IP Library Granted Patent US 9,871,165
Granted Patent B2
US 9,871,165 · App. 15/601,890 · Granted Jan 16, 2018

Advanced electronic device structures using semiconductor structures and superlattices

Inventors: Petar Atanackovic (Henley Beach South, AU); Matthew Godfrey (Sydney, AU)
Assignee: The Silanna Group Pty Ltd
H01L33/06H01L21/0242H01L21/0251H01L21/0254H01L21/02381H01L21/02389H01L21/02458H01L21/02472H01L21/02483H01L21/02507H01L21/02554H01L21/02565H01L27/15H01L33/007H01L33/10H01L33/14H01L33/16H01L33/18H01L33/32
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Quick Facts
Patent No.
US 9,871,165
App. No.
15/601,890
Granted
Jan 16, 2018
Kind
B2
Abstract

Semiconductor structures and methods for forming those semiconductor structures are disclosed. For example, a p-type or n-type semiconductor structure is disclosed. The semiconductor structure has a polar crystal structure with a growth axis that is substantially parallel to a spontaneous polarization axis of the polar crystal structure. The semiconductor structure changes in composition from a wider band gap (WBG) material to a narrower band gap (NBG) material or from a NBG material to a WBG material along the growth axis to induce p-type or n-type conductivity.

Claims (28)

1. A method of forming a p-type or n-type semiconductor structure, the method comprising:

growing along a growth axis a semiconductor having a polar crystal structure, the growth axis being substantially parallel to a spontaneous polarization axis of the polar crystal structure; and

changing a composition of the semiconductor monotonically from a wider band gap (WBG) material to a narrower band gap (NBG) material or from a NBG material to a WBG material along the growth axis to induce p-type or n-type conductivity.

2. The method of claim 1 , wherein the composition of the semiconductor comprises:

at least two types of metal atom cations; and

a non-metal atom anion.

3. The method of claim 2 , wherein the non-metal atom anion is nitrogen or oxygen.

4. The method of claim 2 , wherein changing the composition of the semiconductor comprises: changing a molar fraction of one or more of the at least two types of metal atom cations in the composition along the growth axis.

5. The method of claim 1 , wherein the p-type conductivity is induced by:

growing the semiconductor with a cation-polar crystal structure and changing the composition of the semiconductor monotonically from a WBG material to a NBG material along the growth axis; or

growing the semiconductor with an anion-polar crystal structure and changing the composition of the semiconductor monotonically from a NBG material to a WBG material along the growth axis.

6. The method of claim 1 , wherein the n-type conductivity is induced by:

growing the semiconductor with a cation-polar crystal structure and changing the composition of the semiconductor monotonically from a NBG material to a WBG material along the growth axis; or

growing the semiconductor with an anion-polar crystal structure and changing the composition of the semiconductor monotonically from a WBG material to a NBG material along the growth axis.

7. The method of claim 1 , wherein the polar crystal structure is a polar wurtzite crystal structure.

8. The method of claim 1 , wherein the composition of the semiconductor is changed in a stepwise manner along the growth axis.

9. The method of any claim 1 , wherein the composition of the semiconductor is selected from group-III metal nitride compositions.

10. The method of claim 1 , wherein the composition of the semiconductor is selected from the following:

aluminium gallium nitrides (Al x Ga 1-x N) where 0≦x≦1;

aluminium gallium indium nitrides (Al x Ga y In 1-x-y N) where 0≦x≦1, 0≦y≦1 and 0≦(x+y)≦1; and

magnesium zinc oxides (Mg x Zn x-1 O) where 0≦x≦1.

11. The method of claim 1 , further comprising:

including impurity dopants in the composition of the semiconductor to enhance the induced p-type or n-type conductivity.

12. A method of forming a complex semiconductor structure, the method comprising: forming two or more contiguous semiconductor structures and/or semiconductor superlattices, wherein the contiguous semiconductor structures and/or semiconductor superlattices are each formed according to the method of claim 1 .

13. The method of claim 12 , further comprising flipping a polarity-type of material between two of the two or more contiguous semiconductor structures.

14. The method of claim 12 , wherein a first of the two or more contiguous semiconductor structures has a larger change in composition along the growth axis and a second of the two or more contiguous semiconductor structures has a smaller change in composition along the growth axis.

15. A p-type or n-type semiconductor structure having a polar crystal structure with a growth axis that is substantially parallel to a spontaneous polarization axis of the polar crystal structure, the semiconductor structure having an induce p-type or n-type conductivity resulting from a monotonic change in composition from a wider band gap (WBG) material to a narrower band gap (NBG) material or from a NBG material to a WBG material along the growth axis.

16. A complex semiconductor structure comprising two or more contiguous semiconductor structures in accordance with claim 15 .

Assignments (3)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Apr 10, 2018
From: THE SILANNA GROUP PTY LTD
To: SILANNA UV TECHNOLOGIES PTE LTD
Reel/Frame 045878/0016 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded May 23, 2017
From: ATANACKOVIC, PETAR; GODFREY, MATTHEW
To: SILANNA SEMICONDUCTOR PTY LTD
Reel/Frame 042484/0151 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded May 23, 2017
From: SILANNA SEMICONDUCTOR PTY LTD
To: THE SILANNA GROUP PTY LTD
Reel/Frame 042484/0154 →
Priority Claims (1)
AU 2014902008 · May 27, 2014 · national
Continuity (2)
Division 14976337
Related Publication 20170263813A1 · Sep 14, 2017