IP Library Granted Patent US 10,079,985
Granted Patent B2
US 10,079,985 · App. 15/145,168 · Granted Sep 18, 2018

Microscope system

Inventor: Daiki Matsubara (Tokyo, JP)
Assignee: OLYMPUS CORPORATION
H04N5/3572G02B21/365
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Quick Facts
Patent No.
US 10,079,985
App. No.
15/145,168
Granted
Sep 18, 2018
Kind
B2
Abstract

A microscope system including an imaging portion, an image-acquisition portion that captures an image of a specimen formed by the imaging portion, a background identifying portion that identifies a background region other than a region containing the specimen in the image acquired by the image-acquisition portion, calibration-data generating portions that generate calibration data for correcting shading contained in the image on the basis of a luminance distribution of the background region, and a shading correcting portion that corrects the luminance of the image by using the calibration data.

Claims (24)

1. A microscope system comprising:

an objective lens that forms an image of a specimen;

an image sensor that captures the image of the specimen formed by the objective lens; and

a processor comprising hardware, the processor being configured to:

identify a background region other than a region containing the specimen in the image acquired by the image sensor;

generate calibration data for correcting shading contained in the image on the basis of a luminance distribution of the identified background region; and

correct a luminance of the image by using the generated calibration data,

wherein the generating of the calibration data comprises:

estimating a luminance distribution of an entire region of the image on the basis of the luminance distribution of the identified background region,

calculating correction values for individual pixels of the image so that the estimated luminance distribution becomes uniform, and

generating the calibration data constituted of the calculated correction values.

2. The microscope system according to claim 1 , wherein:

the processor is further configured to allow an operator to specify at least one location in the background region in the image acquired by the image sensor,

wherein the identification of the background region comprises calculating a feature quantity of the specified location and identifies the background region in the image on the basis of the calculated feature quantity.

3. A microscope system comprising:

an objective lens that forms an image of a specimen;

an image sensor that captures the image of the specimen formed by the objective lens; and

a processor comprising hardware, the processor being configured to:

identify a background region other than a region containing the specimen in the image acquired by the image sensor;

generate calibration data for correcting shading contained in the image on the basis of a luminance distribution of the identified background region;

correct a luminance of the image by using the generated calibration data;

allow an operator to input an observation method;

store the observation method in association with a background identifying condition which a feature quantity of the background region satisfies, and

identify, in the image, a region that satisfies the background identifying condition as the background region.

Assignments (2)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jan 25, 2023
From: OLYMPUS CORPORATION
To: EVIDENT CORPORATION
Reel/Frame 062492/0267 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded May 3, 2016
From: MATSUBARA, DAIKI
To: OLYMPUS CORPORATION
Reel/Frame 038445/0706 →
Priority Claims (1)
JP 2015-121874 · Jun 17, 2015 · national
Continuity (1)
Related Publication 20160373670A1 · Dec 22, 2016