironori Munakata (Osaka, JP); Koji Motomura (Osaka, JP); Hiroki Maruo (Osaka, JP)
Assignee: PANASONIC INTELLECTUAL PROPERTY MANAGEMENT CO., LTD.
H05K1/181H01L24/16H01L24/17H01L24/32H01L24/73H01L24/81H01L24/83H01L24/92H05K3/3436H05K3/3463H01L24/13H01L24/29H01L2224/10156H01L2224/16238H01L2224/293H01L2224/2929H01L2224/32052H01L2224/32057H01L2224/32225H01L2224/73203H01L2224/81052H01L2224/8159H01L2224/81191H01L2224/81609H01L2224/81611H01L2224/81613H01L2224/81639H01L2224/81647H01L2224/81815H01L2224/81935H01L2224/81951H01L2224/81986H01L2224/83104H01L2224/83192H01L2224/9211H01L2224/92125H01L2924/014H01L2924/0132H01L2924/0133H01L2924/01322H01L2924/384H05K3/3484H05K2201/10734H05K2201/10977H05K2201/10992H05K2201/2009H05K2201/2036H05K2201/2045Y02P70/613
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Quick Facts
Patent No.
US 9,795,036
App. No.
14/396,297
Granted
Oct 17, 2017
Kind
B2
Abstract

A mounting structure includes a bonding material ( 106 ) that bonds second electrodes ( 104 ) of a circuit board ( 105 ) and bumps ( 103 ) of a semiconductor package ( 101 ), the bonding material ( 106 ) being surrounded by a first reinforcing resin ( 107 ). Moreover, a portion between the outer periphery of the semiconductor package ( 101 ) and the circuit board ( 105 ) is covered with a second reinforcing resin ( 108 ). Even if the bonding material ( 106 ) is a solder material having a lower melting point than a conventional bonding material, high drop resistance is obtained.

Claims (25)

1. A mounting structure, comprising:

a semiconductor package having first electrodes;

a circuit board having second electrodes;

a bonding material containing solder that is disposed between the second electrode and a bump formed on the first electrode and electrically bonds the bump and the second electrode;

a first reinforcing resin covering a circumference of the bonding material; and

a second reinforcing resin covering a portion between an outer periphery of the semiconductor package disposed on the circuit board and the circuit board,

wherein a relationship is established: a melting point of the bump>a hardening reaction starting temperature of the second reinforcing resin≧a hardening reaction starting temperature of the first reinforcing resin>a melting point of the bonding material, and

the first reinforcing resin and the second reinforcing resin do not contact each other.

2. The mounting structure according to claim 1 , wherein the bump contains a solder material.

3. The mounting structure according to claim 1 , wherein the first reinforcing resin and the second reinforcing resin are in contact with each other.

4. The mounting structure according to claim 1 , wherein the first reinforcing resin and the second reinforcing resin contain resin components with an identical composition and contain different curing agents.

5. The mounting structure according to claim 1 , wherein the bump has an alloy composition of a Sn material, and the bonding material is a Sn material.

6. The mounting structure according to claim 1 , wherein the bump has an alloy composition of SnAgCu solder, and the bonding material is a SnBi material.

7. The mounting structure according to claim 1 , wherein

a temperature difference between a melting point of the bonding material and hardening reaction starting temperatures of the first reinforcing resin and the second reinforcing resin is 2° C. to 17° C.

8. The mounting structure according to claim 1 , wherein the second reinforcing resin contacts the semiconductor package and the circuit board.

9. The mounting structure according to claim 1 , wherein the first reinforcing resin and the second reinforcing resin comprise a thermosetting resin and a curing agent.

10. A mounting structure comprising:

a semiconductor package having first electrodes;

a circuit board having second electrodes;

a bonding material containing solder that is disposed between the second electrode and a bump formed on the first electrode and electrically bonds the bump and the second electrode;

a first reinforcing resin covering a circumference of the bonding material; and

a second reinforcing resin covering a portion between an outer periphery of the semiconductor package disposed on the circuit board and the circuit board,

wherein a relationship is established: a melting point of the bump>a hardening reaction starting temperature of the second reinforcing resin≧a hardening reaction starting temperature of the first reinforcing resin>a melting point of the bonding material, and

a difference between a hardening reaction starting temperature of the first reinforcing resin and a hardening reaction starting temperature of the second reinforcing resin is 5° C. to 15° C.

Assignments (2)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Feb 18, 2015
From: PANASONIC CORPORATION
To: PANASONIC INTELLECTUAL PROPERTY MANAGEMENT CO., LTD.
Reel/Frame 035045/0413 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Nov 27, 2014
From: KISHI, ARATA; MUNAKATA, HIRONORI; MOTOMURA, KOJI; MARUO, HIROKI
To: PANASONIC CORPORATION
Reel/Frame 034275/0778 →
Priority Claims (1)
JP 2012-108063 · May 10, 2012 · national
Continuity (1)
Related Publication 20150116970A1 · Apr 30, 2015