Temperature reference gain correction for analog-to-digital converter

1. A temperature compensation system configured to control a gain setting in an analog-to-digital converter (ADC) that converts an analog signal to a digital signal based on a reference voltage, comprising:

a linear gain adjustment circuitry configured to determine a calibration gain value, wherein the calibration gain value corrects for linear effects of temperature on the reference voltage;

a temperature gain correction circuitry configured to determine a correction term based on a temperature that affects the reference voltage, wherein the correction term corrects for nonlinear effects of temperature on the reference voltage; and

a combination circuitry configured to:

combine the correction term with the calibration gain value to generate a corrected calibration gain value; and

provide the corrected calibration gain value to the ADC to control the gain setting.

2. The temperature compensation system of claim 1 wherein the temperature gain correction circuitry is configured to:

receive, from a temperature sensor, a signal indicative of the temperature; and

determine the correction term based on the temperature.

3. The temperature compensation system of claim 2 , wherein the signal comprises a Proportional to Absolute Temperature voltage.

4. The temperature compensation system of claim 2 , wherein the signal comprises a digital representation of the temperature.

5. The temperature compensation system of claim 2 , wherein the signal is generated by a temperature sensor disposed proximate the ADC.

6. The temperature compensation system of claim 2 , wherein the signal is generated based on a thermal model that maps temperature values to one or more other component operating parameters based on a thermal simulation.

7. The temperature compensation system of claim 1 , wherein the temperature gain correction circuitry comprises a lookup table that maps temperatures to correction terms based on a nonlinear relationship between the temperature and a reference voltage input to the ADC.

8. The temperature compensation system of claim 1 , wherein the temperature gain correction circuitry is configured to compute the correction term based on a nonlinear equation that includes the temperature.

9. The temperature compensation system of claim 1 , wherein the calibration gain value comprises a calibrated full scale gain value based on a linear relationship between a full-scale gain and a reference voltage input to the ADC.

10. A method configured to control a gain setting for an analog-to-digital converter (ADC) that converts an analog signal to a digital signal based on a reference voltage, the method comprising:

determining a calibration gain value that corrects for linear effects of temperature on the reference voltage;

receiving a temperature signal indicative of a temperature that affects the reference voltage;

based on the temperature, determining a correction term that corrects for nonlinear effects of temperature on the reference voltage;

combining the calibration gain value with the correction term to generate a corrected calibration gain value; and

controlling the ADC based at least on the corrected calibration gain value.

11. The method of claim 10 , further comprising measuring the temperature with a temperature sensor that generates the signal.

12. The method of claim 10 , wherein the signal comprises a Proportional to Absolute Temperature voltage.

13. The method of claim 10 , wherein the signal comprises a digital representation of the temperature.

14. The method of claim 10 , comprising:

inputting the signal to a lookup table that maps temperatures to corresponding correction terms; and

determining an output of the lookup table as the correction term.

15. The method of claim 14 , wherein the lookup table maps temperatures to corresponding correction terms based on a nonlinear relationship between temperature and a reference voltage input to the ADC.

16. The method of claim 10 , comprising calculating the correction term based on a nonlinear equation that includes the temperature.

17. The method of claim 10 , wherein the calibration gain value comprises a calibrated full scale gain value based on a linear relationship between a full scale gain and a reference voltage input to the ADC.

18. The method of claim 17 , wherein the calibrated full scale gain value is determined during calibration of the ADC.

19. A temperature compensated analog-to-digital converter (ADC), comprising:

an ADC configured to convert an input voltage to a digital signal based on a reference voltage, the ADC comprising gain control circuitry that controls operation of the ADC based on a gain count; and

a temperature compensation system configured to:

determine a calibration gain value that corrects for linear effects of temperature on the reference voltage;

receive a temperature signal indicative of a temperature;

based on the temperature, determine a correction term that corrects for nonlinear effects of temperature on the reference voltage;

combining the calibration gain value with the correction term to generate a corrected calibration gain value; and

provide the corrected calibration gain value to the gain control circuitry as the gain count.

20. The temperature compensated ADC of claim 19 , wherein the temperature compensation system comprises a lookup table that maps temperatures to correction terms based on a nonlinear relationship between the temperature and the reference voltage.

21. The temperature compensated ADC of claim 19 , wherein the temperature compensation system comprises temperature gain correction computation circuitry configured to compute a correction term based on a nonlinear equation that includes the temperature.