IP Library Granted Patent US 9,802,830
Granted Patent B2
US 9,802,830 · App. 14/837,071 · Granted Oct 31, 2017

Molecular sieve SSZ-91

Inventors: Adeola Florence Ojo (Pleasant Hill, CA); Dan Xie (Richmond, CA); Yihua Zhang (Albany, CA); Guan-Dao Lei (Walnut Creek, CA)
Assignee: Chevron U.S.A. Inc.
C01B39/023B01J29/703B01J29/7023B01J29/7034B01J29/7446B01J29/7461B01J29/80B01J35/002C01B39/46C01B39/48C01P2004/54
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Quick Facts
Patent No.
US 9,802,830
App. No.
14/837,071
Granted
Oct 31, 2017
Kind
B2
Abstract

A family of new crystalline molecular sieves designated SSZ-91 is disclosed. Molecular sieve SSZ-91 is structurally similar to sieves falling within the ZSM-48 family of molecular sieves, and is characterized as: (1) having a low degree of faulting, (2) a low aspect ratio that inhibits hydrocracking as compared to conventional ZSM-48 materials having an aspect ratio of greater than 8, and (3) is substantially phase pure.

Claims (132)

1. A molecular sieve belonging to the ZSM-48 family of zeolites, wherein the molecular sieve comprises:

a silicon oxide to aluminum oxide mole ratio of 40 to 200,

at least 70% polytype 6 of the total ZSM-48 family material present in the product, and

an additional EUO framework molecular sieve phase in an amount of between 0 and 3.5 percent by weight of the total product; and

wherein the molecular sieve has a morphology characterized as polycrystalline aggregates comprising crystallites collectively having an average aspect ratio of between 1 and 8.

2. The molecular sieve of claim 1 , wherein the molecular sieve has, in its as-synthesized form, an X-ray diffraction pattern substantially as shown in the following Table:

2-Theta

d-spacing (nm)

Relative Intensity(*)

7.55 ± 0.20

1.170

W

8.71 ± 0.20

1.015

W

12.49 ± 0.20 

0.708

W

15.12 ± 0.20 

0.586

W

21.18 ± 0.20 

0.419

VS

22.82 ± 0.20 

0.390

VS

24.62 ± 0.20 

0.361

W

26.39 ± 0.20 

0.337

W

29.03 ± 0.20 

0.307

W

31.33 ± 0.20 

0.285

W

(*)Relative intensity scale in which the strongest line in the X-ray diffraction pattern is assigned a value of 100, wherein: W = weak (>0 to 20); M = medium (>20 to 40); S = strong (>40 to 60); VS = very strong (>60 to 100).

3. The molecular sieve of claim 1 , wherein the molecular sieve has a silicon oxide to aluminum oxide mole ratio of 70 to 160.

4. The molecular sieve of claim 3 , wherein the molecular sieve comprises at least 80% polytype 6 of the total ZSM-48 family material present in the product.

5. The molecular sieve of claim 3 , wherein the molecular sieve comprises at least 90% polytype 6 of the total ZSM-48 family material present in the product.

6. The molecular sieve of claim 3 , wherein the crystallites collectively have an average aspect ratio of between 1 and 5.

7. The molecular sieve of claim 3 , wherein the crystallites collectively have an average aspect ratio of between 1 and 3.

8. The molecular sieve of claim 3 , wherein the molecular sieve comprises between 0.1 and 2 wt. % EUO framework molecular sieve.

9. The molecular sieve of claim 3 , wherein the molecular sieve comprises between 0.1 and 1 wt. % EUO framework molecular sieve.

10. The molecular sieve of claim 3 , wherein the molecular sieve comprises between 0.1 and 2 wt. % EU-1.

11. The molecular sieve of claim 3 , wherein the molecular sieve comprises between 0.1 and 1 wt. % EU-1.

12. The molecular sieve of claim 1 , wherein the molecular sieve has a silicon oxide to aluminum oxide mole ratio of 80 to 140.

13. The molecular sieve of claim 12 , wherein the molecular sieve comprises at least 80% polytype 6 of the total ZSM-48 family material present in the product.

14. The molecular sieve of claim 12 , wherein the molecular sieve comprises at least 90% polytype 6 of the total ZSM-48 family material present in the product.

15. The molecular sieve of claim 12 , wherein the crystallites collectively have an average aspect ratio of between 1 and 5.

16. The molecular sieve of claim 12 , wherein the crystallites collectively have an average aspect ratio of between 1 and 3.

17. The molecular sieve of claim 12 , wherein the molecular sieve comprises between 0.1 and 2 wt. % EUO framework molecular sieve.

18. The molecular sieve of claim 12 , wherein the molecular sieve comprises between 0.1 and 1 wt. % EUO framework molecular sieve.

19. The molecular sieve of claim 12 , wherein the molecular sieve comprises between 0.1 and 2 wt. % EU-1.

20. The molecular sieve of claim 12 , wherein the molecular sieve comprises between 0.1 and 1 wt. % EU-1.

21. The molecular sieve of claim 1 , wherein the molecular sieve comprises at least 80% polytype 6 of the total ZSM-48 family material present in the product.

22. The molecular sieve of claim 1 , wherein the molecular sieve comprises at least 90% polytype 6 of the total ZSM-48 family material present in the product.

23. The molecular sieve of claim 1 , wherein the crystallites collectively have an average aspect ratio of between 1 and 5.

24. The molecular sieve of claim 1 , wherein the crystallites collectively have an average aspect ratio of between 1 and 3.

25. The molecular sieve of claim 1 , wherein the molecular sieve comprises between 0.1 and 2 wt. % EUO framework molecular sieve.

26. The molecular sieve of claim 1 , wherein the molecular sieve comprises between 0.1 and 1 wt. % EUO framework molecular sieve.

27. A method of preparing the molecular sieve of claim 1 , comprising:

(a) preparing a reaction mixture containing:

at least one source of silicon,

at least one source of aluminum,

at least one source of an element selected from Groups 1 and 2 of the Periodic Table,

hydroxide ions,

hexamethonium cations, and

water; and

(b) subjecting the reaction mixture to crystallization conditions sufficient to form crystals of the molecular sieve.

28. The method of claim 27 , wherein the molecular sieve is SSZ-91 and has, in its as-synthesized form, the X-ray diffraction pattern substantially as shown in the following Table:

2-Theta

d-spacing (nm)

Relative Intensity(*)

7.55 ± 0.20

1.170

W

8.71 ± 0.20

1.015

W

12.49 ± 0.20 

0.708

W

15.12 ± 0.20 

0.586

W

21.18 ± 0.20 

0.419

VS

22.82 ± 0.20 

0.390

VS

24.62 ± 0.20 

0.361

W

26.39 ± 0.20 

0.337

W

29.03 ± 0.20 

0.307

W

31.33 ± 0.20 

0.285

W

(*)Relative intensity scale in which the strongest line in the X-ray diffraction pattern is assigned a value of 100, wherein: W = weak (>0 to 20); M = medium (>20 to 40); S = strong (>40 to 60); VS = very strong (>60 to 100).

29. The method of claim 27 , wherein the molecular sieve is prepared from a reaction mixture comprising, in terms of mole ratios, the following:

SiO 2 /Al 2 O 3

 50-220

M/SiO 2

0.05-1.0 

Q/SiO 2

0.01-0.2 

OH/SiO 2

0.05-0.4 

H 2 O/SiO 2

 3-100

wherein M is selected from the group consisting of elements from Groups 1 and 2 of the Periodic Table; and Q is a hexamethonium cation.

30. The method of claim 27 , wherein the molecular sieve is prepared from a reaction mixture comprising, in terms of mole ratios, the following:

SiO 2 /Al 2 O 3

 85-180

M/SiO 2

0.1-0.8

Q/SiO 2

0.02-0.1 

OH/SiO 2

0.10-0.3 

H 2 O/SiO 2

10-50

wherein M is selected from the group consisting of elements from Groups 1 and 2 of the Periodic Table; and Q is a hexamethonium cation.

Assignments (2)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Apr 21, 2020
From: OJO, ADEOLA FLORENCE; XIE, DAN; ZHANG, YIHUA; LEI, GUAN-DAO
To: CHEVRON U.S.A. INC.
Reel/Frame 052452/0801 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Aug 27, 2015
From: OJO, ADEOLA FLORENCE; XIE, DAN; ZHANG, YIHUA; LEI, GUAN-DAO
To: CHEVRON U.S.A. INC.
Reel/Frame 036436/0875 →
Continuity (1)
Related Publication 20170056868A1 · Mar 2, 2017