System and method for inspecting misalignment between display panel and film patterned retarder

1. A system for inspecting misalignment between a display panel and a film patterned retarder, comprising:

an inspection target panel including the display panel to which the film patterned retarder adheres;

a misalign inspector for imaging edge images of both sides of the inspection target panel and imaging a central part image of a pixel array of the inspection target panel, wherein the central part image has no align mark; and

a controller for analyzing an image received from the misalign inspector to measure a misalign degree between the film patterned retarder and the display panel,

wherein, the controller detects an edge from the central part image of the pixel array received from the misalign inspector using an edge detection filter to detect a pixel pattern,

measures a distance between a vertical direction center of the pixel pattern in one line of the display panel viewed in the central part image and an edge of neighboring retardation patterns of the film patterned retarder viewed in the central part image to store the measured distance as a first parameter A,

stores a vertical direction height from a top edge to a bottom edge of the retardation pattern overlapped with the one line viewed in the central part image of the pixel array as a second parameter B, and

calculates A−(B/2) and determines the calculated A−(B/2) as a misalign value.

2. The system of claim 1 , wherein the vertical direction height from the top edge to the bottom edge of the retardation pattern is previously set as a design value of the film patterned retarder.

3. The system of claim 1 , wherein the controller further measures a first interval between a center of a first align mark formed at a first edge of a first side of the display panel based on edge images of the inspection target panel received from the misalign inspector and a center line of the retardation patterns formed in the film patterned retarder, and

wherein the controller further measures a second interval between a center of a second align mark formed at a second edge of a second side of the display panel based on edge images of the inspection target panel received from the misalign inspector and a center line of the retardation patterns formed in the film patterned retarder,

wherein the center line of the retardation patterns formed in the film patterned retarder is a boundary line between the neighboring retardation patterns which are located in a center of the film patterned retarder.

4. A system for inspecting misalignment between a display panel and a film patterned retarder, comprising:

an inspection target panel including the display panel to which the film patterned retarder adheres;

a misalign inspector for imaging edge images of both sides of the inspection target panel and imaging a central part image of a pixel array of the inspection target panel, wherein the central part image has no align mark; and

a controller for analyzing an image received from the misalign inspector to measure a misalign degree between the film patterned retarder and the display panel,

wherein, the controller detects an edge from the central part image of the pixel array received from the misalign inspector using an edge detection filter to detect a pixel pattern,

measures a distance between a vertical direction center of the pixel pattern in one line of the display panel viewed in the central part image and an edge of neighboring retardation patterns of the film patterned retarder viewed in the central part image to store the measured distance as a first parameter A,

measures a vertical direction height from a top edge to a bottom edge of the retardation pattern overlapped with the one line viewed in the central part image of the pixel array as a second parameter B, and

calculates A−(B/2) and determines the calculated A−(B/2) as a misalign value.

5. The system of claim 4 , wherein the vertical direction height from the top edge to the bottom edge of the retardation pattern is previously set as a design value of the film patterned retarder.

6. The system of claim 4 , wherein the controller further measures a first interval between a center of a first align mark formed at a first edge of a first side of the display panel based on edge images of the inspection target panel received from the misalign inspector and a center line of the retardation patterns formed in the film patterned retarder, and

wherein the controller further measures a second interval between a center of a second align mark formed at a second edge of a second side of the display panel based on edge images of the inspection target panel received from the misalign inspector and a center line of the retardation patterns formed in the film patterned retarder,

wherein the center line of the retardation patterns formed in the film patterned retarder is a boundary line between the neighboring retardation patterns which are located in a center of the film patterned retarder.

7. A method of inspecting misalignment between a display panel and a film patterned retarder on an inspection target panel including the display panel to which the film patterned retarder adheres, the method comprising:

imaging edge images of both sides of the inspection target panel and imaging a central part image of a pixel array of the inspection target panel, wherein the central part image has no align mark; and

analyzing at least one image imaged from the inspection target panel to measure a misalign degree between the film patterned retarder and the display panel,

wherein, the measuring of the misalign degree comprises;

detecting an edge from the central part image of the pixel array using an edge detection filter to detect a pixel pattern,

measuring a distance between a vertical direction center of the pixel pattern in one line of the display panel viewed in the central part image and an edge of neighboring retardation patterns of the film patterned retarder viewed in the central part image to store the measured distance as a first parameter A,

storing a vertical direction height from a top edge to a bottom edge of the retardation pattern overlapped with the one line viewed in the central part image of the pixel array as a second parameter B, and

calculating A−(B/2) and determining the calculated A−(B/2) as a misalign value.

8. The method of claim 7 , wherein the vertical direction height from the top edge to the bottom edge of the retardation pattern is previously set as a design value of the film patterned retarder.

9. The method of claim 7 , wherein the measuring of the misalign degree further comprises;

measuring a first interval between a center of a first align mark formed at a first edge of a first side of the display panel based on edge images of the inspection target panel and a center line of the retardation patterns formed in the film patterned retarder; and

measuring a second interval between a center of a second align mark formed at a second edge of a second side of the display panel based on edge images of the inspection target panel received from the misalign inspector and a center line of the retardation patterns formed in the film patterned retarder,

wherein the center line of the retardation patterns formed in the film patterned retarder is a boundary line between the neighboring retardation patterns which are located in a center of the film patterned retarder.

10. A method of inspecting misalign between a display panel and a film patterned retarder on an inspection target panel including the display panel to which the film patterned retarder adheres, the method comprising:

imaging edge images of both sides of the inspection target panel and imaging a central part image of a pixel array of the inspection target panel, wherein the central part image has no align mark; and

analyzing at least one image imaged from the inspection target panel to measure the misalign degree between the film patterned retarder and the display panel,

wherein, the measuring of the misalign degree comprises;

detecting an edge from the central part image of the pixel array using an edge detection filter to detect a pixel pattern,

measuring a distance between a vertical direction center of the pixel pattern in one line of the display panel viewed in the central part image and an edge of neighboring retardation patterns of the film patterned retarder viewed in the central part image to store the measured distance as a first parameter A,

measuring a vertical direction height from a top edge to a bottom edge of the retardation pattern overlapped with the one line viewed in the central image of the pixel array as a second parameter B, and

calculating A−(B/2) and determining the calculated A−(B/2) as a misalign value.

11. The method of claim 10 , wherein the vertical direction height from the top edge to the bottom edge of the retardation pattern is previously set as a design value of the film patterned retarder.

12. The method of claim 10 , wherein the measuring of the misalign degree further comprises;

measuring a first interval between a center of a first align mark formed at a first edge of a first side of the display panel based on edge images of the inspection target panel and a center line of the retardation patterns formed in the film patterned retarder; and

measuring a second interval between a center of a second align mark formed at a second edge of a second side of the display panel based on edge images of the inspection target panel received from the misalign inspector and a center line of the retardation patterns formed in the film patterned retarder,

wherein the center line of the retardation patterns formed in the film patterned retarder is a boundary line between the neighboring retardation patterns which are located in a center of the film patterned retarder.