IP Library Granted Patent US 10,090,321
Granted Patent B2
US 10,090,321 · App. 15/456,014 · Granted Oct 2, 2018

Integrated circuit device and method for manufacturing same

Inventor: Shingo Nakajima (Yokkaichi, JP)
Assignee: TOSHIBA MEMORY CORPORATION
H01L27/11582H01L21/28282H01L21/31111H01L21/76897H01L23/528H01L23/5226H01L27/11565H01L27/11568H01L27/11573
View Patent ↗
Loading inventors, assignments & file history…
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this patent's details
Quick Facts
Patent No.
US 10,090,321
App. No.
15/456,014
Granted
Oct 2, 2018
Kind
B2
Abstract

An integrated circuit device includes an insulating film, a contact extending in a first direction and being provided inside the insulating film, and an insulating member. A composition of the insulating member is different from a composition of the insulating film. A level difference is formed in a side surface of the contact, a portion of a region of the side surface other than the level difference contacts the insulating film. The insulating member contacts the level difference.

Claims (31)

1. An integrated circuit device, comprising:

an insulating film;

a contact extending in a first direction and being provided inside the insulating film, the contact including a first portion, a second portion, and a third portion arranged in this order along the first direction, a diameter of the second portion being larger than a diameter of the first portion in a second direction orthogonal to the first direction, the diameter of the second portion being larger than a diameter of the third portion in the second direction, a side surface of the first portion and a side surface of the third portion contacting the insulating film; and

an insulating member contacting a side surface of the second portion, a composition of the insulating member being different from a composition of the insulating film.

2. The device according to claim 1 , wherein a configuration of the insulating member is an annular configuration surrounding the contact.

3. An integrated circuit device, comprising:

a stacked body including a plurality of insulating films and a plurality of electrode films stacked alternately along a first direction;

a semiconductor member extending in the first direction and being provided inside the stacked body, the semiconductor member including a first portion, a second portion, and a third portion arranged in this order along the first direction, the second portion being disposed inside one of the insulating films, a diameter of the second portion being larger than a diameter of the first portion in a second direction orthogonal to the first direction, the diameter of the second portion being larger than a diameter of the third portion in the second direction; and

a charge storage film provided between the semiconductor member and one of the electrode films.

4. The device according to claim 3 , further comprising an insulating member provided on a side surface of the second portion, a composition of the insulating member being different from a composition of the insulating film.

5. The device according to claim 4 , wherein a configuration of the insulating member is an annular configuration surrounding the second portion.

6. The device according to claim 3 , wherein the electrode film most proximal to the second portion of the plurality of electrode films provided around the third portion includes an extension portion extending onto a side surface of the second portion.

7. The device according to claim 6 , wherein a configuration of the extension portion is an annular configuration surrounding the second portion.

8. An integrated circuit device, comprising:

a substrate;

a stacked body provided in a first region on the substrate, the stacked body including a plurality of first insulating films and a plurality of electrode films stacked alternately along a first direction;

a second insulating film provided in a second region on the substrate;

a semiconductor member extending in the first direction and being provided inside the stacked body, the semiconductor member including a first portion, a second portion, and a third portion arranged in this order along the first direction, the second portion being disposed inside one of the first insulating films, a diameter of the second portion being larger than a diameter of the first portion in a second direction orthogonal to the first direction, the diameter of the second portion being larger than a diameter of the third portion;

a charge storage film provided between the semiconductor member and one of the electrode films;

a contact extending in the first direction and being provided inside the second insulating film; and

a first insulating member contacting a side surface of the contact, a composition of the first insulating member being different from a composition of the second insulating film.

9. The device according to claim 8 , wherein

a level difference is formed in the side surface of the contact, a portion of a region of the side surface other than the level difference contacts the second insulating film, and

the first insulating member contacts the level difference.

10. The device according to claim 8 , wherein

a first portion, a second portion, and a third portion of the contact are arranged in this order along the first direction,

a diameter of the second portion is larger than a diameter of the first portion in the second direction, the diameter of the second portion is larger than a diameter of the third portion in the second direction,

a side surface of the first portion and a side surface of the third portion contact the second insulating film, and

the first insulating member contacts a side surface of the second portion.

11. The device according to claim 8 , further comprising a second insulating member provided on a side surface of the second portion of the semiconductor member, a composition of the second insulating member being different from a composition of the first insulating film,

a position of an upper surface of the first insulating member being equal to a position of an upper surface of the second insulating member in the first direction.

Assignments (5)
MERGER Recorded Jan 22, 2021
From: TOSHIBA MEMORY CORPORATION
To: K.K. PANGEA
Reel/Frame 055659/0471 →
CHANGE OF NAME AND ADDRESS Recorded Jan 22, 2021
From: TOSHIBA MEMORY CORPORATION
To: KIOXIA CORPORATION
Reel/Frame 055669/0001 →
CHANGE OF NAME AND ADDRESS Recorded Jan 22, 2021
From: K.K. PANGEA
To: TOSHIBA MEMORY CORPORATION
Reel/Frame 055669/0401 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jul 27, 2017
From: KABUSHIKI KAISHA TOSHIBA
To: TOSHIBA MEMORY CORPORATION
Reel/Frame 043355/0058 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Apr 26, 2017
From: NAKAJIMA, SHINGO
To: KABUSHIKI KAISHA TOSHIBA
Reel/Frame 042149/0139 →
Priority Claims (1)
JP 2016-185166 · Sep 23, 2016 · national
Continuity (1)
Related Publication 20180090511A1 · Mar 29, 2018
Cited By (1)
US 12,356,613