IP Library Granted Patent US 9,837,447
Granted Patent B2
US 9,837,447 · App. 14/281,182 · Granted Dec 5, 2017

Thin film transistor array panel and manufacturing method thereof

Inventors: Seung Hyun Park (Seoul, KR); Jun Ho Song (Seongnam-si, KR); Jean Ho Song (Yongin-si, KR); Jae Hak Lee (Suwon-si, KR)
Assignee: SAMSUNG DISPLAY CO., LTD.
H01L27/1244G02F1/134363G02F1/136227H01L27/1248H01L27/1259H01L27/1225
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Quick Facts
Patent No.
US 9,837,447
App. No.
14/281,182
Granted
Dec 5, 2017
Kind
B2
Abstract

A thin film transistor array panel according to an exemplary embodiment of the invention includes: an insulating substrate; a gate line disposed on the insulating substrate and including a gate pad portion; a data line insulated from and crossing the gate line, and including a source electrode and a data pad portion; a drain electrode facing the source electrode; an organic insulating layer disposed on the data line and the drain electrode, and including a first contact hole; a common electrode disposed on the organic insulating layer, and including a second contact hole; a passivation layer disposed on the common electrode, and including a third contact hole; and a pixel electrode disposed on the passivation layer, and being in contact with the drain electrode, in which the third contact hole is disposed to be adjacent to one surface of the first contact hole for improvement of an aperture ratio and a stable electrode connection.

Claims (43)

1. A thin film transistor array panel, comprising:

an insulating substrate;

a gate line disposed on the insulating substrate and comprising a gate pad portion;

a data line insulated from and crossing the gate line, and comprising a source electrode and a data pad portion;

a drain electrode facing the source electrode;

an organic insulating layer disposed on the data line and the drain electrode, wherein a first contact hole is defined through the organic insulating layer;

a common electrode disposed on the organic insulating layer, wherein a second contact hole is defined through the common electrode;

a passivation layer disposed on the common electrode, wherein a third contact hole is defined through the passivation layer; and

a pixel electrode disposed on the passivation layer, and in contact with the drain electrode,

wherein the third contact hole is disposed to be adjacent to one surface of the first contact hole, and

wherein the pixel electrode does not contact at least one surface of the third contact hole.

2. The thin film transistor array panel of claim 1 , wherein

the first contact hole is smaller than the second contact hole,

the third contact hole is smaller than the second contact hole, and

a portion of the third contact hole overlaps the drain electrode.

3. The thin film transistor array panel of claim 1 , wherein

the third contact hole exposes one end of the drain electrode.

4. The thin film transistor array panel of claim 3 , wherein

a surface of the third contact hole partially overlaps the organic insulating layer.

5. The thin film transistor array panel of claim 4 , wherein

a distance between one surface of the third contact hole, which does not overlap the organic insulating layer, and a surface of the first contact hole facing the one surface of the third contact hole, and a distance between a remaining surface of the third contact hole and a surface of the first contact hole facing the remaining surface of the third contact hole satisfy the following inequation:

A > 1.2× B,

wherein

A denotes the distance between the one surface of the third contact hole and the surface of the first contact hole facing the one surface of the third contact hole, and

B denotes the distance between the remaining surface of the third contact hole and the surface of the first contact hole facing the remaining surface of the third contact hole.

6. The thin film transistor array panel of claim 5 , wherein

the distance between the one surface of the third contact hole and the surface of the first contact hole facing the one surface of the third contact hole is in a range of about 1 micrometer to about 6 micrometers.

7. The thin film transistor array panel of claim 3 , wherein

three surfaces of the third contact hole overlap the organic insulating layer.

8. The thin film transistor array panel of claim 5 , wherein

a length of an overlapping portion of the third contact hole and the drain electrode is in a range of about 1 micrometer to about 6 micrometers.

9. The thin film transistor array panel of claim 1 , wherein

the drain electrode extends substantially in a direction to partially overlap the organic insulating layer and the common electrode.

10. The thin film transistor array panel of claim 9 , wherein

the third contact hole is disposed in a direction opposite to the direction in which the drain electrode extends.

11. The thin film transistor array panel of claim 10 , wherein

the pixel electrode overlaps one surface of the third contact hole.

12. The thin film transistor array panel of claim 1 , wherein

a fourth contact hole, through which a portion of the gate pad portion is exposed, is defined through the organic insulating layer, and

a fifth contact hole, through which a portion of the data pad portion is exposed, is defined through the organic insulating layer.

13. The thin film transistor array panel of claim 1 , wherein

one of the common electrode and the pixel electrode is a plane-shaped electrode, and

the other of the common electrode and the pixel electrode is a branch electrode.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded May 19, 2014
From: PARK, SEUNG HYUN; SONG, JUN HO; SONG, JEAN HO; LEE, JAE HAK
To: SAMSUNG DISPLAY CO., LTD.
Reel/Frame 032928/0329 →
Priority Claims (1)
KR 10-2013-0132962 · Nov 4, 2013 · national
Continuity (1)
Related Publication 20150123113A1 · May 7, 2015