IP Library Granted Patent US 10,145,865
Granted Patent B2
US 10,145,865 · App. 15/122,545 · Granted Dec 4, 2018

Non-contact voltage measurement device

Inventors: Hiroshi Imai (Nara, JP); Keiki Matsuura (Nara, JP); Hiroyuki Tokusaki (Kasugai, JP); Mao Ogimoto (Hirakata, JP); Goro Kawakami (Kusatsu, JP); Kohei Tomita (Kyoto, JP); Atsuhiro Okamura (Kusatsu, JP)
Assignee: OMRON CORPORATION
G01R15/16G01R15/165G01R1/07
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Quick Facts
Patent No.
US 10,145,865
App. No.
15/122,545
Granted
Dec 4, 2018
Kind
B2
Abstract

Provided is a non-contact voltage measuring device capable of measuring, with given accuracy, measurement target voltages applied to various conducting wires having respective different shapes. An inner electrode which is deformable depending on a shape of a wire “w” is electrically connected, via a connecting section, to an outer electrode fixed to an electric field shield.

Claims (8)

1. A non-contact voltage measuring device for measuring a measurement target voltage applied to a conductor, comprising:

a probe;

an electric circuit; and

an electric field shield which covers at least part of the electric circuit so as to prevent an electric field from being incident to the electric circuit,

the probe including (i) a first electrode which is elastically deformable in accordance with a shape of the conductor and (ii) a second electrode which causes a capacitance value of a parasitic capacitance formed between the second electrode and the electric field shield to be maintained at a given level by maintaining a relative position of the second electrode with respect to the electric field shield even in a case where the first electrode is deformed,

the first electrode being electrically connected to the second electrode;

the second electrode being provided at a position at which the second electrode is capable of shielding an electric field generated between the first electrode and the electric field shield,

the measurement target voltage being measured in accordance with a voltage signal supplied to the electric circuit via the probe in a case where the probe is brought closer to the conductor, without being in contact with the conductor, so that a coupling capacitance is formed between the probe and the conductor.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Aug 30, 2016
From: IMAI, HIROSHI; MATSUURA, KEIKI; TOKUSAKI, HIROYUKI; OGIMOTO, MAO; KAWAKAMI, GORO; TOMITA, KOHEI; OKAMURA, ATSUHIRO
To: OMRON CORPORATION
Reel/Frame 039587/0266 →
Priority Claims (1)
JP 2014-050654 · Mar 13, 2014 · national
Continuity (1)
Related Publication 20170067939A1 · Mar 9, 2017