IP Library Granted Patent US 9,939,556
Granted Patent B2
US 9,939,556 · App. 15/008,392 · Granted Apr 10, 2018

Method for producing a reflection-reducing layer system and reflection-reducing layer system

Inventors: Ulrike Schulz (Jena, DE); Friedrich Rickelt (Jena, DE); Peter Munzert (Jena, DE); Hanno Heiβe (Jena, DE); Heiko Knopf (Jena, DE); Kevin Füchsel (Jena, DE); Norbert Kaiser (Jena, DE)
Assignee: Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V.
G02B1/118B05D1/60B05D3/145B29C59/14C23C14/06C23C14/10C23C14/12C23C14/28C23C14/32G02B1/111G02B1/14
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Quick Facts
Patent No.
US 9,939,556
App. No.
15/008,392
Granted
Apr 10, 2018
Kind
B2
Abstract

A method for producing a reflection-reducing layer system on a substrate and a reflection-reducing layer system are disclosed. According to an embodiment the method includes depositing a refractive index gradient layer on the substrate by co-evaporation of an inorganic material and an organic material, wherein the refractive index gradient layer has a refractive index which decreases in a growth direction, depositing an organic layer above the refractive index gradient layer, and producing a nanostructure in the organic layer by a plasma etching process.

Claims (14)

1. A method for producing a reflection-reducing layer system on a substrate, the method comprising:

depositing a refractive index gradient layer on the substrate by coevaporation of an inorganic material and an organic material, wherein the refractive index gradient layer has a refractive index which decreases in a growth direction;

depositing an organic layer above the refractive index gradient layer; and

producing a nanostructure in the organic layer by a plasma etching process.

2. The method according to claim 1 , wherein the nanostructure has a plurality of structure elements whose heights are on average between 80 nm and 130 nm and whose spacings are on average less than 100 nm.

3. The method according to claim 1 , wherein the inorganic material of the refractive index gradient layer has a refractive index n 1 where 1.37≤n 1 ≤1.46, and wherein the organic material of the refractive index gradient layer has a refractive index n 2 >n 1 where 1.6≤n 2 ≤1.9.

4. The method according to claim 1 , wherein the refractive index of the refractive index gradient layer at an interface with the substrate is matched to a refractive index of the substrate.

5. The method according to claim 1 , wherein the organic material is a UV-absorbing material.

6. The method according to claim 1 , wherein the organic layer has at least regionally an effective refractive index of between 1.05 and 1.38.

7. The method according to claim 1 , further comprising, prior to depositing the organic layer, depositing an inorganic intermediate layer on the refractive index gradient layer.

8. The method according to claim 1 , further comprising, after producing the nanostructure, applying a protective layer having a thickness of between 10 nm and 50 nm to the nanostructure.

9. The method according to claim 1 , wherein the entire reflection-reducing layer system is produced in a vacuum process.

10. The method according to claim 1 , wherein the organic layer is deposited by plasma ion assisted deposition using a plasma ion source, and wherein the nanostructure is subsequently produced by increasing the ion energy and/or changing a process gas of the plasma ion source.

11. The method according to claim 1 , wherein the organic layer comprises melamine.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Apr 4, 2016
From: SCHULZ, ULRIKE; RICKELT, FRIEDRICH; MUNZERT, PETER; HEISSE, HANNO; KNOPF, HEIKO; FÜCHSEL, KEVIN; KAISER, NORBERT
To: FRAUNHOFER-GESELLSCHAFT ZUR FOERDERUNG DER ANGEWANDTEN FORSCHUNG E.V.
Reel/Frame 038186/0404 →
Priority Claims (1)
DE 10 2015 101 135 · Jan 27, 2015 · national
Continuity (1)
Related Publication 20160216409A1 · Jul 28, 2016