IP Library › Granted Patent US 1,015,577
Granted Patent S1
US 1,015,577 · App. 29/828,132 · Granted Feb 20, 2024

Sample rack

Inventors: Yudai Fukushi (Tokyo, JP); Yasuhiro Keta (Tokyo, JP); Eiichiro Takada (Tokyo, JP); Fuka Matsudaira (Tokyo, JP); Ai Masuda (Tokyo, JP)
Assignee: Hitachi High-Tech Corporation
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Quick Facts
Patent No.
US 1,015,577
App. No.
29/828,132
Granted
Feb 20, 2024
Kind
S1
Claims (1)

The ornamental design for a sample rack, as shown and described.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jun 2, 2022
From: FUKUSHI, YUDAI; KETA, YASUHIRO; TAKADA, EIICHIRO; MATSUDAIRA, FUKA; MASUDA, AI
To: HITACHI HIGH-TECH CORPORATION
Reel/Frame 060079/0749 →
Priority Claims (1)
JP 2021-018556 D · Aug 27, 2021 · national