IP Library Granted Patent US 10,034,652
Granted Patent B2
US 10,034,652 · App. 14/823,006 · Granted Jul 31, 2018

Detector assembly, computed tomography apparatus having the same and control method for the same

Inventors: Min Kook Cho (Hwaseong-si, KR); Byung Sun Choi (Yongin-si, KR)
Assignee: SAMSUNG ELECTRONICS CO., LTD.
A61B6/585A61B6/032A61B6/4241A61B6/4035A61B6/52
View Patent ↗
Loading inventors, assignments & file history…
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this patent's details
Quick Facts
Patent No.
US 10,034,652
App. No.
14/823,006
Granted
Jul 31, 2018
Kind
B2
Abstract

A computed tomography (CT) apparatus includes an X-ray source configured to generate X-rays; and a detector which is configured to detect the X-rays radiated by the X-ray source, and includes a counting detection region configured to generate X-ray data corresponding to the detected X-rays according to a photon counting method, and an integrative detection region which is configured to generate the X-ray data corresponding to the detected X-rays according to a charge integration method, and is formed on an outer portion of the counting detection region with respect to a rotation axis of a gantry.

Claims (31)

1. A computed tomography (CT) apparatus comprising:

an X-ray source configured to generate X-rays;

a detector which is configured to detect the X-rays radiated by the X-ray source, and comprises:

a counting detection region configured to generate X-ray data corresponding to the detected X-rays according to a photon counting method, and

an integrative detection region, which is configured to generate X-ray data corresponding to the detected X-rays according to a charge integration method, and is formed on an outer portion of the counting detection region with respect to a rotation axis of a gantry; and

an image processor configured to calculate a calibration function representing a relationship between the X-ray data acquired by the integrative detection region and the X-ray data acquired by the counting detection region, and obtain an image of an object by acquiring an object X-ray data from the counting detection region, acquiring an object X-ray data from the integrative detection region, and correcting the object X-ray data acquired from the counting detection region by scanning the object based on the calibration function,

wherein the image processor is further configured to calculate the calibration function based on the X-ray data which are acquired by the integrative detection region and the counting detection region in a first operation, and correct the object X-ray data acquired from the counting detection region that is acquired by scanning the object in a second operation which is different from the first operation and performed subsequent to the first operation,

the gantry includes a bore into which the object is moved for scanning, and

the first operation is performed by acquiring X-rays from the bore without any object located therein, to acquire the X-ray data to be used in a calculation of the calibration function.

2. The CT apparatus of claim 1 , wherein the detector further comprises:

detection modules which are arranged parallel to one another in a direction perpendicular to the rotation axis, and comprise the counting detection region and the integrative detection region which is formed at the outer portion of the counting detection region with respect to the rotation axis of the gantry.

3. The CT apparatus of claim 2 , wherein the detection modules comprise detector elements arranged in two-dimensional (2D) matrices.

4. The CT apparatus of claim 1 , further comprising:

a filter mounted between the X-ray source and the detector,

wherein at least one among a thickness and a material of the filter is adjustable, in a direction of the rotation axis or in a direction perpendicular to the rotation axis.

5. The CT apparatus of claim 1 , wherein the counting detection region is configured to detect the X-rays and generate the X-ray data, by differentiating the detected X-rays by energy bands.

6. The CT apparatus of claim 4 , wherein the filter has at least one among a variable thickness and a variable material in the direction perpendicular to the rotation axis, and

the image processor is further configured to calculate the calibration function based on the X-ray data generated by acquiring X-rays, which penetrate the at least one among the variable thickness and the variable material of the filter and are incident on the integrative detection region, and acquiring X-rays, which penetrate the at least one among the variable thickness and the variable material of the filter and are incident on the counting detection region, so that the X-rays having a same beam quality are incident on the integrative detection region and the counting detection region.

7. The CT apparatus of claim 5 , wherein the detector comprises detector elements, and

each of the detector elements placed in the counting detection region comprises a number of comparators and counters in correspondence to a number of the energy bands.

8. A control method of a computed tomography (CT) apparatus comprising a detector, the control method comprising:

acquiring X-ray data from a counting detection region disposed in a center portion of the detector with respect to a rotation axis of a gantry including a bore;

acquiring X-ray data from an integrative detection region disposed on an outer portion of the detector with respect to the center portion, in a direction of the rotation axis;

calculating a calibration function representing a relationship between the X-ray data acquired by the integrative detection region and the X-ray data acquired by the counting detection region; and

obtaining an image of an object by acquiring an object X-ray data from the counting detection region, acquiring an object X-ray data from the integrative detection region, and correcting the object X-ray data acquired from the counting detection region by scanning the object based on the calibration function,

wherein the calculating the calibration function comprises:

calculating the calibration function based on the X-ray data which are acquired by the integrative detection region and the counting detection region in a first operation, and

correcting the object X-ray data acquired from the counting detection region that is acquired by scanning the object in a second operation which is different from the first operation and performed subsequent to the first operation, and

wherein the first operation is performed by acquiring X-rays from the bore without any object located therein, to acquire the X-ray data to be used in a calculation of the calibration function.

9. The control method of claim 8 , wherein the calculating the calibration function further comprises:

calculating the calibration function based on the X-ray data generated by acquiring X-rays having a same beam quality with respect to each other, among the X-rays incident on the counting detection region and the X-rays incident on the integrative detection region.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Aug 11, 2015
From: CHO, MIN KOOK; CHOI, BYUNG SUN
To: SAMSUNG ELECTRONICS CO., LTD
Reel/Frame 036295/0710 →
Priority Claims (1)
KR 10-2014-0194084 · Dec 30, 2014 · national
Continuity (1)
Related Publication 20160183906A1 · Jun 30, 2016
Cited By (2)
US 12,616,430 US 12,653,470