IP Library Granted Patent US 10,060,792
Granted Patent B2
US 10,060,792 · App. 15/116,893 · Granted Aug 28, 2018

Spectrometer, and spectrometer production method

Inventors: Takafumi Yokino (Hamamatsu, JP); Katsumi Shibayama (Hamamatsu, JP)
Assignee: HAMAMATSU PHOTONICS K.K.
G01J3/0256G01J3/021G01J3/0286G01J3/0289G01J3/0291G01J3/04G01J3/18G01J3/36
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Quick Facts
Patent No.
US 10,060,792
App. No.
15/116,893
Granted
Aug 28, 2018
Kind
B2
Abstract

A spectrometer includes a light detection element provided with a light passing part, a first light detection part, and a second light detection part, a support fixed to the light detection element such that a space is formed, a first reflection part provided in the support and configured to reflect light passing through the light passing part in the space, a second reflection part provided in the light detection element and configured to reflect the light reflected by the first reflection part in the space, and a dispersive part provided in the support and configured to disperse and reflect the light reflected by the second reflection part to the first light detection part in the space. A plurality of second light detection parts is disposed in a region surrounding the second reflection part.

Claims (27)

1. A spectrometer comprising:

a light detection element provided with a light passing part, a first light detection part, and a plurality of second light detection parts;

a support fixed to the light detection element such that a space is formed among the light passing part, the first light detection part, and the plurality of second light detection parts;

a first optical part provided in the support and configured to reflect light passing through the light passing part in the space;

a second optical part provided in the light detection element and configured to reflect the light reflected by the first optical part in the space; and

a third optical part provided in the support and configured to reflect the light reflected by the second optical part to the first light detection part in the space,

the second optical part or the third optical part disperses and reflects entered light in the space, and

the plurality of second light detection parts is disposed in a region surrounding the second optical part.

2. The spectrometer according to claim 1 ,

wherein the first optical pall is a first reflection part and configured to reflect the light passing through the light passing part in the space,

the second optical part is a second reflection part and configured to reflect the light reflected by the first reflection part in the space, and

the third optical part is a dispersive part and configured to disperse and reflect the light reflected by the second reflection part to the first light detection part in the space.

3. The spectrometer according to claim 1 ,

wherein the first optical part is a first reflection part and configured to reflect the light passing through the light passing part in the space,

the second optical part is a dispersive part and configured to disperse and reflect the light reflected by the first reflection part in the space, and

the third optical part is a second reflection part and configured to reflect the light dispersed and reflected by the dispersive part to the first light detection part in the space.

4. The spectrometer according to claim 1 ,

wherein the light passing part, the first optical part, the second optical part, the third optical part, and the first light detection part are arranged along a reference line when viewed in an optical axis direction of the light passing through the light passing part, and

the plurality of second light detection parts opposes each other with the second optical part interposed therebetween in each of a direction parallel to the reference line and a direction perpendicular to the reference line when viewed in the optical axis direction.

5. The spectrometer according to claim 1 , wherein the plurality of second light detection parts is arranged along an outer edge of the second optical part to surround the second optical part.

6. The spectrometer according to claim 1 , wherein the plurality of second, light detection parts is arranged in a two-dimensional shape in the region surrounding the second optical part.

7. The spectrometer according to claim 1 ,

wherein the support is provided with a wiring electrically connected to the first light detection part and the plurality of second light detection parts, and

an end part of the wiring on a side of the first light detection part and the plurality of second light detection parts is connected to a terminal provided in the light detection element in a fixed part of the light detection element and the support.

8. The spectrometer according to claim 1 , wherein a material of the support is ceramic.

9. The spectrometer according to claim 1 , wherein the space is airtightly scaled by a package including the light detection element and the support as components.

10. The spectrometer according to claim 1 , wherein the space is airtightly sealed by a package accommodating the light detection element and the support.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Aug 26, 2016
From: YOKINO, TAKAFUMI; SHIBAYAMA, KATSUMI
To: HAMAMATSU PHOTONICS K.K.
Reel/Frame 039549/0474 →
Priority Claims (1)
JP 2014-020667 · Feb 5, 2014 · national
Continuity (1)
Related Publication 20170167917A1 · Jun 15, 2017