IP Library Granted Patent US 9,897,705
Granted Patent B2
US 9,897,705 · App. 14/989,242 · Granted Feb 20, 2018

Radiation detector, scintillator panel, and method for manufacturing the same

Inventors: Hiroshi Horiuchi (Ootawara, JP); Hiroshi Aida (Ootawara, JP); Atsuya Yoshida (Ootawara, JP)
Assignee: Toshiba Electron Tubes & Devices Co., Ltd.
G01T1/2023C09K11/628C23C14/34C30B23/02C30B23/08C30B25/02C30B25/06C30B29/10G01T1/202G01T1/2018G21K2004/12
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Quick Facts
Patent No.
US 9,897,705
App. No.
14/989,242
Granted
Feb 20, 2018
Kind
B2
Abstract

According to the embodiment, a radiation detector includes a photoelectric conversion substrate converting light to an electrical signal and a scintillator layer being in contact with the photoelectric conversion substrate and converting externally incident radiation to light. The scintillator layer is made of a phosphor containing Tl as an activator in CsI, which is a halide. A concentration of the activator in the phosphor is 1.6 mass %±0.4 mass %, and a concentration distribution of the activator in an in-plane direction and a film thickness direction is within ±15%.

Claims (21)

1. A radiation detector comprising:

a photoelectric conversion substrate converting light to an electrical signal; and

a scintillator layer being in contact with the photoelectric conversion substrate and converting externally incident radiation to light,

the scintillator layer being made of a phosphor containing Tl as an activator in CsI, which is a halide, a concentration of the activator in the phosphor being 1.6 mass %±0.4 mass %, a concentration distribution of the activator in an in-plane direction being within ±15%, and a concentration distribution of the activator in a film thickness direction being within ±15%.

2. The radiation detector according to claim 1 , wherein in the scintillator layer, the concentration distribution of the activator in the in-plane direction is ±15% or less in a region of a unit film thickness of 200 nm or less and the concentration distribution of the activator in the film thickness direction is ±15% or less in the region of the unit film thickness of 200 nm or less.

3. The radiation detector according to claim 1 , wherein the scintillator layer has a columnar crystal structure.

4. A method for manufacturing a radiation detector including a photoelectric conversion substrate converting light to an electrical signal and a scintillator layer being in contact with the photoelectric conversion substrate and converting externally incident radiation to light,

the scintillator layer being made of a phosphor containing Tl as an activator in CsI, which is a halide,

the method comprising:

forming the scintillator layer by a vapor phase growth technique using a material source of CsI and Tl, a concentration of the activator in the phosphor being 1.6 mass %±0.4 mass %, a concentration distribution of the activator in an in-plane direction being within ±15, and a concentration distribution of the activator in a film thickness direction being within ±15%.

5. A scintillator panel comprising:

a support substrate transmissive to radiation; and

a scintillator layer being in contact with the support substrate and converting externally incident radiation to light,

the scintillator layer being made of a phosphor containing Tl as an activator in CsI, which is a halide, a concentration of the activator in the phosphor being 1.6 mass %±0.4 mass %, a concentration distribution of the activator in an in-plane direction being within ±15%, and a concentration distribution of the activator in a film thickness direction being within ±15%.

6. The scintillator panel according to claim 5 , wherein in the scintillator layer, the concentration distribution of the activator in the in-plane direction is ±15% or less in a region of a unit film thickness of 200 nm or less and the concentration distribution of the activator in the film thickness direction is ±15% or less in the region of the unit film thickness of 200 nm or less.

7. The scintillator panel according to claim 5 , wherein the scintillator layer has a columnar crystal structure.

8. The scintillator panel according to claim 5 , wherein the support substrate is formed from a material composed primarily of a light element rather than a transition metal element.

9. A method for manufacturing a scintillator panel including a support substrate transmissive to radiation and a scintillator layer being in contact with the support substrate and converting externally incident radiation to light,

the scintillator layer being made of a phosphor containing Tl as an activator in CsI, which is a halide,

the method comprising:

forming the scintillator layer by a vapor phase growth technique using a material source of CsI and Tl, a concentration of the activator in the phosphor is 1.6 mass %±0.4 mass %, a concentration distribution of the activator in an in-plane direction and a film thickness direction being within ±15%, and a concentration distribution of the activator in a film thickness direction being within ±15%.

Assignments (3)
CHANGE OF NAME Recorded Dec 7, 2018
From: TOSHIBA ELECTRON TUBES & DEVICES CO., LTD.
To: CANON ELECTRON TUBES & DEVICES CO., LTD.
Reel/Frame 047701/0768 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jun 13, 2016
From: KABUSHIKI KAISHA TOSHIBA
To: TOSHIBA ELECTRON TUBES & DEVICES CO., LTD.
Reel/Frame 038896/0322 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Feb 1, 2016
From: HORIUCHI, HIROSHI; AIDA, HIROSHI; YOSHIDA, ATSUYA
To: KABUSHIKI KAISHA TOSHIBA; TOSHIBA ELECTRON TUBES & DEVICES CO., LTD.
Reel/Frame 037633/0668 →
Priority Claims (4)
JP 2013-147885 · Jul 16, 2013 · national
JP 2013-147886 · Jul 16, 2013 · national
JP 2013-252419 · Dec 5, 2013 · national
JP 2013-252420 · Dec 5, 2013 · national
Continuity (2)
Continuation PCTJP2014064036 · May 27, 2014
Related Publication 20160116607A1 · Apr 28, 2016